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Test and Measurement

StanTronic extends product range of LCR meters from GWInstek

StanTronic extends product range of LCR meters from GWInstek

Features of test instruments need to grow in line with the increasing operating frequencies of the applications. StanTronic Instruments has therefore included the new LCR Meter LCR-8110G in its product range which has a ten times higher test frequency than its predecessor.

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GL Announces Wireless, Packet, and TDM Testing Products at CTIA Wireless 2010

GL Announces Wireless, Packet, and TDM Testing Products at CTIA Wireless 2010

GL Communications Inc. announced today its participation in CTIA Wireless 2010 to be held From March 23-25, at Las Vegas Convention Center, Las Vegas, USA. Speaking to the press, Mr. Rob Bichefsky, Senior Manager of Product Development, said, "GL Communications Inc is one of the leading suppliers of telecom test and measurement equipments to the worldwide telecom industry, and it has a wide ranging products for Wireless networks. These will be on display at the upcoming CTIA show to be held at Las Vegas.

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Agilent Technologies Introduces Supercritical Fluid Chromatography System

Agilent Technologies introduced the Agilent 1200 Series Analytical Supercritical Fluid Chromatography (SFC) System. This new system combines the Agilent 1200 Series Rapid Resolution Liquid Chromatography system with the Aurora SFC Fusion A5 into a complete SFC system. Aurora SFC Systems Inc. and Agilent Technologies have signed an OEM agreement under which Agilent will sell and support the combined system.

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Aeroflex broadens support for low-cost, high-speed WLAN manufacturing test with new MIMO capability

Aeroflex broadens support for low-cost, high-speed WLAN manufacturing test with new MIMO capability

Aeroflex today introduced support for MIMO (multiple-input/multiple-output) testing capabilities for its PXI 3000 Series manufacturing test system with the introduction of its new PXI 3061 module, a multiport RF combiner. The initial target application for the new module is WLAN IEEE 802.11n device testing.

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Multi-application test system for optical devices and transmission systems

Multi-application test system for optical devices and transmission systems

The Yokogawa AQ2210 Series is a new version of the company's multi-application test system: a modular system designed to offer a wide range of measurements on optical devices and optical transmission systems.

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LeCroy Announces New External PCIe Cable Interposer for PCI Express 2.0 Analysis

LeCroy Corporation announces a new PCI Express 2.0 VPX interposer for the Summit PCI Express Protocol Analyzer product line. This new VPX interposer provides a dedicated probe that makes it easier to analyze data traffic between a VPX host system and carrier board system.

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LeCroy Announces SSD Decode Support in the PCI Express Protocol Analyzer

LeCroy Corporation, a leading supplier of oscilloscopes and serial data test solutions, announced today a new feature added to its PCI Express (PCIe) protocol analyzer line of products that will support SSD application testing and debugging. LeCroy will support the new industry NVMHCI specification that is enabling the development of SSD devices for the storage industry with its Summit™ T2/T3 and PETracer™ ML protocol analyzers.

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LeCroy Announces New VPX Interposer for PCI Express 2.0 Analysis

LeCroy Corporation, a leading supplier of oscilloscopes and serial data test solutions, today announced a new PCI Express 2.0 External Cable interposer for the Summit™ PCI Express Protocol Analyzer product line. This new External Cable interposer provides a dedicated probe that makes it easier to analyze data traffic between a host and device that are connected using an external PCI Express cable.

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Rohde & Schwarz launches four-port network analyzer up to 67 GHz

Rohde & Schwarz launches four-port network analyzer up to 67 GHz

The high-end R&S ZVA67 vector network analyzer from Rohde & Schwarz is now also available as a four-port model. This is the first network analyzer on the market to feature four test ports for measurements up to 67 GHz. Its high dynamic range (110 dB at 67 GHz) and output power (6 dBm at 67 GHz) give the R&S ZVA67 the flexibility and performance required for characterizing components and modules in the microwave and millimeter-wave range. It allows users in research and development to determine the S parameters of multiport devices quickly and with high precision. As an extra benefit, the analyzer's four internal signal sources reduce test system complexity and the number of instruments required, e.g. for measuring frequency-converting DUTs, because no external signal generators are needed.

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Agilent Technologies Introduces Second-Generation FlexRay Option for InfiniiVision Series Oscilloscopes

Agilent Technologies Introduces Second-Generation FlexRay Option for InfiniiVision Series Oscilloscopes

Agilent Technologies introduced its second-generation FlexRay measurement option (Option FLX) on its popular InfiniiVision 5000, 6000 and 7000 Series oscilloscopes. In response to customer feedback on its first-generation FlexRay oscilloscope option, Agilent enhanced the measurement capabilities for testing the physical-layer robustness of FlexRay networks in Option FLX and significantly lowered the price for an entry-level FlexRay physical-layer test solution.

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Multi-Contact produces safety guide to electrical test and measurement

Multi-Contact produces safety guide to electrical test and measurement

Electrical testing and measurement is an area where safety needs to be paramount, and for this reason users will appreciate the new safety guide produced by Multi-Contact. The free 48 page booklet takes the user through the basic principles of safe working in the testing of electrical and electronic equipment, with particular reference to the latest international standards.

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National Instruments Introduces Solution for Phase-Coherent RF Measurements

National Instruments Introduces Solution for Phase-Coherent RF Measurements

National Instruments has introduced new RF vector signal generators (VSGs) and vector signal analysers (VSAs) in two-channel, three-channel and four-channel versions for multichannel multiple-input-multiple-output (MIMO) RF design and test applications. The NI PXIe-5663E 6.6 GHz two-, three- and four-channel RF VSA and NI PXIe-5673E 6.6 GHz two-, three- and four-channel RF VSG versions, based on PXI Express, incorporate a shared local oscillator (LO) architecture to achieve true phase coherency between each RF port, which facilitates more accurate channel-to-channel phase measurements in a variety of RF test applications.

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Keithley Publishes 2010 Test & Measurement Product Catalog CD

Keithley Publishes 2010 Test & Measurement Product Catalog CD

Keithley Instruments, has published its 2010 Test & Measurement Product Catalog in CD form. The CD offers details and technical specifications on Keithley's general-purpose and sensitive sourcing and measurement products, DC switching, RF/microwave switching, data acquisition solutions, and semiconductor test systems.

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Agilent Technologies Introduces Transportable GC/MS for High-Performance, Out-of-Laboratory Analysis

Agilent Technologies introduced the 5975T Low Thermal Mass (LTM) Gas Chromatography/Mass Spectrometry Detector (GC/MSD), the industry's first commercial transportable GC/MS system that delivers laboratory-quality analysis. Using proprietary LTM technology, Agilent has developed the 5975T LTM GC/MS to be smaller, more rugged and to consume less power than in-lab GC/MS instruments, yet capable of the same high-quality performance in the field.

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Agilent Introduces New Single Quadrupole LC/MS Delivering Higher Throughput and Unmatched Performance

Agilent Technologies introduced the Agilent 6150B Series single quadrupole liquid chromatograph/mass spectrometer (LC/MS), a new generation of this workhorse instrument. The 6150B Series has substantially higher sample throughput and delivers unmatched performance in the single quad LC/MS category.

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Agilent Lab Software Suite Unifies Instrument Data Systems, Electronic Lab Notebook and Data Archival

Agilent Technologies introduced the OpenLAB software portfolio, designed as a better way for labs to efficiently capture, share, review and archive scientific data. Customers want solutions that reduce the time from discovery to delivery of a new chemical or biological entity, said Nick Roelofs, Ph.D., president, Agilent Life Sciences Group. By providing solutions that support the evolution of existing systems and minimizing retraining, the OpenLAB portfolio protects a laboratory's investment and knowledge. Customers will quickly benefit from the productivity enhancements of the new integrated collaboration and data management tools.

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Agilent Technologies Introduces Oscilloscope Triggering and Decode Option for MIL-STD 1553 Signals

Agilent Technologies Introduces Oscilloscope Triggering and Decode Option for MIL-STD 1553 Signals

Agilent today introduced a triggering and decode option (Option 533) for MIL-STD 1553 on its popular InfiniiVision 5000, 6000 and 7000 Series oscilloscopes. Option 533 allows engineers to easily capture and measure the electrical characteristics of MIL-STD 1553 signals. When Option 553 is combined with Agilent's mask test option, engineers also can perform MIL-STD 1553 eye-diagram mask testing for the first time based on electrical input specifications.

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Agilent Technologies Announces Handheld RF Analyzer Training Program

Agilent Technologies Announces Handheld RF Analyzer Training Program

Agilent Technologies introduced a training program on RF communications, infrastructure, installation and maintenance. The training program, consisting of three courses, is designed to give users of handheld RF analyzers the knowledge they need to get the most from their equipment.

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Agilent Announces Innovative Liquid Chromatography App Now Available for the iPhone and iPod Touch

Agilent Technologies announced its LC Calculator App is now available on the App Store. The LC Calculator is a first-of-its-kind liquid chromatography app for the iPhone and iPod touch. The app was designed to quickly determine flow rate and back pressure under a variety of conditions and column dimensions.

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Carlo Gavazzi’s new energy meters and controllers on show at NEMEX 2010

Carlo Gavazzi’s new energy meters and controllers on show at NEMEX 2010

Carlo Gavazzi is using this year's NEMEX exhibition to present its latest products to address the energy market. Highlights will include the newly announced WM30-96 smart modular power analyser for building automation networks, and the Eos-Array – a modular controller for efficient running of photovoltaic (PV) plants. Carlo Gavazzi's full range of innovative energy meters will also be demonstrated on the stand.

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50 MHz function generator hits new price point

50 MHz function generator hits new price point

The TG5011 from TTi is a combined function/arbitrary/pulse generator with a frequency range covering 1 µHz to 50 MHz. At under £900, the generator achieves a new price point below that of competitors' products offering only 20 MHz or 25 MHz bandwidth.

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Med-eKit wheeled out by Rigel

Med-eKit wheeled out by Rigel

A trolley case-based biomed field service kit used for the rapid testing of electrical safety and operation of medical devices and equipment used in hospitals, operating theatres and other facilities is now available from Rigel Medical.

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Agilent's Target Enrichment System Supports Barcoding and Indexing to Speed Sequencing, Reduce Sequencing Costs Up to 16-Fold

Agilent Technologies Inc. today announced that its Agilent SureSelect Target Enrichment System supports multiplexed DNA sequencing of 12 to 16 samples per lane depending on the next-generation sequencing platform, reducing costs and increasing throughput up to 16-fold.

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GL Announces Enhanced Wireless Analysis and Emulation Software

GL Announces Enhanced Wireless Analysis and Emulation Software

GL Communications Inc. announced today the release of enhanced Wireless Analysis and Emulation software – These tools are used for emulation and analysis of traffic at the A-bis interface (BTS to BSC links), and A-ter interface (BSC to MSC links) in the wireless network infrastructure. Speaking to the press, Mr. Karthik Ramalingam, development manager, said, "TRAU (Transcoder/Rate Adapter Unit) frames between the A-bis interface (BTS to BSC links), and A-ter interface (BSC to MSC links) perform the function of compression/decompression of speech channels within the radio cellular network. TRAU frames carry speech, data, and O&M information at full rate or half (8/16 kbps) rate and control information, over T1/E1 in a GSM network". He added, "To reduce bandwidth requirements on the BTS-BSC and BSC-MSC interface, service providers use transcoders or voice compression technology - known as TRAU, or Transcoder/Rate Adapter Unit. TRAU frames between the BTS and BSC/MSC carry compressed spee

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Automated deposition and inspection: Bringing conformal coating into the production line

Automated deposition and inspection: Bringing conformal coating into the production line

As demand for increasing quality, lifetime and environmental resilience is placed on electronics PCBs in greater volume and wider applications, conformal coating is now typically a standard process rather than an exotic special treatment. It must therefore deliver its full protection potential without compromising mainstream PCB assembly throughput or quality. Andy Bonner of YESTech Europe looks at how techniques drawn from AOI/AXI inspection experience, coupled with automated selective coating, ensure that this happens.

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R&S CMW500 wideband radio communication tester provides new features for maximum flexibility in development and production

At the Mobile World Congress 2010, Rohde & Schwarz unveiled an extensive package of new features for the R&S CMW500 wideband radio communication tester launched in 2009. All the new features are aimed at delivering maximum flexibility for the mobile radio industry. The R&S CMW500 provides precisely what the customer needs, whether it is RF tests in signaling mode for CDMA2000® (1xRTT and 1xEV-DO), WiMAXTM and GSM, or measurements for implementing a smooth handover between LTE and WCDMA or LTE and CDMA2000®. In addition, Rohde & Schwarz has already successfully carried out initial RF and protocol tests for LTE TDD. Featuring a wide frequency range of up to 6 GHz, the R&S CMW500 offers maximum safety of investment.

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Agilent Technologies' Automated DisplayPort Compliance Test Solution Supports ROHM's DisplayPort Rx LSI

Agilent Technologies' Automated DisplayPort Compliance Test Solution Supports ROHM's DisplayPort Rx LSI

Agilent Technologies Inc. today announced that its DisplayPort compliance test solution supports automated testing of the ROHM's Receiver (Rx) IP cores for DisplayPort. The new Agilent test solution increases productivity and efficiency, and gives confidence and accuracy for chipset testing. ROHM is a manufacturer of electronic components, transistors and diodes, ICs and other semiconductor products.

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Agilent Technologies Introduces Industry's First Single-Box Analyzer/Curve Tracer For 40-Amps/3000-Volt Power Device Evaluation

Agilent Technologies Introduces Industry's First Single-Box Analyzer/Curve Tracer For 40-Amps/3000-Volt Power Device Evaluation

Agilent Technologies Inc today introduced enhancements to the B1505A Power Device Analyzer/Curve Tracer to make it the industry's first single-box solution able to characterize semiconductor devices up to 40 amps and 3000 volts.

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LeCroy Introduces 4 Channel 30 GHz or 8 Channel 16 GHz  Real-Time Oscilloscope Solution

LeCroy Introduces 4 Channel 30 GHz or 8 Channel 16 GHz Real-Time Oscilloscope Solution

LeCroy Corporation has extended the power of its WaveMaster 830 Zi 30 GHz real-time oscilloscope by providing a simple and fast method to combine two oscilloscopes and provide 4 channels at 30 GHz. This solution is ideal for measurement and analysis of 28 to 56 Gb/s IQ modulated signals where ultra-high real-time bandwidth and four channels is required, or for capture and detailed analysis of other leading edge technologies. The solution is enabled with the Zi-8CH-SYNCH Oscilloscope Synchronization Kit, which is compatible with all WaveMaster 8 Zi models, so it may be used to create four channel data captures from 20 GHz to 30 GHz or eight channel data captures from 4 GHz to 16 GHz.

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LeCroy - SierraFC M8-4 8G Fibre Channel Protocol Analysis Platform

LeCroy Corporation, a worldwide leader in serial data test solutions, has expanded its presence in the storage system and SAN development tools markets with the introduction of the SierraFC M8-4, a Fibre Channel 8 Gb/s protocol analyzer. The SierraFC M8-4 is the latest addition to LeCroy's industry-leading Sierra family of powerful storage protocol analyzer products. Highly portable as stand-alone test systems, the flexible family of Sierra products can also be linked together in cascade configurations to provide additional recording channel capacity or to enable simultaneous capture of mixed protocol streams. Operating at 1, 2, 4 and 8 Gb/s FC signaling rates, available with 4 or 8 GB of recording memory, and either 2 or 4 recording channels, SierraFC offers world-class protocol analysis capability at price points that are within reach of every budget.

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Verizon Wireless chooses Rohde & Schwarz to provide testing solutions for the certification of LTE devices

Verizon Wireless announced today that the company has selected Rohde & Schwarz as a provider of testing solutions for the certification of devices that will operate on the nationwide 4G Long Term Evolution (LTE) network Verizon Wireless is building on the Upper 700 MHz C-Block spectrum. Rohde & Schwarz will provide test platform solutions which include system simulators, channel simulators and software for automation. Any person or organization considering offering devices on the upcoming Verizon Wireless 4G LTE network can use these tools in preparation for device certification by independent labs.

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Samsung using test equipment from Rohde & Schwarz to produce USB modems for world's first commercial LTE networks

Samsung, the Korean electronics manufacturer, is the first company worldwide to deliver USB modems for commercial LTE networks. To meet its production standards, the company is using test equipment from Rohde & Schwarz.

