ATE Systems
Improved Workflow Integration for Electromagnetic Simulation of EMC Applications in CST STUDIO SUITE 2011
Computer Simulation Technology (CST), a world leader in the computer simulation of radiated emissions and susceptibility, announces major workflow improvements for EMC simulation at IEEE EMC 2010.
OpenATE Announces Flower Series Products to Provide IC Testing New Solutions
OpenATE today released 2 new products: PEony-12 and Orchid-16. They work with National Instruments PXI 3U FlexRIO FPGA Module to offer the highest performance on the 3U PXI platform for semiconductor device testing. LabVIEW* 2009 VI functional driver is supplied for programming the flower series instruments.
Agilent Technologies' In-Circuit Test Solution Wins Technology Awards
Agilent announced that its Medalist i3070 Series 5 in-circuit test (ICT) solution garnered two major technology awards during the Nepcon Shanghai 2010 tradeshow in late April. These awards recognize the products' innovation and reliability in improving product quality in today's mature SMT manufacturing environment.
SMH Technologies and Agilent Technologies announce Availability of FlashRunner 3070A for Agilent's Medalist Series 5 In-Circuit Tester
SMH Technologies and Agilent Technologies Inc. (NYSE: A) today announced the release of the FlashRunner 3070A (FR3070A) programming board for the Agilent Medalist In-Circuit Test Utility Card of the i3070 Series 5 in-circuit tester.
Agilent Technologies to Showcase Latest ATE Innovations at Autotestcon 2009
Agilent Technologies Inc. today announced it will display its innovative line-up of ATE test systems, support and asset management at Autotestcon 2009. The show takes place Sept. 14-17 at the Disneyland Hotel Convention Center, in Anaheim, Calif. In addition to demonstrating test solutions in high-power signal generation, audio analysis, data conversion, signal processing and real-time temperature testing, Agilent will present six technical papers.
Agilent Technologies Launches In-Circuit Test Series
Agilent has introduced the Medalist i3070 Series 5 in-circuit test (ICT) platform, marking 20 years since the company launched its award-winning 3070 and i3070 ICT systems. The Series 5 ICT system offers new analog measurement technology together with the industry's fastest 12 MHz hybrid pin card, giving electronic manufacturers 20 to 30 percent throughput improvement over the current i3070 at the same list prices. This enables contract manufacturers to considerably reduce their cost of test while increasing coverage.
electronica 2008 - Interpro Systems - Test and Measurement
Intepro Systems develops and manufactures complex instrumentation and ATE systems for design validation, production test and burn-in of power supply systems and their components used in telecommunications, aerospace, military and other power electronics applications. The market leader in power supply testing for over 25 years, Intepro has a global reach with direct sales offices in the U.K., Ireland and U.S. and distributors covering Europe, China, Korea and Japan.
ACS Test System Now Completes Wafer Level Reliability Testing up to Five Times Faster
Keithley Instruments has enhanced its Automated Characterization Suite (ACS) software to include optional wafer level reliability (WLR) test tools for semiconductor reliability and lifetime prediction testing applications. Version 4.0 builds on the ACS software's existing single- and multi-site parallel test capabilities, adding a database capability, as well as software tools and optional licenses for the new Reliability Test Module (RTM) and ACS Data Analysis capabilities.
JTAG/Boundary Scan Platform with new Transceivers for highly complex Boards
GOEPEL electronic, a vendor of JTAG/Boundary Scan solutions compliant with Std. IEEE1149.1, has launched an additional component for its Boundary Scan hardware platform SCANFLEX called SFX-TAP7.
ATE System features fully-integrated JTAG/Boundary Scan
Aeroflex has introduced the 5800 Series multi-configuration, multi-function Automatic Test Equipment (ATE) system with integrated JTAG/boundary scan capabilities. The 5800 Series will feature, as an option, the PXI-based SCANFLEX platform from GOEPEL electronic, a leading vendor of JTAG/boundary scan solutions.
ATE system has digital functional testing
Aeroflex now offers its 5800 Series ATE system with digital functional testing capabilities. Ideal for engineers performing mixed-signal testing, device programming, functional test, in-system programming, or simple protocol communications, the 5800 Series was designed with an open architecture and highly configurable structure that allows it to easily adapt to evolving Printed Circuit Board (PCB) industry standards, providing a versatile solution that can be easily upgraded to satisfy future requirements as they emerge.
Product safety testing system upgraded
Clare Instruments has upgraded its Elite electronic product safety testing system with the introduction of a number of additional technical features. The functional load test current of the new Elite has been raised to 16 amps making it suitable for the safety testing of the vast majority of domestic electrical and electronic products.
Aeroflex enhances the capability of its 5800 Series multi-configuration, multi-function ATE system
Aeroflex has improved the functionality of its 5800 Series multi-configuration, multi-function ATE system with the addition of a Boundary Scan and Q-Test capability along with a PXI software wrapper tool. The Aeroflex 5800 Series is a highly flexible, scalable and modular test environment designed to provide the true re-configurability needed to meet the ever-changing requirements of the rapidly evolving PCB industry.