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Keithley's Ultra-Fast Current-Voltage System Combines Three Essential Characterization Capabilities in One Chassis

Keithley's Ultra-Fast Current-Voltage System Combines Three Essential Characterization Capabilities in One Chassis

Keithley Instruments introduced the Model 4225-PMU Ultra Fast I-V Module, the latest addition to the growing range of instrumentation options for the Model 4200-SCS Semiconductor Characterization System. It integrates ultra-fast voltage waveform generation and current/voltage measurement capabilities into the Model 4200-SCS's already powerful test environment to deliver the industry's broadest dynamic range of voltage, current, and rise/fall/pulse times, expanding the system's materials, device, and process characterization potential dramatically.

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Free Keithley Online Seminar Explores Phase Change Memory Measurement Techniques

Keithley Instruments will broadcast a free, web-based seminar titled "Phase Change Memory: Fundamentals and Measurement Techniques" on Thursday, February 25, 2010.

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Current sensors add very high-current measurements to Yokogawa precision power meters

Current sensors add very high-current measurements to Yokogawa precision power meters

A range of current sensors is now available that allows the Yokogawa family of precision power meters to be used for measuring very high currents. Developed and manufactured by Hitec Power Protection of Almelo, The Netherlands, the new Zero-Flux current sensors allow the precise measurement of currents up to several thousands of amperes - including simultaneous measurement of AC and DC currents - while also providing accurate phase-shift information.

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NI FlexRIO Product Family Adds PXI Express Capabilities to FPGA-Enabled Instruments

NI FlexRIO Product Family Adds PXI Express Capabilities to FPGA-Enabled Instruments

National Instruments has announced the expansion of its NI FlexRIO product line with a new offering of NI FlexRIO FPGA modules for PXI Express and a new baseband transceiver adapter module. These new products deliver optimised solutions for high-speed signal processing and other automated test and measurement applications. They also represent the industry's first commercial off-the-shelf (COTS) solution with the flexibility of NI LabVIEW FPGA technology and high-speed, reconfigurable I/O (RIO) for PXI and PXI Express systems.

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Intepro Unveils New LXI Compatible controller at Aerospace Testing 2010

Intepro Unveils New LXI Compatible controller at Aerospace Testing 2010

Intepro Systems will be exhibiting at The Aerospace Testing 2010 trade show in Hamburg from 18-20 May. Intepro supplies users worldwide with ATE systems to test power electronics used in a wide range of applications. Intepro Systems' knowledge and expertise in moving and measuring power makes their products unrivalled for production testing, ESS screening, repair and characterisation of power components and sub assemblies used across all industries.

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Aeroflex Delivers TM500 Test Mobile to China Academy of Telecommunications Research for TD-LTE Trials

Aeroflex Delivers TM500 Test Mobile to China Academy of Telecommunications Research for TD-LTE Trials

Aeroflex announced that it has delivered a TM500 Time Division Duplex-Long Term Evolution (TD-LTE) Test Mobile test system to the China Academy of Telecommunications Research (CATR). The TM500 will support CATR's ongoing TD-LTE technology trials conducted by leading Chinese and international network equipment vendors. The TM500 Test Mobile is installed at the MTNet laboratory in Beijing.

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Anritsu Company Introduces 12-Port 70 GHz VNA System That Conducts High Accuracy Signal Integrity Measurements

Anritsu Company Introduces 12-Port 70 GHz VNA System That Conducts High Accuracy Signal Integrity Measurements

Anritsu Company introduces a scalable 12-port, 70 GHz measurement system based on its award-winning VectorStar broadband vector network analyzer (VNA) that can conduct highly accurate signal integrity measurements. Combining the VNA with advanced microwave technologies and dedicated software in a single system, the 12-port 70 GHz system can provide accurate and precise multi-port balanced differential and mixed-mode measurements required for today's high-speed bus designs.

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Anritsu Corporation and Altair Semiconductor to Offer Advanced LTE Solutions

Anritsu Corporation, a leading manufacturer of test and measurement equipment, today announced a joint demonstration with Altair Semiconductor, a 4G chip company developing the world's most advanced mobile semiconductors for handheld devices, focused on the development of LTE solutions.

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Anritsu to Demonstrate LTE Tester Using LG Device at MWC

Anritsu Corporation is to give a demonstration of its LTE tester using LG Electronics' (LG) LTE USB Modem at the Mobile World Congress (MWC) in Barcelona, which is being held from February 15 to 18, 2010.

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LTE demonstration with a Samsung device at MWC

Anritsu Corporation announced its demonstration with the Samsung Electronics LTE USB Modem at Barcelona Mobile World Congress (MWC) from the 15th to 18th February 2010.

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Sierra Wireless to Demonstrate Dual-Carrier HSPA Evolution Modem Performance Using Anritsu HSPA Solution at Mobile World Congress

Anritsu Corporation announces that its MD8480C Signaling Tester with Dual-Carrier HSPA Evolution support has been selected by Sierra Wireless to demonstrate performance of the Sierra Wireless AirCard® 312U mobile broadband modem at Mobile World Congress (MWC). The demonstration is showcased at the Anritsu stand 1B31 during MWC, held in Barcelona, February 15-18.

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Anritsu’s ME7873L LTE RF Conformance Test System Achieves R&TTE verification

Anritsu’s ME7873L LTE RF Conformance Test System Achieves R&TTE verification

Anritsu Corporation announced that its ME7873L LTE RF Conformance Test System has become the first in the world to provide independently verified European Radio equipment and Telecommunications Terminal Equipment (R&TTE) RF test cases for Type Approval of LTE devices.

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Spirent Intros New Testing & Monitoring Solution for Mobile Backhaul

Spirent Communications plc., a leader in networks, devices and services testing, today introduced Spirent TestCenter Live, the industry's first integrated 1/10 Gigabit Ethernet (GigE) live network test, diagnostics and performance monitoring solution. Deployed by several providers including a leading North American 4G wireless operator, Spirent TestCenter Live reduces operational costs, increases service quality levels of the Ethernet backhaul and helps deploy services to market faster.

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Smart modular power analyser offers superior performance and accuracy

Smart modular power analyser offers superior performance and accuracy

The latest smart modular power analyser from Carlo Gavazzi introduces a new performance level within the company's proven energy management range. The WM30-96 offers enhanced faster communications for building automation networks, along with superior functions such as load monitoring measurement and comprehensive alarm management; all in a compact plug-and–play modular format that streamlines installation and simplifies inventory management.

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CETECOM selects Rohde & Schwarz RF Conformance Test System for LTE Testing

CETECOM, a global leader in testing, certification and consulting for the wireless industry, has selected the R&S©TS8980FTA RF Conformance Test System to be part of its arsenal of LTE test equipment. The new test system from Rohde & Schwarz, a leading international manufacturer of test and measurement equipment, will help CETECOM support certification testing of mobile devices based on LTE technology. A massive rollout of LTE networks is predicted in 2010 and CETECOM has taken this step to ensure it has the full range of capabilities needed to provide cost-effective and efficient testing for certification programs in all major market regions.

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Agilent Technologies Affirms LTE Test Leadership

Agilent Technologies has announced its ongoing commitment to LTE and other emerging 4G solutions. Agilent LTE test solutions include design simulation software with connected solutions for in-depth simulation; cross-domain test capabilities for digital to RF architectures (DigRF v4); base station (eNodeB) test; real-time eNodeB testing; and, signal generation and analysis solutions for early module test including FDD, TD-LTE and MIMO.

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mimoOn and Rohde & Schwarz to demonstrate LTE testing capabilities at Mobile World Congress 2010

mimoOn, a pioneer in LTE software implementation for programmable radio platforms, will demonstrate the 4G capabilities of its mi!TestMOBILE(TM), one of the world's smallest and lowest-cost test mobiles for the rapid deployment and optimization of LTE networks, at Mobile World Congress (MWC) February 15-18, 2010 in Barcelona. The demonstration will include the R&S®CMW500 wideband radio communication tester, a product of Rohde & Schwarz, a leading supplier of test and measurement (T&M) products for the mobile industry.

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InterLab Test Engines – making “Ease of Use” for RF and Protocol test systems a reality

Conformance test systems for the wireless communications industry vary a lot in their usability. This makes the handling of different test systems from different manufacturers complicated for the test system operators and engineers. Test systems require expert know-how and understanding if users want to make sure that they generate correct and reproducible results.

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Aeroflex 7100 Digital Radio Test Set Wins 4G Wireless Evolution Product of the Year Award

Aeroflex 7100 Digital Radio Test Set Wins 4G Wireless Evolution Product of the Year Award

Technology Marketing Corporation (TMC) has recognized Aeroflex's contributions to 4G wireless technology with a 4GWE Product of the Year award for the 7100 Digital Radio Test Set. Award recipients represent the most innovative new products brought to market during 2009.

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Agilent Technologies' USB 3.0 Test Solution Chosen by ASMedia Technology for USB-IF Compliance Certification

Agilent Technologies' USB 3.0 Test Solution Chosen by ASMedia Technology for USB-IF Compliance Certification

Agilent Technologies announced that ASMedia Technology Inc., a Taiwanese IC design house, has selected the Agilent USB 3.0 test solution for in-house certification of SuperSpeed USB 3.0 devices. Agilent's comprehensive solution ensures compliance with the USB 3.0 standard. The Agilent USB 3.0 test solution is designed to reduce development costs, provide accurate test results, and simplify measurement processes for test engineers in the consumer electronics, cable manufacturer, and semiconductor industries.

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Agilent Technologies' Enhanced Signaling Analyzer for LTE Supports Entire Network in Real Time

Agilent Technologies announced it has added capabilities to its Signaling Analyzer Real Time (SART) for LTE. These enhancements allow wireless carriers and network equipment manufacturers (NEMs) to analyze an LTE-enabled tenfold plus increase in network traffic without sacrificing real-time-to-results. The SART 6.60 will be demonstrated at the 2010 Mobile World Congress, Hall 8, Stand A77, Barcelona, Spain, Feb. 15-19.

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Agilent Technologies Adds Phone Solution to LTE Drive Test Portfolio, Enabling Complete Performance, Coverage Testing

Agilent Technologies Adds Phone Solution to LTE Drive Test Portfolio, Enabling Complete Performance, Coverage Testing

Agilent Technologies Inc. today announced it will introduce and demonstrate a phone solution extension for its LTE Drive Test portfolio at the 2010 Mobile World Congress, Hall 8, Stand A77, Barcelona, Spain, Feb. 15-19. The phone solution extension will expand the coverage monitoring capability of Agilent's industry-leading Drive Test Receiver to include comprehensive interactive LTE network-performance testing.

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Agilent Technologies' Scanning Microwave Microscopy Garners Second Major Innovation Award

Agilent Technologies announced that its Scanning Microwave Microscopy Mode (SMM Mode) has been named one of 10 2009 Prism Award winners by judges from SPIE and the advisory board of Laurin Publishing's Photonics Spectra magazine.

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VI Technology, an Aeroflex Company, Develops Test Systems for Second-Generation of Ford SYNCR

VI Technology, an Aeroflex Company, Develops Test Systems for Second-Generation of Ford SYNCR

VI Technology MMTS for production testing of new and existing components was used in the development of second-generation of Ford's SYNC system. VI Technology MMTS is an automated test system designed to improve productivity for design and test engineers needing analog & digital measurements for audio/video devices.

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Aeroflex introduces LTE signal fading simulator for affordable, repeatable, reliable profiling of mobile handsets

Aeroflex introduces LTE signal fading simulator for affordable, repeatable, reliable profiling of mobile handsets

To speed up real-world testing of mobile handsets for LTE networks ahead of network deployment, Aeroflex is introducing the first one-box test system for cell phone signal fading simulation. Integrated within the 7100 Series digital radio test set, the new fading simulator option offers RF engineers an inexpensive and reliable baseband tool for signal fading profiling, a requirement for LTE (Long Term Evolution) certification.

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TRaC announces comprehensive testing to satisfy Noise at Work Directive

TRaC announces comprehensive testing to satisfy Noise at Work Directive

TRaC has extended its capabilities in testing products against the requirements of the Noise at Work Directive.

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Test & Measurement shop launched by Amplicon

Amplicon announced the launch of its new test & measurement web shop, a fast, secure and user friendly way of providing customers with an extensive range of instruments from industry leaders such as Fluke and Agilent Technologies.

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Agilent Technologies Offers Simplified Receiver Tolerance Test Setup for USB 3.0, SATA and SAS

Agilent Technologies Offers Simplified Receiver Tolerance Test Setup for USB 3.0, SATA and SAS

Agilent Technologies announced a second data channel option and a new analysis option for SER/FER for its J-BERT N4903B high-performance serial BERT. The new options significantly simplify receiver tolerance testing of USB 3.0 and SATA devices.

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Agilent Technologies Delivers World's Most Accurate Handheld Vector Network Analyzer

Agilent Technologies Delivers World's Most Accurate Handheld Vector Network Analyzer

Agilent introduced the N9923A FieldFox RF Vector Network Analyzer (VNA) -- the world's most accurate handheld VNA. The FieldFox RF VNA provides the best measurement stability in the industry, 0.01 dB/degree Celsius, and offers the world's first integrated QuickCal calibration capability available in a handheld VNA. QuickCal enables consistent measurement results and confidence in the data while eliminating the need to carry a calibration kit into the field.

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World’s first LTE test cases validated by 7 layers

7 layers, a global group of test & service centers for the wireless communications industry, is the first company world-wide that has succeeded in validating LTE test cases. Long Term Evolution (LTE) is the next-generation 3G technology for GSM, CDMA and WCDMA cellular carriers. LTE uses a different air interface and packet structure than current 3G systems. Enormously increased data transmission rates (average 150MBit/s) are an important precondition that will finally make the mobile web come real.

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Aeroflex Launches Multiple Handset Emulation Capability for the De Facto Industry Standard TM500 DC-HSDPA Test Mobile

Aeroflex Launches Multiple Handset Emulation Capability for the De Facto Industry Standard TM500 DC-HSDPA Test Mobile

Aeroflex announced today that its TM500 Test Mobile is the first to market to support multiple UE (user equipment, or handset) emulation in conjunction with measurements for the 3GPP W-CDMA Release 8 DC-HSDPA (Dual Cell High-Speed Download Packet Access) standard.

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Aeroflex's DC to 40 GHz SMART^ET 5300 Reduces Life Cycle Cost of High-performance, High-speed RF and Microwave Testing

Aeroflex's DC to 40 GHz SMART^ET 5300 Reduces Life Cycle Cost of High-performance, High-speed RF and Microwave Testing

For high-performance, high-speed testing of RF and microwave devices, Aeroflex introduces the SMART^E 5300 general-purpose test environment. The DC to 40 GHz SMART^E 5300 is unique in its ability to test, monitor, and control any Device Under Test (DUT) within a single test environment.

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LeCROY Chooses Keithley RF/Microwave Switch for its Superspeed USB 3.0 Test Suite

LeCROY Chooses Keithley RF/Microwave Switch for its Superspeed USB 3.0 Test Suite

Keithley Instruments announced today that LeCroy Corporation, a leading producer of serial data test solutions, has chosen Keithley's System 46 (S46) RF/Microwave Switch System as part of the original equipment for its new USB 3.0 Test Suite product family. Keithley's S46 switch is engineered to simplify the automated switching needed to test a wide range of telecommunications products and devices, including Bluetooth devices. The USB 3.0 Test Suite represents the industry's first single-source lineup of test instruments that can comprehensively support the Universal Serial Bus (USB) 3.0 standard, also known as SuperSpeed USB.

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RF Engines launches highly configurable, multichannel RF signal generator

RF Engines Limited (RFEL) has developed a highly sophisticated, 32 channel RF signal generator that is designed to enable challenging RF environments to be recreated in labs to test RF equipment. RFEL's world class expertise in RF and signal processing has enabled them to create a complete solution on a Xilinx Virtex-5 FPGA chip that is run within a PC on a PCI-express card. The PCI Upconverter is a very flexible and configurable system that replaces racks of expensive RF test equipment offering significant saving for Test and Measurement Laboratories.

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Anritsu Expands Measurement Capability of Handheld Spectrum Analyzers to Include Signal Analyzer Functions

Anritsu Company announces it has expanded the test capability of its MS2712E and MS2713E Spectrum Master handheld spectrum analyzers to include signal analyzer capabilities. With the new 10 MHz bandwidth demodulation option, the MS2712E/MS2713E can test and verify the RF quality, modulation quality, and downlink coverage quality for all the major wireless standards, including LTE, WiMAX, WCDMA/HSDPA, TD-SCDMA/HSDPA, CDMA, and GSM/GPRS/EDGE.

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Anritsu Introduced AM/FM/PM Spectrum Analysis Capability for Spectrum Master and Site Master Analyzers

Anritsu Company introduced AM/FM/PM analysis capabilities in its MS2712E/MS2713E Spectrum Master and S332E/S362E Site Master analyzers. Specifically meeting the needs of professional broadcast and land mobile radio (LMR) field technicians and engineers, the new option brings the inherent advantages of the industry leading handheld analyzers to professional broadcast and LMR applications.

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Agilent Introduced Complete Test Solution for PCI Express 3.0 Featuring the New Digital Test Console

Agilent Technologies introduced its PCIe3.0 test solutions and the new Agilent Digital Test Console. The Digital Test Console is the industry's only complete and integrated x1 through x16 protocol analyzer and exerciser solution for the PCI Express 3.0 specification, currently under development within the PCI-SIG®. The Digital Test Console offers the industry's largest capture buffer and fastest download interface, with multiple non-intrusive probing options that employs the latest ESP technology. The Digital Test Console was designed to assist with PCIe 3.0 development and provide accurate test results.

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Agilent Technologies' Advanced Design System 2010 to Support Emerging IBIS-AMI Modeling Standard

Agilent Technologies' Advanced Design System 2010 to Support Emerging IBIS-AMI Modeling Standard

Agilent Technologies Inc. today announced its support for IBIS-AMI (Algorithmic Modeling Interface) -- a modeling standard for SerDes transceivers created to enable fast, statistically significant analysis of high-speed serial links. Agilent's work in support of this standard is expected to yield the commercial release of a new version of Advanced Design System, ADS 2010, which will allow signal integrity designers to integrate IBIS-AMI models into their ADS projects.

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Agilent Technologies - One-Box Solution for High-Speed Serial Interconnect Analysis

Agilent Technologies - One-Box Solution for High-Speed Serial Interconnect Analysis

Agilent Technologies today introduced the Time Domain Reflectometer (TDR) application software option for the Agilent E5071C ENA network analyzer. The combined E5071C and TDR application software make the ideal one-box solution for high-speed serial interconnect analysis. The E5071C with the TDR option includes three breakthrough features; simple and intuitive operation, fast and accurate measurements, and lower cost of ownership. The one-box solution is used by signal integrity engineers who require efficient design and verification in R&D, quality assurance and manufacturing.

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Agilent Technologies, DeMille Research Inc. to Offer CAD Translation, Test Development Tools for Agilent Medalist In-Circuit Testers

Agilent Technologies Inc. and DeMille Research Inc announced they have signed a value-added reseller agreement that allows Agilent to offer DRI's TestSight Developer software to its Medalist i3070 and Medalist i1000 in-circuit test (ICT) customers.

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Byte Paradigm and MTCS to sell test instruments in China

Byte Paradigm (Nivelles, Belgium) and MTCS Systems Engineering (Beijing, China) are pleased to announce that they are starting a collaboration to market Byte Paradigm's PC instrumentation products in China.

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Unit test tool allows temporal component testing

Unit test tool allows temporal component testing

The latest version of Tessy, a tool to automate unit / module / integration testing of embedded software, features "temporal component testing" as major enhancement. It allows testing several test objects integrated, under certain circumstances even using simulated time, hence "temporal".

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Economical Aeroflex 3250 Series spectrum analyzers add  8 GHz tracking generator option

Economical Aeroflex 3250 Series spectrum analyzers add 8 GHz tracking generator option

The Aeroflex 3250 Series spectrum analyzers now include an optional 8 GHz tracking generator. Ideal for any kind of bench or lab environment, the new 3250 Series tracking generator has a frequency range of 100 kHz to 8 GHz and a level range from 0 dB down to -20 dB. An adjustable output level, with a setting resolution of 0.5 dB, provides additional flexibility when testing the frequency response and compression characteristics of amplifiers, filters, and non-linear devices.

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Tektronix Introduces Fully Automated Test Support for SAS Conformance

Tektronix Introduces Fully Automated Test Support for SAS Conformance

Tektronix today announced an automated compliance and test automation solution that now spans both SATA and SAS (Serial Attached SCSI). It encompasses the breadth of SAS conformance tests defined by UNH-IOL and the SCSI Trade Association (STA). Using the latest TekExpress software, storage system designers can complete these tests by simply pressing a single button which ensures accurate and consistent results — saving set-up time and eliminating time-consuming and repetitive manual testing.

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Multi-Tool for R&D testing  mobile devices from 7 layers

Multi-Tool for R&D testing mobile devices from 7 layers

7 layers has developed a new small and affordable InterLab R&D Multi-Tool. It is ideal for creating an over-the-air test environment for mobile phones without the need for an RF wired connection. The system supports tests such as battery lifetime, data throughput and RF- and acoustic parameter measurements.

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Test System Ensures that SERCOS III Slave Implementations from Different Manufacturers are Interoperable

Test System Ensures that SERCOS III Slave Implementations from Different Manufacturers are Interoperable

The SERCOS III Slave Conformizer is a powerful test tool for slave devices on the SERCOS III Ethernet-based automation bus. It ensures that SERCOS III slave implementations from different manufacturers are compatible and interoperable.

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CellMetric launches 4G LTE eNodeB Test Signal Generator

Cambridge based digital cellular and broadcast company CellMetric announces the launch of a Long Term Evolution (LTE) eNodeB 4G base station test signal generator. CellMetric's Modus 6 LTE test solution is compliant with Release 8 of the Third Generation Partnership Project standard (3GPP) and supports both Time Domain Duplex (TDD) and Frequency Domain Duplex (FDD) modes. This follows the 11th December 2008 functional freeze of LTE as part of 3GPP Release 8.

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Verizon Wireless Chooses Spirent For LTE Testing

Verizon Wireless announced today that the company has selected Spirent Communications as a provider of testing solutions for the certification of devices that will operate on the nationwide 4G Long Term Evolution (LTE) network that Verizon Wireless is building on the Upper 700 MHz C-Block spectrum.

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Take a trip to Barcelona and learn from the leading experts in LTE test and service monitoring

LTE will for sure be in the spotlight this year at Mobile World Congress February 15-18 in Barcelona. Come visit Anritsu at stand 1B31 to see live LTE testing of devices and networks, and discuss the activities and trends within the testing community.

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Tektronix SuperSpeed Test Solution Supports World’s First USB 3.0 Certification At NEC Electronics

Tektronix SuperSpeed Test Solution Supports World’s First USB 3.0 Certification At NEC Electronics

Tektronix announced that its SuperSpeed USB solution supported the verification of signal quality for NEC Electronics Corporation's USB 3.0-compatible host controller –the world's first to obtain USB 3.0 certification from the USB Implementers Forum.

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Free Keithley Web-Based Seminar Illustrates Best Practices for On-Wafer Probing

Keithley Instruments will broadcast a free, web-based seminar titled "Tips, Tricks, and Traps for On-Wafer Probing" on Thursday, January 28, 2010. This one-hour seminar will demonstrate the best practices for on-wafer probing and how to identify and solve common problems. To register for this event, which will be broadcast at 15:00 CET for the European audience, visit http://www.keithley.info/probingtips.

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Agilent Technologies Introduces 28 Gb/s Multiplexer for J-BERT, ParBERT

Agilent Technologies Introduces 28 Gb/s Multiplexer for J-BERT, ParBERT

Agilent Technologies announced the N4876A 2:1 Multiplexer, extending the generator data rate of the J-BERT N4903B and ParBERT 81250A up to 28 Gb/s. Design and test engineers in the semiconductor, communications, storage, and computing industries now can accurately characterize the next generation of serial interfaces to optimize their design margins. The first public showing of the N4876A is January 20 at the Fiber Optics Expo 2010, Agilent Booth EAST 1-43.

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PXI Programmable Amplifier and Attenuator Expand National Instruments RF and Microwave Test Portfolio

PXI Programmable Amplifier and Attenuator Expand National Instruments RF and Microwave Test Portfolio

National Instruments has expanded its automated test product line with two new RF signal conditioning modules that enhance the measurement accuracy and flexibility of PXI-based RF and microwave test systems. In applications such as RF signal path degradation modeling, field strength metering and receiver testing, engineers can combine the new NI PXI-5695 8 GHz programmable RF attenuator with a vector signal generator (VSG) to improve RF signal quality at low power levels. Engineers can integrate the NI PXI-5691 8 GHz programmable RF preamplifier, which also functions as a power amplifier, with VSGs to increase maximum power and with vector signal analysers (VSAs) to measure low-level signals.

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Agilent Technologies Introduces 12-GHz Differential Wafer Probing Solution for Better Signal Integrity

Agilent Technologies Introduces 12-GHz Differential Wafer Probing Solution for Better Signal Integrity

Agilent today introduced a 12-GHz differential wafer probing solution. The fine-wire probe tip is a high-fidelity, high-bandwidth solution that allows R&D and test engineers to debug and test high-speed active ICs using an oscilloscope.

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Optical Multi-Meter Operates in Three Modes

Optical Multi-Meter Operates in Three Modes

GAO Fiber Optics, a leading supplier of fiber optic equipment, launched its upgraded, highly accurateoptical multi-meter .which can act as an optical power meter and a stable light source or be used as a loss measurement system. It is intended to measure optical loss and check the performance of optical parts. The optical meter is specifically designed for single mode fiber measurement. It has a high definition backlit LCD screen and an AC-DC adaptor, a rechargeable Ni-Cd battery and dry cells as power sources for selection. A compact size and light weight design makes it ideally suited for fieldwork.

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Tektronix Communications Introduces New Platform for More Efficient Core Network Testing

Tektronix Communications Introduces New Platform for More Efficient Core Network Testing

Tektronix Communications today unveiled the Spectra2u Core Network test platform for the Spectra2 protocol test product line. Built on an Intel Dual Quad Core processing architecture, Spectra2u allows network equipment manufacturers and telecom operators to test NGN, VoIP and converged networks for functionality, conformance, performance and media quality – all from a single, high capacity, multi-user test platform. The Spectra2u offers a low-cost footprint supporting IP and TDM interfaces for signaling and media.

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Ultrasonic Wind Sensors Displayed at AMS 2010

Ultrasonic Wind Sensors Displayed at AMS 2010

Gill Instruments Ltd, a leader in ultrasonic wind measurement technology, will exhibit their extensive product range at the AMS Annual Meeting in Atlanta, GA, USA on 17 – 21 January 2010. The product range on display will include Gill's popular 2-axis and 3-axis ultrasonic anemometers and weather station, with a live demonstration of the low-cost WindSonic anemometer.

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Tektronix Named Finalist for Best in Test  2010 Awards

Tektronix Named Finalist for Best in Test 2010 Awards

Tektronix announced that its MSO70000 mixed signal oscilloscope was selected by the editors of Test & Measurement World magazine for its Best in Test 2010 industry awards. The MSO70000 mixed signal oscilloscope is one of 6 products receiving the nomination in the oscilloscope category putting it in the running for 2010 Test Product of the Year. The awards honor products that have brought significant technological advancement to the test industry.

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GL Releases Enhanced Voice-Band Analyzer

GL Releases Enhanced Voice-Band Analyzer

GL Communications Inc. announced today the release of enhanced Voice-Band Analyzer (VBA) - An analysis tool for monitoring voice band traffic over VoIP, TDM, and Wireless networks. Speaking to press, Mr. Jagdish Vadalia Senior Manager said, Voice-Band Analyzer (VBA) is an analysis tool for monitoring voice band traffic over VoIP, TDM, and Wireless networks. It can host a variety of analysis algorithms. Built-in algorithms include ITU-T P.56 Active Voice Level analysis, Line Echo (Hybrid) analysis, Acoustic Echo analysis, and Traffic Classifier. He added, Other analysis modules such as ITU-T P.561, P.562, and P.563 can be hosted as plug-ins.

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LG Electronics Demonstrated LTE USB Modem Performance Using Anritsu LTE Instruments

Anritsu Corporation announced that the Anritsu MD8430A LTE Signaling Tester and MX786201A Rapid Test Designer (RTD) software has been selected by LG Electronics (LG) as a primary test solution for device development, integration, and performance testing.

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Strengthened Measurement Solution for Active Optical Devices

Strengthened Measurement Solution for Active Optical Devices

Anritsu Corporation announces the launch of its new high-speed, easy-to-use, MS9740A Optical Spectrum Analyzer the perfect measurement solution for higher productivity on active optical device manufacturing lines.The MS9740A is designed to measure the output characteristics of active optical devices used in optical communications systems. It features the high speeds required by makers of active optical devices used in optical communications, such as optical transceivers and EDFAs, reducing the time from waveform sweeping to analysis and saving of results files to an external PC controller to less than 0.2 s, or 80% faster than previous conventional instruments. Moreover, the simple measurement procedure is based on a built-in menu for seven types of active optical devices. All the key measurements required for manufacturing evaluations, including optical center wavelength, level, OSNR (Optical Signal to Noise Ratio) are measured as a batch simply by selecting the target device from the

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Spirent Introduces A-GLONASS Test Solution for Mobile Devices

Spirent Communications plc today introduced the industry's first solution to test Assisted GLONASS capability on UMTS mobile devices and chipsets. Supported on Spirent's 8100 UMTS Location Technology Solution, the new A-GLONASS testing capability gives early adopters of A-GLONASS a competitive edge by enabling the delivery of better-performing devices and improved user experiences.

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Agilent Technologies Introduces Factory-Tested Analyzers for Greenhouse Gases

Agilent Technologies Inc. today announced the availability of two Greenhouse Gases (GHG) Analyzers for simultaneous analysis of methane (CH4), carbon dioxide (CO2), and nitrous oxide (N2O) in air samples. The analyzers also can be used for soil gas analysis or plant breathing studies, where the samples contain CH4, N2O, and CO2. Both analyzers easily can be expanded to determine sulfur hexafluoride (SF6).

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Molex announces updated Brad NetAlytix v2 Software for its eNetMeter Diagnostic Solution

Molex announces updated Brad NetAlytix v2 Software for its eNetMeter Diagnostic Solution

Molex Incorporated introduced updated Brad NetAlytix v2 software to make it easier to quickly access DeviceNet signal issues, as measured using eNetMeter DN. NetAlytix PC-based software has always provided an easy-to-use graphical display of network data, but version 2 is enhanced to provide a tree display for all network nodes being monitored by eNetMeter DN for faster access to data for a specific MAC ID. Nodes are colour-coded to depict their status. For example, green signals to users that everything is working properly, while yellow signals a warning and red indicates an error.

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TRaC Reaches Milestone in Worldwide Approval

TRaC has reached a major milestone, by now providing a turn-key test approvals management service for accessing over 150 countries. The process of gaining test approvals for worldwide markets is complex; every region requires its own unique demonstration of compliance, making a 'one certificate fits all' approach impossible.

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USB based TAP from New Forest Electronics

USB based TAP from New Forest Electronics

New Forest Electronics has introduced a new portable USB based unit into its range of TAPs (Test Access Points), interface devices that allow diagnostic access to computer networks without breaking the circuit.

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Portable Optical Power Meter Series with Long Wavelength (LW) Probe

Portable Optical Power Meter Series with Long Wavelength (LW) Probe

GAO Fiber Optics launched its upgraded, highly accurate optical power meter series . with a LW probe and a thin film switch. Utilizing a single-chip microcontroller, this versatile optical power meter series is widely used in the construction, maintenance and measurement of fiber optic cables and optical fiber sensors. The handheld, durable design and simple operation make it suitable for on-the-spot measurements in the field.

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Agilent Technologies Announces Significant Performance Enhancements to its PXB Baseband Generator and Channel Emulator

Agilent Technologies Announces Significant Performance Enhancements to its PXB Baseband Generator and Channel Emulator

Agilent Technologies Inc. today introduced a series of enhancements to its N5106A PXB baseband generator and channel emulator designed to expand its use across the R&D lifecycle -- from design, integration and verification to pre-conformance. With these enhancements, the PXB now offers multi-channel baseband generation (BBG), real-time fading, and signal capture in a single, multi-purpose instrument. The new functionality makes it ideal for engineers working on product development as well as conducting advanced research.

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Agilent Technologies Introduces an Advanced RF GPS Simulator

Agilent Technologies Introduces an Advanced RF GPS Simulator

Agilent Technologies Inc. introduces GPS receiver verification software for its PXB baseband generator and channel emulator platform. The new Agilent N7609B Signal Studio for Global Navigation Satellite Systems software is the only 12-satellite, 24-channel signal simulator built on a high-performance, general-purpose signal generator.

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Yokogawa Europe and Hitec Power Protection collaborate to provide high-current power measurements

Yokogawa Europe and Hitec Power Protection collaborate to provide high-current power measurements

Yokogawa Europe has teamed up with Hitec Power Protection of Almelo, The Netherlands, to develop a range of high-current power measurement solutions combining Yokogawa's family of precision power analysers with Hitec's Zero-flux(TM) range of DC current-transformer based sensors.

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Boundary Scan Platform from GOEPEL electronic

Boundary Scan Platform from GOEPEL electronic

GOEPEL electronic, vendor of JTAG/Boundary Scan solutions, introduced BAC 9305-RS422/485, another Bus Access Cables (BAC) as a new member of the industry leading JTAG/Boundary Scan hardware platform SCANFLEX.

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LeCroy First to Ship PCI Express 3.0 Protocol Analyzer

LeCroy Corporation, a leading supplier of serial data test solutions, today announced the first shipments of PCI Express 3.0 Protocol Analyzers in the protocol test equipment industry. The new Summit T3-16 is LeCroy's fifth generation of protocol analyzers targeted at high speed PCI Express I/O-based applications. The LeCroy Summit T3-16 captures, decodes and analyzes PCI Express bus traffic at data rates up to 8 GT/s per lane on bus widths up to 16 lane, with an effective data transfer rate of 2X the previous PCIe 2.0 specification (5 GT/s).

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Singapore Laboratory Achieves ISO 17025 Certification from A2LA

Teseq Singapore has announced that its Calibration Laboratory has attained accreditation to the ISO/IEC 17025:2005 standard by the American Association for Laboratory Accreditation (A2LA) as of 7th December 2009. This includes accreditation to ANSI/NCSL Z540-1-1994 and admission to the ILAC International Mutual Recognition Agreement.

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Buckeye CableSystem Selects Spirent’s In-Home MoCA Testing Solution

Spirent Communications today announced that Buckeye CableSystem, a regional cable operator servicing northern Ohio and southeast Michigan, selected Spirent's Tech-X Flex for testing its Multimedia over Coaxial (MoCA) in-home networks and DVR sharing application. Spirent's market leading in-home tester allows Buckeye to establish and retain customer loyalty while increasing revenue potential by isolating and drilling down to the root causes of MoCA-related service calls.

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Agilent Technologies Extends Leadership in LTE Test Capability with PXA Signal Analyzer

Agilent Technologies Extends Leadership in LTE Test Capability with PXA Signal Analyzer

Agilent Technologies has announced an LTE test solution that combines the market-leading Agilent 89600 VSA LTE FDD and LTE TDD analysis software with the highest-performance member of the Agilent X-Series, the Agilent N9030A PXA signal analyzer.

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Agilent Technologies, Derby Associates Announce Pact to Offer Derby Web-based Quality Management Tool with Agilent Medalist i3070 In-Circuit Testers

Agilent Technologies and Derby Associates International Inc., a leader in Web-based decision support and data collection solutions, announced the signing of a joint marketing agreement that allows Agilent to offer a new Medalist i3070and 3070 in-circuit tester-based quality tool called Web-Push Button Quality (Web-PBQ) to its customers. Web-PBQ, a flexible and scalable solution, is based on Derby's Web-native technology

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New HSPA+ and LTE test services now available at 7 layers

The USA entity of the global 7 layers group is the first accredited laboratory in North America offering both HSPA+ and LTE test services. 7 layers has selected test equipment vendor Rohde & Schwarz to upgrade its laboratory.

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High Performance Optical Time-Domain Reflectometer

High Performance Optical Time-Domain Reflectometer

GAO Fiber Optics, a leading supplier of fiber optic equipment, launched its upgraded, highly accurate Optical Time-Domain Reflectometer (OTDR) which is intended for engineers and technicians to measure unit, connection or transmission loss and to locate faults and breaks in optical fibers. The mini-OTDR is commonly used in the manufacture, construction and maintenance of optical networks.

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Agilent Announces Windows® 7 Support for Acqiris Digitizer Products

Agilent Announces Windows® 7 Support for Acqiris Digitizer Products

Agilent Technologies Inc. today announced Acqiris Software Release 4.0, including support for the 32-bit and 64-bit versions of Windows 7, for its Acqiris Digitizer Products. The software is available today on CD-ROM, or online at www.agilent.com/find/acqiris-software-cd-rom after Dec. 18, 2009.

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Agilent Technologies' Stereo Viewer with NVIDIA 3D Vision Technology Brings James Clerk Maxwell's Famous Equations to Life

Agilent Technologies' Stereo Viewer with NVIDIA 3D Vision Technology Brings James Clerk Maxwell's Famous Equations to Life

Agilent Technologies Inc. today announced a stereo 3D viewer capability for the Momentum G2 Element and FEM Element electromagnetic (EM) simulators in its Advanced Design System (ADS) EDA platform. The new stereo 3D viewer leverages NVIDIA Quadro graphics processing units (GPUs) and NVIDIA's unique 3D Vision quad buffered stereo technology, originally designed for immersive mechanical design, digital content creation and video games, to render electric and magnetic fields and currents for scientists and engineers in crisp, vivid, high-resolution 3D.

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Agilent Technologies' One-Vendor Drive Test Solution Combines Comprehensive Data Capture with High-Value Analysis

Agilent Technologies' One-Vendor Drive Test Solution Combines Comprehensive Data Capture with High-Value Analysis

Agilent Technologies Inc. today introduced the low-cost, robust-featured E6474A-910 Analysis Solution for analyzing cellular interface data captured by Agilent's Drive Test Wireless Network Optimization platform. In collaboration with Qualitest Technologies, Inc., Agilent now offers an Agilent-branded version of QualiTest's proven Gladiator system, enabling customers to obtain a complete data-collection and analysis solution from a single vendor.

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Agilent Technologies' New Triple Quadrupole GC/MS Offers Greater Precision, Selectivity and Sensitivity

Agilent Technologies, Inc. today introduced the 7000B Triple Quadrupole Gas Chromatograph/Mass Spectrometer (GC/MS/MS), delivering high confidence in ultra-trace level results, while shortening analysis times for target compounds in complex samples.

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Portable Measuring System For Movement Of Structures

Portable Measuring System For Movement Of Structures

Inertial Aerosystems have introduced a new, low cost, solution to monitoring and measuring movement of multiple structures / machinery. The system consists of a portable tiltmeter (Model 800P) and a hand held, battery powered, readout module (Model 870). Manufactured by U.S. based Applied Geomechanics, the 800P has no moving parts, so needs no maintenance and virtually no calibration.

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Agilent Technologies Introduces Flash Programming on its Medalist In-Circuit Test Platform

Agilent Technologies Introduces Flash Programming on its Medalist In-Circuit Test Platform

Agilent Technologies has introduced flash programming capabilities on its industry-leading Medalist i3070 Series 5 in-circuit test (ICT) utility card platform. This new high-performance, in-system programming (ISP) capability reduces cost of test while enabling fast and flexible code and design changes.

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Three-Phase Power Quality Analyzer available for immediate rental from Advanced Test Equipment Rentals

Three-Phase Power Quality Analyzer available for immediate rental from Advanced Test Equipment Rentals

The AEMC 3945 PowerPad captures, measures and records the waveforms, harmonics and transients produced by an electrical system. For troubleshooting purposes, this instrument displays volts, amps and harmonic content in real time and takes pictures to document and analyze. The full color display allows one to view and analyze each signal clearly and easily. Its high speed sample rate, at 256 samples per cycle, provides excellent reliability in reproducing waveforms and capturing transients that happen as fast as 62.5µs.

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BSI declares the 7 layers AG to the first certified test laboratory for BOS digital radio network

BSI declares the 7 layers AG to the first certified test laboratory for BOS digital radio network

The German Federal Agency for Digital Radio and Security Authorities and Organizations (Bundesanstalt für den Digitalfunk der Behörden und Organisationen mit Sicherheitsaufgaben, short BDBOS) is currently setting up a digital radio network, which shall be used by all police forces, rescue services, fire brigades etc. within the Federal Republic of Germany. Some of the Federal States have already started using this new technology in real life.

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National Instruments Enhances Digital Audio Test Capabilities

National Instruments Enhances Digital Audio Test Capabilities

National Instruments today announced new high-performance software and hardware additions to the NI AudioMASTER suite. The comprehensive set of analog and digital audio validation and production test software and hardware deliver an exhaustive automated test solution with a performance level previously found only in high-end audio analyzers. The latest software addition, AudioMASTER 6.1, combined with an NI 7813R reconfigurable I/O device and the new NI CB-2181 digital audio I/O accessory, gives users an easy-to-use, software-defined test solution to generate and analyze SPDIF digital audio for testing consumer and professional audio devices.

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Anritsu Introduces Microwave USB Power Sensor With Coverage up to 26 GHz Over 60 dB Dynamic Range

Anritsu Introduces Microwave USB Power Sensor With Coverage up to 26 GHz Over 60 dB Dynamic Range

Anritsu has introduces the MA24126A Microwave USB Power Sensor that can make highly accurate power measurements from 10 MHz to 26 GHz over 60 dB of dynamic range. The sensor employs a "dual path" architecture that provides True-RMS measurements over a broad frequency range and a dynamic range of 0.1 µW to 100 mW (-40 dBm to +20 dBm), allowing engineers and field technicians to conduct average power measurements on CW, multi-tone, and digitally modulated signals used in all major cellular and microwave point-to-point (P2P) bands, as well as aerospace and defense applications.

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Optical spectrum analyser for measurements on LEDs and laser light sources

Optical spectrum analyser for measurements on LEDs and laser light sources

The Yokogawa AQ6373 is an optical spectrum analyser designed to carry out measurements over the wavelength range from 350 to 1200 nm, including the visible light spectrum from 380 to 780 nm. In addition to its world-class optical performance in areas such as resolution, accuracy, sensitivity, measurement speed and dynamic range, the AQ6373 features a colour analysis function which makes it ideally suited to measurements on LEDs and laser light sources.

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Agilent Claims Breakthrough Chipset for Next-Generation, High-Bandwidth, Real-Time Oscilloscopes

Agilent Technologies claims a breakthrough functionality in next-generation, high-bandwidth oscilloscopes with the successful turn-on of a front-end chipset that uses indium phosphide (InP) technology. The new chipset will enable the company to deliver oscilloscopes in the first half of 2010 that offer true analog bandwidths greater than 16 GHz.

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Tektronix Enhances  DDR Test and Validation Portfolio with Two New Additions

Tektronix Enhances DDR Test and Validation Portfolio with Two New Additions

Tektronix has announced enhancements and upgrades to its market-leading DDR test and validation portfolio. New interposers being introduced for the Tektronix TLA7000 Series Logic Analyzers provide engineers with bus capture and analysis for the latest DDR3-1867 standard.

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Verigy’s V93000 Port Scale RF Test System Installed in Production Lines for 4G LTE Wireless Communication Chips

As the market for fourth-generation (4G) wireless communications continues to emerge, semiconductor test equipment company Verigy has installed its V93000 Port Scale RF tester in production lines for next-generation Long Term Evolution (LTE) broadband data and telephony chips.

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Honeywell and National Instruments Collaborate on Easily Configurable Test and Measurement Systems

Honeywell and National Instruments today announced their collaboration on test and measurement systems that offer plug-and-play compatibility between Honeywell sensors and National Instruments data acquisition instrumentation.

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Napatech Brings Intelligence To Network Monitoring

Napatech today announced the availability of unique features that provide visibility into tunnels for network monitoring and analysis of value-added services running over IP, such as VOIP, VPN and mobile data. Napatech's network adapters have the unique capability to intelligently distribute 10Gbps flows in real-time to up to 32 CPU cores based on Ethernet, IP, MPLS, layer 4 and now GTP, GRE and SCTP tunnel information.

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GL Releases Ultimate Diagnostic Tool for Telecom Networks

GL Releases Ultimate Diagnostic Tool for Telecom Networks

GL Communications Inc. announced today the release of a new application Call Data Record – an ultimate diagnostic tool for telecom networks. Addressing a press conference Mr. Vijay Kulkarni, CEO of the company said, "CDR provides comprehensive information on each and every call occurring on T1 E1 lines, including: voice capture for both directions, complete signaling information for each direction for CAS, ISDN, MFC-R2, SS7, all alarms and errors occurring during the call including BPV, Frame Errors, CRC errors, Loss Of Sync, and more".

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Agilent Technologies Introduces Universal Testing Machine for Nanomechanical Characterization at 2009 Materials Research Society Meeting

Agilent Technologies Inc today introduced an easy-to-use, enhanced-performance universal testing machine that offers highly accurate nanomechanical characterization capabilities. The Agilent T150 UTM lets researchers investigate dynamic properties of compliant fibers via the largest dynamic range and best resolution on the market -- five orders of magnitude of storage and loss modulus.

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Agilent Technologies Introduces Enhanced-Performance Dynamic Contact Module II for Nanomechanical Testing

Agilent Technologies Inc today announced the availability of an enhanced version of its popular Dynamic Contact Module for nanomechanical testing of materials. The Agilent DCM II features 3x higher loading capability (30mN max load); easy tip exchange for quick removal and installation of application-specific tips; and a full 70m range of indenter travel.

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NBS adds high speed flying probe to its evolving range of test services

NBS adds high speed flying probe to its evolving range of test services

Leading EMS provider NBS has announced the acquisition and installation of a SPEA high speed flying probe test system in its manufacturing facility located in Santa Clara, California. The addition of the SPEA Model 4040 extends the company's capabilities across the entire range of test and verification technologies. NBS employs a comprehensive test strategy that is a highly integrated part of its unique manufacturing system that successfully accommodates NPI and volume assembly side by side.

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LeCroy - PCI Express Gen 1.x, 2.0 and 3.0 Decode Annotation on Oscilloscopes to Speed Validation and Debug

LeCroy Corporation's PCI Express Decode Annotation for LeCroy oscilloscopes provides new capability for hardware and system engineers to simultaneously understand the physical layer and protocol behavior of high-speed PCI Express serial data signals. The new capability provides a link layer protocol decode for up to four PCI Express signals annotated on the oscilloscope physical layer waveform. It is the first and only oscilloscope-based decode solution for the widely adopted PCI Express Gen 2.0 and the emerging PCI Express Gen 3.0 standards. Combined with LeCroy's 8b/10b decode annotation tool (a separate option), simultaneous symbol/primitive and protocol level understanding can be achieved. For faster time to insight, all the standard math, measure, cursor, zoom, and other analysis tools available in the oscilloscope may be used concurrently.

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QualiPHY SAS-2 Compliance Testing Software

LeCroy today announced the launch of QualiPHY SAS-2, the first physical layer transmitter compliance test application for SAS-2, the latest generation of the Serial Attached SCSI standard. The release of this software expands LeCroy's portfolio of QualiPHY automated serial data compliance test solutions, providing automated control for the SDA 8 Zi series of oscilloscopes to test SAS initiators and targets running at 1.5 Gb/s, 3.0 Gb/s and 6.0 Gb/s. QualiPHY SAS-2 performs all transmitter physical layer tests in accordance with the UNH IOL Serial Attached SCSI (SAS) Consortium SAS-2 6Gbps Physical Layer Test Suite from Group 1 (TX OOB Signaling and AC Coupling Requirements), Group 2 (TX Spread Spectrum Clocking (SSC) Requirements) and Group 3 (TX NRZ Data Signaling Requirements).

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National Instruments Delivers Windows 7 Support for Engineers and Scientists

National Instruments Delivers Windows 7 Support for Engineers and Scientists

National Instruments has announced software and hardware compatibility with Windows 7, the latest operating system from Microsoft, to help engineers and scientists attain faster performance and higher throughput within their applications. Engineers and scientists who are considering upgrading to the latest computer hardware can take advantage of several new features in the new operating system. This release, which includes performance and usability enhancements, provides a smooth upgrade experience and improves the environment for hardware and software compatibility, making it ideal for measurement and workstation applications. Windows 7 contains features that provide increased USB data acquisition throughput and take full advantage of multicore processors to improve responsiveness and offer compatibility with the latest computer technologies, including support for PCI Express and 64-bit processors.

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Agilent Technologies Introduces Monolithic Laser Combiner System for Confocal and Fluorescence Microscopy

Agilent Technologies today introduced its monolithic laser combiner system for confocal and fluorescence microscopy applications. The MLC400 monolithic laser combiner brings Agilent's patented complex monolithic optic (CMO) design technology and proprietary fiber coupling capability into a complete laser illumination solution. The integrated lasers and optics are permanently aligned offering customers optical system stability and ease-of-use. As a result, researchers are able to spend more time doing scientific experimentation and less time maintaining their illumination optics.

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Technical Web Seminar: Keithley Shares Free Advice on How to Perform Photovoltaic Measurements

Keithley Instruments will broadcast a free web-based seminar titled "Photovoltaic Measurements: Testing the Electrical Properties of Today's Solar Cells" on Wednesday, December 10, at 15:00 Central European Time (CET). For detailed seminar information and to register, visit http://www.keithley.info/solarcelltest-webseminar.

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Portable Platforms for GL's VQT, IP, and VoIP Products

Portable Platforms for GL's VQT, IP, and VoIP Products

GL Communications Inc. announced today the release of portable platform solutions for Voice Quality Testing (VQT), IP, and VoIP Products. In a statement released to the press Mr. Rob Bichefsky, Senior Manager, at the company said, VQuad™ with the Dual UTA can be purchased with a NetBook PC for a truly lightweight portable solution. The Dual UTA is fully compatible with the miniature NetBooks and allows the VQuad™ software to be installed for full testing without any performance issues. He added, NetBook PCs are smaller and less expensive than traditional notebook computers, and they have a smaller screen, are lighter, and normally have a longer battery life.

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GL's Fax, Modem, and Voice Testing Solutions

GL Communications Inc. announced today the release of an enhanced portfolio of its Fax, Modem, and Voice Testing solutions. In a statement released to the press Mr. Vijay Kulkarni, CEO of the company said, GL's s voice, fax, and modem testing portfolio of solutions has been enhanced with an inclusion of T1 E1 Call Capture and Analysis, 2 Wire voice data/recorder, and PacketScan™ applications.

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IEC 61000-4-2:2008 compliant testing devices available at Advanced Test Equipment Rentals

IEC 61000-4-2:2008 compliant testing devices available at Advanced Test Equipment Rentals

Electrostatic discharge (ESD) is the sudden and momentary electric current that flows between two objects at different electrical potentials caused by direct contact or induced by an electrostatic field. The IEC 61000-4-2:2008 standard relates to the immunity requirements and test methods for electrical and electronic equipment subjected to static electricity discharges, from operators directly, and from personnel to adjacent objects. Such electronics vary anywhere from your kitchen blender to your home computer, basically anything containing a microchip.

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InterLab Bluetooth RF Test Solution first conformance RF test platform with validated test coverage for Enhanced Power Control

7 layers has announced that the InterLab Bluetooth RF Test Solution is the first conformance RF test platform to offer validated test coverage for Enhanced Power Control. This is a new feature which has been added to the Bluetooth technology in the Bluetooth 3.0 + HS specification version.

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Panasonic Selects National Instruments Products to Test Toughbook Laptop PCBs

National Instruments today announced that Panasonic engineers are using NI hardware and software products for the automated testing of new computer PCBs, including those in the new Toughbook rugged laptops. Panasonic has combined NI PXI modular hardware instrumentation with NI LabVIEW graphical development software and NI TestStand test management software to create a streamlined automated test system that has decreased the cost of system development and maintenance. By using this combination of NI hardware and software, Panasonic integrated multiple measurement functions into a single PXI test system that reduces physical footprint by more than 50 percent and significantly decreases power consumption.

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Spirent Enhances Data Center Performance Benchmarking with New Fibre Channel Test Module

Responding to the performance demands of dynamic, terabit-capacity data centers, Spirent Communications plc (LSE: SPT), the global leader in enterprise network testing, today introduced the Spirent HyperMetrics 2/4/8Gb Fibre Channel test module. By leveraging a holistic, unified test system, data center operators, network equipment vendors and system integrators can test every aspect of tomorrow's converged networks pre and post deployment.

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Fibre management firmware speeds OTDR tests on multicore cables

Fibre management firmware speeds OTDR tests on multicore cables

New firmware for the Yokogawa family of OTDRs (optical time-domain reflectometers) offers powerful new capabilities for measurements on multicore fibre cables. The new fibre management firmware allows users to keep track of which individual fibres have been tested, thereby eliminating the potential confusion between tested and untested fibres. As a result, the risk of errors in field operation is significantly reduced.

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Manncorp's SMD Counter In Aluminum Carry Case Does On-the-spot Inventory Taking

Manncorp's SMD Counter In Aluminum Carry Case Does On-the-spot Inventory Taking

A newly designed high-speed surface mount component counter that is smartly housed inside an aluminum carrying case is now offered by Manncorp. Once the MegaXP is unlocked and its chrome latches snapped open, the true and exceptionally functional purpose of this equipment becomes clear, claims CEO Henry Mann. This is a truly portable surface-mount component counter – easily carried from stock room to shipping area for incoming or outgoing order verification, or off-premises inventory taking.

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Agilent Infiniium 90000 Series Oscilloscope Hardware Yields Waveform Update Rates More than 20 Times Faster than Other High-Performance Scopes

Agilent Infiniium 90000 Series Oscilloscope Hardware Yields Waveform Update Rates More than 20 Times Faster than Other High-Performance Scopes

Agilent Technologies today announced the inclusion of faster PC hardware in the Infiniium 90000 Series oscilloscope family. These award-winning, high-performance, real-time oscilloscopes are the most responsive in their class with waveform update rates more than 20 times faster than comparable scopes.

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External Output Amplifier Extends Voltage Range of Existing Function Generators to 50Vpp

External Output Amplifier Extends Voltage Range of Existing Function Generators to 50Vpp

Agilent Technologies has introduced an economically priced 2-channel external output amplifier that provides up to 50 Vpp (Volts peak-to-peak) amplification of function/arbitrary waveforms. The instrument is designed to work in conjunction with engineers' existing function generators to extend the voltage range and offer low-distortion outputs.

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Vintage Technology Tested By Prism Sound Cutting Edge Test Gear

Vintage Technology Tested By Prism Sound Cutting Edge Test Gear

With sales of its valve audio equipment on the increase, UK manufacturer Thermionic Culture has invested in a Prism Sound dScope Series III Audio Analyzer to help speed up the flow of new products moving through its testing and quality control department. The company is so delighted with its dScope Series III unit – and with the level of support it has received from Prism Sound's technical staff – that it has now ordered a second instrument, which will be delivered shortly.

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Lantronix Releases ManageLinx 2.0 for Enhanced Remote Product Servicing and Device Management

Lantronix Releases ManageLinx 2.0 for Enhanced Remote Product Servicing and Device Management

Lantronix, Inc. today announced ManageLinx 2.0, the latest version of the company's secure, remote access solution. ManageLinx provides access to firewall-protected devices via the Internet.

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Wireless sensor kit tracks down the hot spots

Wireless sensor kit tracks down the hot spots

The TempTrackr multipoint wireless temperature measurement kit from Aspen Electronics is ideal for monitoring the temperature on equipment and installations in remote locations or where power and communication to the sensor is restricted. Designed for systems integrators and OEMs, the system is easy to install and use, highly portable and robust, with superior performance for real-time in-process temperature sensing.

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Differential pH sensor features sealed reference cell for long life and stability

Differential pH sensor features sealed reference cell for long life and stability

The new Yokogawa SC24 is a differential combined pH sensor intended for inline process control in applications involving aggressive and dirty solutions: for example, brine in chlorine manufacturing. The new sensor features a sealed glass reference cell which prevents fouling and ensures measurement stability as well as being virtually maintenance free.

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National Instruments Expands PXI Capabilities for Semiconductor Test With New Suite of Modular Instruments

National Instruments Expands PXI Capabilities for Semiconductor Test With New Suite of Modular Instruments

National Instruments today introduced 10 new PXI products that expand the capabilities of PXI for mixed-signal semiconductor test. The suite of new software-defined products, which are optimized for use with NI LabVIEW graphical system design software, includes four high-speed digital I/O (HSDIO) instruments, two digital switches, two enhanced RF instruments, a high-precision source measure unit (SMU) and specialized digital vector file importing software. The new NI PXI Semiconductor Suite incorporates numerous new features including 200 MHz single-ended digital I/O, 10 pA current resolution, rapid multiband RF measurements, DC/digital switching and Waveform Generation Language (WGL) and IEEE 1450 Standard Test Interface Language (STIL) file importing capability.

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Key enhancement for TD-SCDMA handset testing focused towards China mobile phone market, including GSM handover capability

Key enhancement for TD-SCDMA handset testing focused towards China mobile phone market, including GSM handover capability

Anritsu Corporation has further enhanced the functions of its MD8470A Signalling Tester to support R&D and verification of TD-SCDMA mobile terminals. The October 19 rollout of its TD-SCDMA/HSPA Signalling Unit along with the new TD-SCDMA/GSM Simulation Kit and TD-HSPA Software options has enabled this new capability. These test equipment options are supporting the 3.5G TD-SCDMA/HSDPA*1 high-speed data communications standard that is spreading rapidly in China.

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Anritsu - Next-Generation Field OTDRs Generation

Anritsu - Next-Generation Field OTDRs Generation

Anritsu Company, a global provider of test and measurement solutions for advanced and converged networks, introduces its ACCESS Master MT9083C high-performance OTDR Series. The MT9083C series delivers the best optical performance in the 45 dB mini-OTDR class with industry-leading resolution and the fastest measurement distance acquisition for mid- to long-range (>40 km) networks, providing field personnel with a test solution to accurately and quickly test traditional and PON-based FTTx networks.

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Agilent Technologies Expands Ultra-High-Performance Liquid Chromatography Portfolio with New High- Throughput Injectors

Agilent Technologies today introduced the 1290 Infinity LC Injector HTS/HTC sample injection system offering superior performance in speed, ultra-low carryover, and robustness for customers requiring high throughput.

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Free-for-Life Tool Cracks PCB Debug Challenge

Free-for-Life Tool Cracks PCB Debug Challenge

With the breakthrough product family, JTAG Live, debugging boards too crowded for traditional probing becomes a whole lot easier. JTAG Live is ideal for electronics engineers and technicians to use in checking PCBs for basic continuity and correct operation.

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Technical Web Seminar from Keithley Teaches the Basics of Low Current Electrical Measurements

Keithley Instruments is hosting a free online seminar in which the company will explore the basics of electrical measurements from nA to fA . The webcast, which will be broadcast on Thursday, 19 November, at 15:00 CET, is free to attend, but registration is required. For detailed seminar information and to register, visit http://www.keithley.info/low-current-webinar.

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Agilent Technologies, Nexus Technology Deliver DDR3 Memory Bus Debug Solutions

Agilent Technologies, Nexus Technology Deliver DDR3 Memory Bus Debug Solutions

Agilent Technologies Inc. and Nexus Technology Inc. today made available DDR3-1867 DIMM and DDR3-1600 SODIMM slot interposer test solutions. These test solutions are the ideal tools for designers performing DDR3 DIMM or SODIMM validation, failure analysis, and bus functional-parametric validation in servers, supercomputing, desktops, laptops and computing applications.

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Agilent Technologies' Expanded HDMI Test Solution Portfolio on Display at CEA 861/HDCP PlugFest13

Agilent Technologies' Expanded HDMI Test Solution Portfolio on Display at CEA 861/HDCP PlugFest13

Agilent Technologies today announced that its enhanced High-Definition Multimedia Interface (HDMI) test solution portfolio is being demonstrated at the CEA 861/HDCP PlugFest13, Nov. 8-13, in Burlingame, Calif. The expanded solution enables engineers to test the new features introduced by the HDMI Specification 1.4 such as HEAC (HDMI Ethernet and Audio Return Channel) support or 4K x 2K and 3-D video format support. The test solution also increases efficiencies, reduces development costs and provides highly accurate test results.

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Aeroflex launches complete solution for RF parametric test of wireless subsystems, including LTE

Aeroflex launches complete solution for RF parametric test of wireless subsystems, including LTE

Aeroflex announced today the launch of the 7000 Series Vector Analyzer Generator (VAG), a single, fully integrated RF parametric test system for RF test of wireless components and subsystems. The 7000 Series combines both vector signal generation and vector signal analysis in a single box, providing an integrated approach to measurements for complex wireless standards, including LTE. The instrument features an intuitive touch-screen user interface that simplifies wireless testing. Its modular, software-defined functionality provides a flexible, 'future-proof' platform for advanced wireless technologies, including LTE, GSM/GPRS/EDGE, 3G/HSPA, and WLAN.

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Tektronix Communications Announces Suite of Network Intelligence Products for Enhanced Performance Monitoring of Next Generation IP Networks

Tektronix Communications, a leading worldwide provider of Network Intelligence and Communications Test Solutions, today unveiled a suite of new Network Intelligence products that effectively collect, correlate and analyze media and signaling data from next-generation IP telecommunication networks, turning data into actionable information that drives better operational and business results. Designed to meet the needs of both legacy and next-generation converged IP networks, the Iris suite of products consists of the GeoProbe G10, a new high-speed 10GE probe; three new analyzer applications; and a common platform that provides a single, integrated framework for current and future applications.

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LeCroy introduces first oscilloscope-based decode solution for PCI Express 2.0 and 3.0

LeCroy introduces first oscilloscope-based decode solution for PCI Express 2.0 and 3.0

LeCroy Corporation's PCI Express Decode Annotation for LeCroy oscilloscopes provides new capability for hardware and system engineers to simultaneously understand the physical layer and protocol behavior of high-speed PCI Express serial data signals. The new capability provides a link layer protocol decode for up to four PCI Express signals annotated on the oscilloscope physical layer waveform. It is the first and only oscilloscope-based decode solution for the widely adopted PCI Express Gen 2.0 and the emerging PCI Express Gen 3.0 standards. Combined with LeCroy's 8b/10b decode annotation tool (a separate option), simultaneous symbol/primitive and protocol level understanding can be achieved. For faster time to insight, all the standard math, measure, cursor, zoom, and other analysis tools available in the oscilloscope may be used concurrently.

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National Instruments Introduces Video Test Solution for Multimedia Device Testing

National Instruments Introduces Video Test Solution for Multimedia Device Testing

National Instruments today introduced NI VideoMASTER 3.0, a new PXI Express-based digital video analyzer for validation and production test of multimedia devices. VideoMASTER simplifies the testing of multimedia devices by using configurable measurement steps within NI TestStand test management software to automate a full suite of video measurements. By taking advantage of the efficient, configurable performance of VideoMASTER 3.0, multimedia test engineers can significantly reduce development costs and decrease overall test time.

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Agilent Technologies Introduces  Network Analyzer with Wide Frequency Range

Agilent Technologies Introduces Network Analyzer with Wide Frequency Range

Agilent Technologies Inc. today introduced a compact network analyzer, the Agilent E5061B, that analyzes a frequency range as low as 5 Hz up to the RF (radio frequency) range of 3 GHz. This network analyzer's broad range and versatility eliminates the need for additional low-frequency-dedicated instruments.

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Agilent Technologies Introduces Compact USB 3.0 Test Setup

Agilent Technologies Introduces Compact USB 3.0 Test Setup

Agilent Technologies Inc. today announced it significantly enhanced its SuperSpeed USB test solution portfolio with the introduction of new test fixtures and the support of automated compliance tests and characterization with the new J-BERT N4903B. The new, compact setup will be unveiled at the USB-IF Compliance Workshop in Portland, Ore., Nov. 2-4.

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Synopsys extends DFTMAX compression to reduce the cost of pin-limited test

Synopsys has announced a new capability in DFTMAX compression that significantly reduces the cost of test for designs and methodologies that mandate very few test pins. Extending Synopsys' patented adaptive scan technology with a high-performance, low-pin interface to the tester allows designers to achieve predictable compression of up to 100X or more with only one pair of test data pins. As designers must maintain test quality and reduce test cost while design complexity is growing, they increasingly adopt core-based design and test methodologies as well as multi-site testing techniques, significantly limiting the number of pins allocated for test. Widely deployed, DFTMAX compression now delivers even greater test time and cost savings for today's challenging designs.

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Teseq Fully CISPR-Compliant Digital EMC/EMI Receivers

Teseq Fully CISPR-Compliant Digital EMC/EMI Receivers

TESEQ has announced the introduction of the Narda PMM 9010, a fully digital receiver covering the frequency range 10 Hz to 6 GHz. The PMM 9010 is the cornerstone of a system which grows together with the users' needs. All EMC conducted measurements are be possible by simply upgrading the PMM 9010 with specific options, e.g. Click Meter, and accessories such as LISNs and probes This will allow the PMM 9010 to provide full compliance testing to any known international standard or proprietary specifications.

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Haefely PEFT 4010 burst test system available for immediate rental from Advanced Test Equipment Rentals

Haefely PEFT 4010 burst test system available for immediate rental from Advanced Test Equipment Rentals

Electrical fast transients (EFT) are the most popular sources of disturbances in modern electronic circuits. The Haefely PEFT 4010 instrument contains all the features expected from a top quality EFT generator. Unbeaten performance paired with a high end assembly guarantees a cost effective, long-lasting investment and valuable test results.

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Tektronix Adds MIPI Support to DPO7000 Series Oscilloscopes

Tektronix Adds MIPI Support to DPO7000 Series Oscilloscopes

Tektronix has announced a series of enhancements to its popular DPO7000 Series Oscilloscopes, including support for the Mobile Industry Processor Interface (MIPI) D-PHY standard and new UART/RS-232 protocol analysis software. Additionally, the DPO7000 Series now includes four passive probes and three analysis tools as part of standard configurations. ­­­

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Agilent Offers 4-Tap De-Emphasis Converter, Highest Flexible SSC Injection

Agilent Technologies has announced the addition of a 4-tap de-emphasis signal converter N4916B, an ultraflexible SSC injection and a SATA ISI channel to its J-BERT N4903B high-performance serial BERT. The new capabilities enable R&D and test engineers to accurately characterize receiver ports and channels of multigigabit serial bus interfaces, such as Quickpath Interconnect (QPI), Hypertransport, PCI Express, DisplayPort, SerialATA, USB3, CEI, 10GBASE-KR, 40GBASE-KR and memory interfaces.

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Agilent Technologies Releases Official SATA Revision 3.0 Test Procedures

Agilent Technologies has announced the release of test procedures for physical and protocol-layer device testing according to the Serial ATA International Organization: Serial ATA (SATA) Revision 3.0 standard. SATA, a popular internal storage interconnect for PCs, connects the host system to peripherals such as hard drives, solid-state drives, optical drives and removable magnetic media devices.

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Keithley Explores the Basics of Semiconductor C-V Testing in Free Online Seminar

Keithley Instruments will host a free 45-minute online seminar entitled "Semiconductor Capacitance-Voltage (C-V) Testing Fundamentals". The seminar will be broadcast on Thursday, 29 October, at 15:00 CET to enable engineers based in Europe to participate in the live event. The webcast is free to attend, but registration is required. For detailed seminar information and to register, visit http://www.keithley.info/cvmeasurements-webinar.

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Analytical Technology Introduces Peracetic Acid Monitor for Effective Control of Disinfection Systems

Analytical Technology Introduces Peracetic Acid Monitor for Effective Control of Disinfection Systems

Specialist electrochemical sensor manufacturer Analytical Technology Inc (ATi) announces the launch of the Q45/85 Peracetic Acid Monitor. Peracetic acid (PAA) is an extremely strong oxidiser that is employed in a wide range of industries for the disinfection of systems and equipment. Analytical Technology's new Peracetic Acid Monitor enables on-line measurement of residuals of PAA in disinfection systems. A free-of-charge product brochure can be downloaded via www.analyticaltechnology.com.

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Industrial Colour Borescopes from Alrad Imaging

Industrial Colour Borescopes from Alrad Imaging

Alrad Imaging has introduced two new industrial Colour Borescope. The STC-IC310USB-1 is a flexible USB based borescope. The flexible probe end is 1.5 meters and the unit features a self contained adjustable LED light source. This camera plugs straight into a computer via a USB port. The image is displayed on the computer screen.

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WT3000T  - Precision power analyser for transformer testing

WT3000T - Precision power analyser for transformer testing

The new Yokogawa WT3000T is a precision power analyser specifically targeted at the needs of the power transformer industry.

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10-Gigabit Ethernet Network Analyzer from Agilent Technologies

10-Gigabit Ethernet Network Analyzer from Agilent Technologies

Agilent Technologies Inc. today announced it has combined its Network Analyzer software with a new hardware interface card that enables communications service providers and network equipment manufacturers to perform real-time expert testing and troubleshooting in 10 gigabit-per-second (Gbps) Ethernet environments. Agilent is the only test and measurement vendor to have designed access hardware that provides 100-percent packet capture and analysis at 10 Gbps. The solution captures all the packets critical to diagnosing even the most difficult network problems.

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Agilent Technologies' New Channel Simulator Mode Determines Ultralow Bit-Error-Rate in Seconds

Agilent Technologies' New Channel Simulator Mode Determines Ultralow Bit-Error-Rate in Seconds

Agilent Technologies has introduced a new statistical mode for its signal integrity Channel Simulator. The mode, offered as part of Agilent's Advanced Design System (ADS) 2009 Update 1, is well suited for design and verification of high-speed, chip-to-chip data links found in most consumer and enterprise digital products produced today -- from laptop computers and data center servers, to telecommunication switching centers and Internet routers. By accelerating simulation, the new Channel Simulator mode allows manufacturers of such products to more quickly explore and arrive at an optimal design and eliminates the need for costly and time-consuming prototype iterations, dramatically improving time-to-market.

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Agilent Technologies Wins Design News' Golden Mousetrap Award for Best Product

Agilent Technologies Wins Design News' Golden Mousetrap Award for Best Product

Agilent Technologies today announced its U2700A Series USB Modular Instruments family has won Design News' 2009 Golden Mousetrap Award for Best Products. Design News has recognized engineering innovation and creativity in product design for more than two decades. This year, Golden Mousetrap Awards were given in four major categories: Electronics, Motion Control/Automation, Hardware/Software, Materials/Fastening/Joining/Assembly and 20 subcategories.

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Anritsu demonstrates a 3G LTE Virtual Network Demo

Anritsu demonstrates a 3G LTE Virtual Network Demo

A 3G LTE test system which creates a virtual 3G LTE network will be displayed in Japan this week. Anritsu will display the system at CEATEC JAPAN 2009 running until 10th October in Chiba-city.

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Agilent -  ZIF Probe Head Extended to Protocol Layer Testing and Debugging for PCI Express

Agilent - ZIF Probe Head Extended to Protocol Layer Testing and Debugging for PCI Express

Agilent has introduced a new flying leads probe for its PCI Express (PCIe) 2.0 E2960B Series analyzers, using the Zero Insertion Force (ZIF) probe head. The new ZIF flying leads probe uses the Agilent Infiniimax ZIF design, which allows designers to use the same probe points for physical layer measurements as well as protocol debugging using the protocol analyzer. This simplifies troubleshooting situations where it is unclear whether the fault lies in the physical layer or in protocol interactions. The new ZIF flying leads probe supports both 2.5 GT/s and 5.0 GT/s PCI Express data rates.

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High-performance oscilloscope family offers extensive analysis capabilities and mixed-signal models

High-performance oscilloscope family offers extensive analysis capabilities and mixed-signal models

The Yokogawa DLM6000 mixed-signal oscilloscope is the flagship product in a new family of high-performance digital oscilloscopes featuring bandwidths up to 1.5 GHz, memory of 6.25M points per channel, an intuitive graphical user interface and a number of advanced analysis features.

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Tactical Grade Mems Inertial Measurement Unit

Tactical Grade Mems Inertial Measurement Unit

Inertial Aerosystems has introduced what is claimed to be the world's first MEMS based true tactical inertial measurement unit. Designated the SD1500, it is manufactured by U.S. based Systron Donner Inertial. The exceptional performance of this product (1°/hr) is based on a new generation of SDI's proven quartz MEMS inertial sensor technology. The quartz technology enables high volume production of precisely machined sensor structures combined with the inherent large signal output and thermal stability of quartz materials.

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GSM and UMTS Acoustic Type approval tests

Hermon Laboratories TI (www.hermonlabs.com), an expert in compliance testing in telecom, today announces TCA 4100 from Hermon Laboratories TI test equipment for telecom and acoustic testing for wireless handsets (GSM and UMTS). TCA 4100 controls and measures the tests according to acoustic standards (TS 51.010-1, TS 26.131/2). All tests comply with the GCF and PTCRB approvals specifications and validated by an independent test house.

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Aeroflex Improves Test Times of RF Communications Devices

Aeroflex has announced it will deliver a non-signaling PXI solution customized for RF production line test of Infineon's second-generation ultra low-cost mobile phone platform. The solution, based on the Aeroflex PXI 3000 Series, will test Infineon's second-generation ultra low-cost chipset (X-GOLD 101).

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Agilent's Test Tool for Precision Time Protocol Enables Wireless Backhaul Synchronization

Agilent Technologies has demonstrated its new N2X IEEE 1588v2 Precision Time Protocol (PTP) test solution that enables network equipment manufacturers (NEMs) and network operators to ensure that time-critical Carrier and Industrial Ethernet applications are synchronized. Agilent will present a white paper about this technology at the event's conference.

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Agilent Technologies' Momentum Electromagnetic Simulator Qualified for High-Frequency Designs in TSMC Advanced RF Processes

Agilent Technologies has announced that it has qualified its Momentum Electromagnetic (EM) tool for Taiwan Semiconductor Manufacturing Corp.'s (TSMC's) 65-nm process as part of the TSMC EM Tool Qualification program. This program assists IC designers by providing certified process technology files, layout and measurements for 65-nm and 90-nm process technologies. Certified process files eliminate several error sources in the design process and enable designers to use a TSMC-qualified EM simulator on TSMC 65-nm processes with confidence. Today's qualification announcement demonstrates the fitness of Momentum in EM-based inductor device modeling for high-frequency and RF designs in TSMC's 65-nm process.

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Vishay Systems Crane-Weighing Solution with Life Cycle Measurement Optimizes Service and Maintenance Intervals, Is Compliant with FEM 9.755

Vishay Systems Crane-Weighing Solution with Life Cycle Measurement Optimizes Service and Maintenance Intervals, Is Compliant with FEM 9.755

Vishay Intertechnology has announced a new Vishay Nobel crane-weighing solution from Vishay Systems. It incorporates Vishay load cells and Vishay Systems state-of-the-art instrumentation for logging time, position, and weight to optimize service and maintenance intervals. It provides a cost-effective crane-weighing solution that complies with European crane standard FEM 9.755, which establishes calculation of service intervals and life-cycle measurement parameters for cranes above 1000 kg.

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Prism Sound Appoints MixRommet To Handle Test & Measurement Range In Sweden

Prism Sound Appoints MixRommet To Handle Test & Measurement Range In Sweden

Prism Sound's range of test and measurement equipment is now being represented in Sweden by MixRommet, a subsidiary of Oslo-based distributor LydRommet, which already handles Prism Sound's range in Norway.

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TRaC, Agilent Technologies Announce Comprehensive Bluetooth-Qualification Test System

TRaC and Agilent Technologies Inc. today announced the availability of TRaC's Bluetooth test system, which uses Agilent's N4010A Wireless Connectivity Test Set. The Bluetooth test system, developed by TRaC engineers in conjunction with Agilent hardware engineering, delivers a fully automated RF qualification solution to the Bluetooth Specification Test Suite Structure and Test Purpose System Specification 1.2/2.0/2.0+EDR/2.1/2.1+EDR. Additionally, support for V3.0 + HS is currently being developed by TRaC's engineers.

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30MHz digital demodulation for Aeroflex 3280A Series Spectrum Analyzers added as standard feature

30MHz digital demodulation for Aeroflex 3280A Series Spectrum Analyzers added as standard feature

Aeroflex has announced the 3280A Series spectrum analyzers with 30MHz digital demodulator and generic vector demodulation as standard features with no price increase over its predecessor, the 3280 Series. Digital demodulation in the 3280A Series spectrum analyzers allows engineers to analyse the transmitter characteristics of wireless devices. The 3280A Series includes many optional measurement suites including WiMAX, WLAN, UMTS, CDMA2000, and GSM/EDGE.

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Boundary Scan Platform  supports Test of RS232 Interfaces

Boundary Scan Platform supports Test of RS232 Interfaces

GOEPEL electronic has introduced 9305-BAC/RS232, another Bus Access Cables (BAC) as new member of the industry leading JTAG/Boundary Scan hardware platform SCANFLEX® In connection with the SCANFLEX multi port module SFX9305, new family member of Bus Access Cables enables the test of RS232 interfaces in combination with extended JTAG/Boundary Scan operations based on a unique platform.

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Anritsu Extends Frequency Range of VectorStar 4-port Solutions to Measure Passive High-Speed Balanced Transmission Lines and Connections

Anritsu Extends Frequency Range of VectorStar 4-port Solutions to Measure Passive High-Speed Balanced Transmission Lines and Connections

Anritsu Company has announced it has extended the low-end frequency of its MN469xB VectorStar 4-port test sets, making the instruments the first microwave multiport Vector Network Analyzer (VNA) solutions to measure down to 70 kHz.

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CellMetric launches 4G LTE eNodeB Test Signal Generator

Cambridge based digital cellular and broadcast company CellMetric announces the launch of a Long Term Evolution (LTE) eNodeB 4G base station test signal generator. CellMetric's Modus 6 LTE test solution is compliant with Release 8 of the Third Generation Partnership Project standard (3GPP) and supports both Time Domain Duplex (TDD) and Frequency Domain Duplex (FDD) modes. This follows the 11th December 2008 functional freeze of LTE as part of 3GPP Release 8.

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China Mobile and Motorola Use Aeroflex TM500 Test Mobile for TD-LTE Demonstrations at Telecom World 2009

China Mobile and Motorola Use Aeroflex TM500 Test Mobile for TD-LTE Demonstrations at Telecom World 2009

Aeroflex has announced that China Mobile Communications Company (CMCC) and Motorola will use Aeroflex's highly successful TM500 LTE test mobile at International Telecommunications Union's (ITU) Telecom World 2009 as part of China Mobile's TD-LTE booth demonstrations.

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National Instruments Announces More Than 8000 Drivers Available Through IDNet for Instrument Control

National Instruments has announced more than 8000 instrument drivers available through the NI Instrument Driver Network (IDNet) that make it easy to connect and control stand-alone instruments. IDNet is the industry's largest source of instrument drivers and easy-to-use software optimised for instrument control, including NI LabVIEW, LabWindowsTM/CVI and Measurement Studio for Microsoft Visual Studio. This network, which includes more than 500 new drivers added since April 2009, offers instrument drivers to connect to both NI instruments and stand-alone instruments from more than 325 vendors, including Tektronix, Agilent Technologies and Rohde & Schwarz. By using this source of instrument drivers, engineers and scientists can save time by getting their measurements faster and achieve more with their overall applications.

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Green Hills Probe Supports Intel Architecture

Green Hills Probe Supports Intel Architecture

Green Hills Software Inc. has announced that it has added support for Intel architecture to the Green Hills Probe, the fastest and smartest debug probe ever built. The Green Hills Probe supports the latest Intel architecture, including the Intel Atom™, Intel Core2 Duo, and Intel Core i7. Together with the MULTI integrated development environment (IDE), the Green Hills Probe is a versatile tool for hardware bring-up, software and firmware debugging, and product manufacturing.

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Agilent Technologies - Probes for General-Purpose Differential Signal Measurements

Agilent Technologies - Probes for General-Purpose Differential Signal Measurements

Agilent Technologies has introduced 200-MHz and 800-MHz, high-voltage differential probes. The differential probes provide superior general-purpose differential signal measurements required for today's high-speed power measurements, vehicle bus measurements and digital system designs.

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Advanced Test Equipment Rentals has the Varian VSMR15 mass spectrometer leak detector

Advanced Test Equipment Rentals has the Varian VSMR15 mass spectrometer leak detector

The state-of-the-art mass spectrometer leak detector and vacuum system by Varian provides powerful capability, enabling a broad range of test methods for specific applications, including industrial process, power generation, high energy physics, semiconductor production, small parts manufacturing and general research & development.

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CST Previews New Tool for Multi-Physics Simulation at EuMW 2009

In many branches of microwaves and RF engineering, required analysis is not confined to the electromagnetic problem, particularly when dealing with high power applications. Both the temperature rise and resulting stress have to be considered in the design process since these may have major implications for the device's performance.

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Agilent Technologies Introduces Its Highest-Resolution VME/VXS Digitizer for Defense Market

Agilent Technologies Introduces Its Highest-Resolution VME/VXS Digitizer for Defense Market

Agilent Technologies today introduced its Acqiris product line's highest-resolution VME/VXS digitizer. The SVM4800 is an eight-channel 14-bit digitizer with more than 300 MHz input signal bandwidth, achieving sampling of up to 125 MS/s. This new digitizer is ideal for applications in radar, Electronic Warfare (EW) and Synthetic Instrumentation (SI).

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Portable microscope features on-screen views

A versatile microscope with rotating lens brings advanced digital enlargement and image capture features to a hand-held format for the first time. The iLoupe XL, a second-generation model with added capabilities, is manufactured exclusively for Aven, Inc. The new product magnifies from three to 300 times and has a 5.1-megapixel, high-resolution sensor for detailed images. Six white-light LEDs with an adjustable intensity control assure clear, bright images, and the lens tube rotates 180 degrees for capturing any angle.

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Multi-channel transducer signal conditioning systems

Multi-channel transducer signal conditioning systems

Measurement specialists RDP Electronics Ltd provide a number of cost-effective signal conditioning solutions, including panel and DIN mounted options for applications using multiple transducers. Where there are a number of transducers in close proximity then a more economic and space efficient solution can usually be achieved by selecting either the RDP Modular 600 or DR7 DIN rail options, rather than using several individual devices.

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Torsional stiffness measurement systems from RDP Electronics

Torsional stiffness measurement systems from RDP Electronics

For development engineers working in automotive, aerospace and other disciplines where the measurement of torsional stiffness is essential, then measurement specialists RDP Electronics Ltd can provide a suitable system utilising standard products.

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Model P730 Universal Fanout Buffer

Model P730 Universal Fanout Buffer

Highland adds a multipurpose digital fanout buffer to its line of photonics products. As either a benchtop instrument or an OEM assembly, the P730 is compatible with CMOS, TTL, CMOS, LVDS, NECL, PECL, NIM and sine wave systems.

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National Instruments - Enhanced Sound and Vibration Software for Noise Frequency Response Analysis

National Instruments - Enhanced Sound and Vibration Software for Noise Frequency Response Analysis

National Instruments has announced the release of the NI Sound and Vibration Measurement Suite 2009, a comprehensive collection of analysis and signal processing tools for noise, vibration and harshness (NVH), machine condition monitoring and audio test applications.

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Agilent Technologies - High-Performance Signal Analyzer for Advanced RF and Microwave Applications

Agilent Technologies - High-Performance Signal Analyzer for Advanced RF and Microwave Applications

Agilent Technologies has announced the introduction of the N9030A PXA signal analyzer, the highest-performance member of the Agilent X-Series signal analyzers. The PXA provides frequency coverage up to 26.5 GHz and ensures present and future flexibility through optional measurement capabilities and hardware expandability. The analyzer also includes extensive code-compatibility features that make existing Agilent or HP high-performance signal analyzers easier to replace.

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Agilent Technologies - Low-Cost Signal Analyzers for Essential RF Measurements

Agilent Technologies - Low-Cost Signal Analyzers for Essential RF Measurements

Agilent Technologies has introduced its N9000A CXA signal analyzers, a pair of low-cost models that offer frequency coverage up to 7.5 GHz. These new analyzers provide outstanding flexibility through a variety of built-in and optional measurement capabilities that can be easily configured and reconfigured to meet present and future requirements. Target applications include general purpose electronics manufacturing, low-cost R&D, and RF education.

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Ophir-Spiricon - Sensor  Directly Measures Very High Laser Power and Power Density

Ophir-Spiricon - Sensor Directly Measures Very High Laser Power and Power Density

Ophir-Spiricon, the global leader in precision laser measurement equipment, today announced the 10KW Power/Energy Sensor, the first detector to directly measure very high powers and power densities. Designed for material processing applications, such as welding and metal cutting, the 10KW measures YAG and fiber lasers in the 1040-1100 nm range, and CO2 lasers at 10.6 microns. A wide aperture of 45 mm allows for measurement of broad beams. The maximum power for concentrated beams is up to 10KW/cm2. The maximum energy density for a 10 ms pulse is up to 150 J/cm2.

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PCLM Earth Monitoring Now With Online Support

PCLM Earth Monitoring Now With Online Support

FDB Electrical – specialists in earth monitoring equipment are increasing their support to defence contractors, design/specification engineers and electrical project engineers for their PCLM modular range by provision of a downloadable PDF datasheet available from www.fdb.uk.com. The PCLM has been designed especially for application in modular electrical systems as used by military or quasi-military organisations for temporary bases, field hospitals, mobile communications centres, forward command centres etc.

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Express Boundary-scan Controller

Express Boundary-scan Controller

JTAG Technologies, a leading provider of IEEE Std. 1149.1 solutions for testing and programming high-density PCBs, has announced a further extension to its line of high-performance boundary-scan IEEE Std. 1149.1 controllers. Known as the DataBlaster JT 37x7/PCIe, the new unit offers support for the popular PCI-express slot format found extensively in today's PCs. The PCIe bus is a high-speed serial replacement of the older parallel PCI bus.

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SELEX and GOEPEL co-operate to enable Boundary Scan and dynamic Functional Test in critical system environments

SELEX and GOEPEL co-operate to enable Boundary Scan and dynamic Functional Test in critical system environments

At the Defence Systems and Equipment International (DSEI) GOEPEL electronic, worldwide leading vendor of JTAG/Boundary Scan solutions compliant with IEEE1149.x, announced the launch of PXI 5396/FXT-x, a further series of JTAG/Boundary Scan digital I/O modules on the basis of the PXI bus. The PXI5396-FXT was developed in cooperation with SELEX Galileo and supports both the structural JTAG/Boundary Scan Test and dynamic I/O operations up to 100MHz for the execution of functional tests in critical environments.

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Aeroflex Extends LTE Measurement Capabilities to its PXI Platform

Aeroflex today announced it has added new LTE measurement capabilities to its flexible, modular PXI 3000 platform. This latest addition enables production test engineers to achieve faster time to volume for RF components and LTE user equipment. The new solution leverages itself on Aeroflex's track record in LTE testing for R&D and the proven yield and throughput benefits of the PXI 3000 Series platform in mobile handset manufacturing.

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MCL MT4100 broadband CW TWT lab amplifier newly available from Advanced Test Equipment Rentals

MCL MT4100 broadband CW TWT lab amplifier newly available from Advanced Test Equipment Rentals

The new MCL MT4100 broadband power amplifier is the latest design from the field-proven MT4000 TWT family. This high power amplifier is ideal for use in radar, EMC, and EW testing, and wherever wideband applications are required. Advanced Test Equipment Rentals offers a model covering 2.5-7.5 GHz with an output power range up to 500W typical.

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New test solutions to support development of next generation 40G/100G communications networks

Anritsu Corporation meets the demands of testing the technology for next generation communications networks as it introduces the new 56Gbit/s MUX/DEMUX modules to its MP1800 Signal Quality Analyzer.

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Spirent Participates in EANTC's Carrier Ethernet Interoperability Test Event

Spirent Communications plc today announced its participation in the industry's foremost Carrier Ethernet Interoperability Test Event conducted by EANTC. The live demonstration, showcased during Carrier Ethernet World Congress (September 21 – 23) in Berlin, featured Spirent TestCenter validating the performance and interoperability of a multi-vendor Carrier Ethernet topology focused on three key areas: managed services, mobile backhaul and global interconnect.

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Spirent Showcases New Developments in GPS/GNSS Testing at ION 2009

Spirent Communications plc today announced that it will demonstrate its new GPS modernization and multi-GNSS product range at ION GNSS 2009. For the first time ever, event attendees will have access to live demonstrations of Spirent's full range of GPS modernization and multi-GNSS simulators including the GSS8000 Multi-GNSS Simulator, GSS6700 Multi-GNSS Simulation System and GSS6300 Multi-GNSS Signal Generator.

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LPC1300 evaluation with benchmarking of performance and power consumption

LPC1300 evaluation with benchmarking of performance and power consumption

The LPC1313-Stick from Hitex is the brand new tool for evaluation of the ARM Cortex-M3 based LPC1300 controller family from NXP featuring a high level of integration and low power consumption.

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GOEPEL electronic - JTAG/Boundary Scan Platforms integrated into Polar Instruments Flying Prober GRS500

GOEPEL electronic, leading vendor of JTAG/Boundary Scan solutions compliant with IEEE Std.1149.x, and Polar Instruments recently developed a next generation JTAG/Boundary Scan option for the Flying Prober series with an OEM cooperation. The solution is based on a full integration of the hardware architectures ScanBooster and SCANFLEX in combination with the JTAG/Boundary Scan system software CASCON GALAXY and also involves the probe of the Polar GRS500.

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DSPCon Launches New Web Site

Coinciding with the release of its' newest data recorder, the DataFlex-515, earlier this year, DSPCon, Inc., a leading, global supplier of dynamic data acquisition, analysis, archiving and recording solutions for high-value military and aerospace applications, has revamped its web site, www.dspcon.com.

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Keithley - RF Vector Signal Generator provides Industry’s best Combination of high Throughput and low Phase Noise

Keithley - RF Vector Signal Generator provides Industry’s best Combination of high Throughput and low Phase Noise

Keithley Instruments has upgraded its popular RF Vector Signal Generator line for RF engineers with new capabilities that reduce signal generation times and enhance signal quality. In contrast with competitive signal generators, which typically force users to choose between best signal quality and maximum test throughput, the Model 2920A's no-compromise design combines both capabilities in the same instrument.

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Agilent Unveils Solutions for Microwave, RF, Wireless, Radar Test at 2009 European Microwave Conference

Agilent Technologies has announced it will show its newest test and measurement solutions in microwave, RF, wireless and radar for telecommunications, transportation and medical markets at the 2009 European Microwave Conference, Sept. 28- Oct. 2, in Rome, Italy. Agilent's booth is at the Nuova Fiera di Roma, Hall 9, stand no. 539. Featuring industry-leading performance and functionality, Agilent's test solutions enable R&D, design and manufacturing engineers, maintenance and service providers to develop and deliver innovative products in these competitive markets.

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Agilent Adds Real-Time Signal Peak Detection and Analysis to 4G/s High-Speed PCIe Digitizer

Agilent Technologies has announced the availability of a Signal Peak Detection firmware-processing option for its recently introduced PCI Express (PCIe) high-speed digitizer with on-board FPGA. The peak detection and analysis firmware allows real-time acquisition and peak-detection up to 4GS/s. Agilent's high-speed data converter platform provides higher sampling rates, faster measurement throughput and even more flexibility to OEMs and many test and measurement engineers, while maintaining precision and cost effectiveness.

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Agilent Technologies, Life Technologies Co-Market Target-Enrichment System for Next-Generation Sequencing

Agilent Technologies Inc. and Applied Biosystems, part of Life Technologies Corp., today introduced the Agilent SureSelect Target Enrichment System, which is optimized for the SOLiD(tm) System, a next-generation advanced genomic analysis sequencing platform. As part of the agreement, the companies are co-marketing the SureSelect system, which is a unique research tool for efficiently re-sequencing specific regions of interest in the genome. The tool saves researchers tremendous amounts of time and expense, often enabling them to conduct studies that would otherwise not be feasible.

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Agilent Technologies Adds Human Exon Kit to Next-Generation-Sequencing Target Enrichment Portfolio

Agilent Technologies has chosen the Cambridge Health Institute's Next-Generation Sequencing Analysis conference today to introduce its SureSelect Human All Exon Kit for target enrichment prior to next-generation DNA sequencing.

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OTDR for passive optical network  testing

OTDR for passive optical network testing

The new Yokogawa AQ7275 PON-OTDR is a passive optical network (PON) version of Yokogawa's highly successful AQ7275 portable optical time-domain reflectometer (OTDR).

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Aeroflex extends LTE measurement capabilities to its PXI platform

Aeroflex extends LTE measurement capabilities to its PXI platform

Aeroflex has announced it has added new LTE measurement capabilities to its flexible, modular PXI 3000 platform. This latest addition enables production test engineers to achieve faster time-to-volume for RF components and LTE user equipment. The new solution leverages itself on Aeroflex's track record in LTE testing for R&D and the proven yield and throughput benefits of the PXI 3000 Series platform in mobile handset manufacturing.

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GL Announces Simplified VoIP Testing

GL Communications has announced the release of VoIP Testing Solution with VQuad- an easy, automated, or manual means to testing end to end VoIP performance. Speaking to media persons, Mr. Robert Bichefsky, senior manager said, Testing at the end-points of a VoIP network is a true reflection of the voice quality that an end user is actually experiencing.

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dScope Series III is adopted by Harman/Becker as its standard audio analyzer

dScope Series III is adopted by Harman/Becker as its standard audio analyzer

Prism Sound's dScope Series III has been adopted by Harman/Becker Automotive Systems as its new standard audio analyzer for all production testing at its factories in Europe, North America and China. As part of Harman International, Harman/Becker Automotive Systems designs and produces complete state-of-the-art infotainment systems and is a world leader in branded automotive audio systems, which combine world-class acoustics with high-value brand names.

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HiFi manufacturer Tangent stakes its reputation on Prism Sound audio test equipment

HiFi manufacturer Tangent stakes its reputation on Prism Sound audio test equipment

Danish HiFi manufacturer Tangent has chosen Prism Sound's dScope Series III audio analyser as its test solution because it is not only powerful and accurate but also very portable and versatile. Tangent, originally established in the 1970s in the UK by a group of dedicated HiFi enthusiasts, re-launched the brand in 2005 as a Danish company. Tangent designs and engineers everything in Denmark and has a reputation for innovative design and for producing consistently high quality products that are highly recommended by reviewers. Its range includes loudspeakers, table radios, sub woofers, mini HiFi systems, HiFi separates and accessories.

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NSG 5500 automotive transient immunity tests now available from Advanced Test Equipment Rentals

NSG 5500 automotive transient immunity tests now available from Advanced Test Equipment Rentals

The compact and modular NSG 5500 system offers the generators necessary for tests with capacitive discharge pulsed interference as called for by ISO, SAE, DIN and JASO and others. The established test specifications for passenger cars together with standards for commercial vehicles are fully covered, as are the most company-specific standards from vehicle manufacturers.

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National Instruments - NI TestStand ATML Toolkit for Automated Test Application Development

National Instruments today announced the NI TestStand ATML Toolkit to help engineers reduce development and maintenance time by expanding test system component interoperability and increasing test system documentation. The Automatic Test Markup Language (ATML) is an IEEE standard consisting of XML document formats that describe different aspects of a test system.

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Anritsu - Full Suite of LTE Base Station Measurements for Handheld Analyzers

Anritsu - Full Suite of LTE Base Station Measurements for Handheld Analyzers

Anritsu has introduced a comprehensive LTE base station measurement suite that allows field engineers and technicians to conduct tests necessary for the proper deployment, installation, and operation of LTE networks. The measurement suite is a set of optional measurement capabilities for Anritsu's industry leading MS272xB Spectrum Master, and MT8222A and MT8221B BTS Master handheld analyzers that includes tests for RF signal parameters, modulation quality, and Over-the-Air (OTA) scanning.

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Anritsu Enhances DVB-T/H Digital Video Measurement Capability in Handheld Analyzers

Anritsu Enhances DVB-T/H Digital Video Measurement Capability in Handheld Analyzers

Anritsu has announced enhanced DVB-T/H measurement capability for its industry leading MT8222A BTS Master and MS2721B Spectrum Master handheld products. The enhancements build off the measurement capability of the first version of DVB-T/H measurement capability by offering a more intuitive and streamlined graphical user interface (GUI), a minimum 40% measurement speed improvement and better compatibility of stored measured data.

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Semi-Volatile Organic Compound Analyzer Designed for Easy Startup, Higher Throughput of Environmental Samples

Agilent Technologies has introduced the Semi-Volatile Organic Compound (SVoC) Analyzer, a complete, preconfigured tool for detecting and measuring SVoC in water and soil samples. Several new technologies are dramatically improving throughput for analyzing semi-volatiles in streams, lakes, wastewater and soil, said Denise Ibens, Agilent solutions business development manager. We've developed this new SVoC Analyzer to help labs access this new technology easily and quickly. The concept is to help labs reduce the cost of implementing new technologies, increase confidence in initial results, and reduce time to technical mastery.

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Agilent Technologies - Accurate Transceiver Characterization Solution for 16x Fibre Channel

Agilent Technologies - Accurate Transceiver Characterization Solution for 16x Fibre Channel

Agilent Technologies has announced the expansion of its J-BERT N4903B high-performance serial BERT for 16x Fibre Channel transceiver testing. Design and test engineers in communications, storage and computing, and consumer industries can now accurately characterize and test interoperability of next-generation serial interfaces operating between 150 Mb/s and 14.2 Gb/s. Agilent will demonstrate the J-BERT and the new 14G option at ECOC 2009, Sept. 21-23, in Vienna, Austria, Booth No. 666.

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Agilent Technologies - High-Density Integrated Optical Multichannel Attenuators, Power Meters

Agilent Technologies - High-Density Integrated Optical Multichannel Attenuators, Power Meters

Agilent Technologies has announced the addition of five new integrated optical multichannel attenuators and power meters to its high-density 77xx-family. The instruments are designed for testing optical transceiver modules and their subcomponents and for optical network integration tests. Agilent will demonstrate this new class of high-density, faceless optical instruments at ECOC 2009 Vienna, Austria, booth 666, Sept. 21-23.

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Agilent Technologies Adds Bit Error Ratio Analysis Capabilities to Optical Modulation Analyzer

Agilent Technologies has announced it has added bit error ratio (BER) capabilities to its optical modulation analyzer. Agilent will demonstrate the new BER test feature on a polarization multiplexed signal at ECOC 2009 Vienna, Austria, booth 666, Sept. 21-23.

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Agilent Opens Digital Test Centre for Computer, Consumer-Electronics Manufacturers

Agilent Technologies has announced the opening of its Digital Test Center at the company's headquarters. The center allows customers to learn about the technologies and challenges of digital test and conduct on-site testing of their devices to meet the digital interfacing standards of today and tomorrow.

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Agilent Technologies Broadens SAS, SATA Test Portfolio through Partnership with SerialTek

Agilent and SerialTek today announced that Agilent has become the exclusive worldwide distribution channel for all SerialTek products. This expands Agilent's test solution portfolio for Serial Attached SCSI (SAS) and Serial ATA (SATA). The portfolio now includes SerialTek's line of BusXpert SAS/SATA protocol analyzers covering link speeds from 1.5 Gb/s to the new 6 Gb/s specifications.

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Aeroflex wins $40.5 million U.S. Marine Corps contract for radio test systems; Announces new Configurable Automated Test Set platform

Aeroflex wins $40.5 million U.S. Marine Corps contract for radio test systems; Announces new Configurable Automated Test Set platform

The U.S. Department of Defense announced late last month that Aeroflex won a five-year, $40.5 million contract with the U.S. Marine Corps to supply Ground Radio Maintenance Automatic Test Systems (GRMATS). For this contract Aeroflex will supply its newly developed test platform, the 7200 Configurable Automated Test Set (CATS). The 7200 is a commercial off-the-shelf (COTS) platform for testing software-defined radios, including military tactical radios and other high technology devices.

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Keithley to Show Award-Winning Innovations in RF/Wireless Test at EuMW

Keithley to Show Award-Winning Innovations in RF/Wireless Test at EuMW

Keithley Instruments will be showcasing its expertise in RF/Wireless test at European Microwave Week (EuMW), Stand #327C. EuMW takes place in Rome, Italy, from September 28 – October 1, 2009.

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ADLINK Technology Expands High-Resolution Digitizer Product Line

ADLINK Technology Expands High-Resolution Digitizer Product Line

ADLINK Technology has announced the release of an expansion to its digitizer product line with the introduction of three new PCI digitizers, the PCI-98x6 series. The PCI-9816, PCI-9826 and PCI-9846 4-channel, 16-bit high-resolution digitizers offer sampling rates of 10 MS/s, 20 MS/s, and 40 MS/s respectively, complete the ADLINK 98x6 family of digitizers, following the introduction of the their PXI-based PXI-98x6 digitizers in February.

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Compact LeCroy bench oscilloscopes from Alpha Electronics

Compact LeCroy bench oscilloscopes from Alpha Electronics

Alpha Electronics, nationwide distributor of handheld and portable electrical and electronic test equipment, offers a range of LeCroy digital oscilloscopes direct from stock. Designed for bench use, but compact and readily portable, the LeCroy oscilloscopes are available in models ranging from entry-level to high-end, with very clear, bright colour screens and excellent long-term memories. Alpha Electronics has the technically qualified personnel to provide advice to its customers on the best product for their needs.

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TMD to  highlight TWT amplifiers at EMCUK exhibition

TMD to highlight TWT amplifiers at EMCUK exhibition

TMD Technologies will be highlighting its range of TWT amplifiers for EMC applications at the EMCUK exhibition and conference in October this year. These compact, lightweight, broadband products, made in the UK, benefit from TMD's leading expertise in high power military radar amplifiers.

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Tektronix Delivers Network Monitoring Solutions to Ensure Superior Video Quality of Service

Tektronix Delivers Network Monitoring Solutions to Ensure Superior Video Quality of Service

Tektronix has announced the new VQNet Video Service Assurance Manager and IPM400A network probe, designed to help cable, telco and broadcast operators to proactively detect and resolve customer impacting problems across their IP networks. Tektronix also announced a DVB-S2 interface for its MTM400A Transport Stream Monitor.

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Bizerba decides for JTAG/Boundary Scan Platform SCANFLEX for Integration into Agilent In-Circuit Tester

GOEPEL electronic has been selected by Bizerba to provide a SCANFLEX Boundary Scan option for the Agilent 3070 In-Circuit Tester (ICT). The integration solution is based on the PCI Boundary Scan controller SFX/PCI1149-B combined with the specific SCANFLEX TAP Transceiver SFX-TAP4/3070-PIC, enabling the execution of complex Boundary Scan tests, high-speed in-system programming (ISP) of MCU and Flash components, VarioTAP emulations tests as well as PLD programming controlled by the ICT.

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Webinar Explores MIMO Channel Sounding in RF Testing Using Channel Emulation

Keithley Instruments will broadcast a free webinar titled "Understanding MIMO Channel Sounding" on Thursday, September 24, 2009. This one-hour web-based seminar will introduce the topic of MIMO channel sounding as it relates to characterizing a real-world MIMO wireless channel, which can be used in RF testing of a device by applying channel emulation. To register for this event, visit http://event.on24.com/r.htm?e=161538&s=1&k=36EA7DA283CEA8332DE1D73E097C5B19

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Spirent Introduces New 40/100G Ethernet Test System

Spirent Introduces New 40/100G Ethernet Test System

Spirent Communications plc, the global provider of network, services and device testing solutions, today introduced the Spirent TestCenter HyperMetrics 40/100 Gigabit Ethernet test module. Designed to test the performance and scalability of 40/100G Ethernet systems and services, the new module goes beyond test port density to focus on application realism, accuracy and performance per port, reducing operational expenses and total cost of ownership (TCO).

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Spirent Claims First 10G Ethernet Service Assurance Solution

Spirent Claims First 10G Ethernet Service Assurance Solution

In an effort to not only help carriers pre-qualify new 10 Gigabit Ethernet services but also ensure their networks perform reliably once launched, Spirent Communications plc, today introduced, Spirent QoS Scope 7500, the industry's first 10G Ethernet service assurance solution for testing service performance in live networks. Already deployed by three of the largest service providers in the United States, the QoS Scope validates the performance of complex 10G and 1G Ethernet services such as business Ethernet and wireless backhaul.

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Spirent Introduces Local Loop and FTTN Test Modules on Tech-X Flex

Spirent Communications plc has announced the addition of copper and DSL modules for its market leading Spirent Tech-X Flex. The new wideband copper and ADSL / VDSL2 modules extend the reach of Spirent Tech-X Flex to the last mile providing a solution that enables service providers to confidently roll out new services with fewer quality issues and complaints.

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Agilent's Handheld Network Monitor Enables Quick Network Verification, Complements Leading Drive Test Platform

Agilent has introduced a handheld network monitor that complements Agilent's proven drive test platform and significantly expedites wireless network verification. The tool enables test engineers to quickly determine whether a network is working, which base stations are transmitting, and the base-station configuration. It also allows users to take other operational measurements that do not require the laptop, phones and measurement receivers associated with Agilent's more comprehensive solution. If the new monitor detects operational issues, the information can then be transferred to Agilent's comprehensive drive test tool for complete analysis and troubleshooting.

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Yokogawa to feature latest generation of optical test instruments at ECOC 2009

At ECOC 2009, Yokogawa Europe is featuring its range of test & measurement instruments for the optical communications sector, including a number of new developments. The rapid spread of high-speed optical networks has caused a dramatic increase in network traffic, resulting in 10 Gbit/s transmissions being used in metro and access networks as well as backbone networks. This growth has led to increased demands on manufacturers of communications equipment and devices, who need efficient and cost-effective test systems to boost their productivity and minimise costs.

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Stereo Microscope with Inbuilt Camera

Stereo Microscope with Inbuilt Camera

Mantis – an award winning stereo microscope from Vision Engineering is now available with a built-in, high resolution camera. The integration of a high performance camera will provide users with the advantage of effortlessly capturing images for reporting, cataloguing and communicating with colleagues and customers.

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GOEPEL electronics to run Webinars on JTAG/Boundary Scan in October

GOEPEL electronics, vendor of JTAG/Boundary Scan solutions compliant with IEEE Std.1149.x, will run free Webinars on the four Tuesdays in October 2009. The company, based in Austin, TX, will present information on topics such as the basics of JTAG/Boundary Scan and Design for Test (DfT) for Boundary Scan. Furthermore, there will be presentations discussing basic and advanced JTAG/Boundary Scan applications.

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Agilent Technologies to Demonstrate Comprehensive Lineup of Test Solutions at 4G World 2009

Agilent has announced it will show its comprehensive set of 4G test solutions for LTE, WiMAX, WLAN, HSPA, femtocell and MIMO at 4G World, McCormick Place, Chicago, Ill., Sept. 16-17 in Room W-175B. The company will demonstrate a full complement of test solutions for R&D, design verification, manufacturing, protocol conformance and interoperability test, as well as network deployment and maintenance/service quality.

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Tektronix - High-Performance 3Gb/s SDI Waveform Monitors

Tektronix - High-Performance 3Gb/s SDI Waveform Monitors

Tektronix has introduced the WFM8200 and WFM8300 advanced waveform monitors, the latest additions to the popular Tektronix waveform monitor lineup. The new high-performance instruments provide high quality, real-time, automated 3Gb/s SDI Eye pattern display and jitter measurements that help broadcasters and network operators effectively diagnose signal problems and help equipment designers and manufacturers reduce time to market of new 3Gb/s SDI products.

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LeCroy - Single-Source Comprehensive SuperSpeed USB Test Suite

LeCroy - Single-Source Comprehensive SuperSpeed USB Test Suite

LeCroy has announced the launch of a single-source lineup of test instruments to comprehensively support the USB (Universal Serial Bus) 3.0 standard, also known as SuperSpeed USB. The LeCroy USB 3.0 Test Suite is an integrated selection of test instruments that addresses all transmitter, receiver, TDR and protocol tests currently defined in the Universal Serial Bus 3.0 specification.

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Anritsu - LTE Device and Testing

Anritsu - LTE Device and Testing

In July, Anritsu and a leading device manufacturer in South Korea successfully demonstrated end-to-end LTE calls over an air interface. Over the last few months a number of mobile network operators have declared intent to roll-out LTE networks, starting from 2010. A frequently quoted barrier to this has been the availability of suitable devices and test equipment, but now there is good reason to be optimistic.

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Agilent Technologies Equipment Used to Test First Mobile WiMAX Forum-Certified Products in China Lab

Agilent has announced that the China Academy of Telecommunication Research (CATR), a division of the Ministry of Industry and Information Technology and a WiMAX Forum Designated Certification Laboratory (WFDCL), has successfully used Agilent's N6430A Series Mobile WiMAX Protocol Conformance Test system to complete the first test of Mobile WiMAX products in mainland China. The test was conducted in June.

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Keithley Expands Range of DC Source-Measure Instruments Compatible with ACS Basic Edition Software

Keithley Instruments has enhanced its popular ACS Basic Edition software, adding support for a broader line of source-measure (SMU) instrumentation. This broader choice of compatible instruments should prove especially useful in expanding the software's voltage and current limits available for testing solar cells, photovoltaic panels, and discrete power semiconductors. ACS Basic Edition combines high speed hardware control, device connectivity, and data management into an easy-to-use tool optimized for part verification, debugging, and analysis.

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Anritsu Redefines Wireless Field Test with Introduction of ‘E’ Platform for Handheld Analyzer Family

Anritsu continues its leadership position in the wireless field test market with the introduction of an innovative new platform for its family of handheld analyzers, which is the de facto industry standard for field test instrumentation. The new platform features integrated functionality in a robust, lightweight, field-proven design that provides field personnel with all the tools necessary to deploy, maintain, and troubleshoot today's most demanding wireless equipment and networks.

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Spirent and AT4 wireless Collaborate on LTE Device Testing

As the wireless industry prepares for the launch of LTE networks, Spirent Communications plc, the leader in wireless network, services and devices testing, today announced the Spirent LTE Network Emulator. The result of a collaborative engagement with AT4 wireless, a wireless testing services and test solutions company, the new LTE Network Emulator plays a key role in Spirent's performance test solutions for next-generation mobile devices.

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China Telecom Selects Spirent for Mobile Phone Testing

Spirent Communications plc has announced that China Telecom has selected the Spirent C2K-ATS system to test mobile phones before they are offered to its subscribers. China Telecom will use the Spirent test system for parametric radio testing, signaling conformance testing, data performance testing and location-based services (LBS) testing.

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Aeroflex Digital Radio Test Set now supports the widest range of available analog and digital radio technologies worldwide

Aeroflex has announced new software version 1.7.6.2 for the Aeroflex 3900 Series Digital Radio Test Set. Included in this release are a number of enhancements and support for the rapidly expanding digital land mobile radio test market across the globe.

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RGB Networks Utilizes Tektronix Equipment to Optimize Next Generation Video Processing Solutions

RGB Networks Utilizes Tektronix Equipment to Optimize Next Generation Video Processing Solutions

Tektronix has announced that RGB Networks, the leader in network video processing, is implementing a full suite of Tektronix video test equipment to ensure compliance verification, dependable interoperability and the overall high video quality expected from its next generation of video processing solutions. The ensemble of Tektronix instruments includes the following: PQA500 Picture Quality Analyzer, MTS430 MPEG Test System, MTM400A MPEG Monitor, VCLIPS Video Test Clips, MTS4EA Elementary Stream Analyzer and WFM7120 Waveform Monitor.

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Agilent and FuturePlus Introduce  DDR3 1866 Memory Bus Debug Solution

Agilent and FuturePlus Introduce DDR3 1866 Memory Bus Debug Solution

Agilent Technologies Inc. and FuturePlus Systems Corp. today introduced a DDR3 1866 DIMM interposer test solution, which is comprised of the Agilent 16962A logic analyzer module and the FS2352 interposer for next-generation double-data-rate (DDR) SDRAM buses. The new DDR3 1866 DIMM interposer probing solution is the ideal tool for designers performing DIMM validation, failure analysis, and bus functional-parametric validation in servers, supercomputing, desktops and computing applications.

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National Instruments Introduces NI VeriStand 2009 Real-Time Testing and Simulation Software

National Instruments Introduces NI VeriStand 2009 Real-Time Testing and Simulation Software

National Instruments today announced NI VeriStand 2009, an open, configuration-based software environment for creating real-time testing applications such as hardware-in-the-loop (HIL) and controlled environmental tests. All of the common functionalities of a real-time test system are implemented and optimized inside NI VeriStand in a ready-to-use format, making it possible for real-time test system developers to complete their test application development more efficiently.

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Spirent GSS6300 Completes Spirent's Multi-GNSS Portfolio

Spirent Communications today announced the launch of the Spirent GSS6300 Multi-GNSS Signal Generator. The GSS6300 is an addition to Spirent's Multi-GNSS product portfolio, joining the recently launched GSS6700 Multi-GNSS Simulation System and the GSS8000 Multi-GNSS Constellation Simulator. This product portfolio provides comprehensive GPS, GLONASS, Galileo, and SBAS test solutions from high-end R&D through integration and production applications.

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Spirent Test H3C's 40/100 GigE Data Center Core Switch Platform

Spirent Communications today announced that H3C selected its award-winning Spirent TestCenter platform to evaluate the performance of the H3C S12500 family of data center switches. Spirent TestCenter was selected specifically to test forwarding performance of the high-port-density S12500 platform. The S12500 is the first data center class core switch based on a 100 Gigabit Ethernet (GigE) platform and supports 40 GigE, 100 GigE and Fibre Channel over Ethernet (FCoE) links, meeting the ever-increasing performance requirements of modern data centers.

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Double-sided in-line THT Inspection

GOEPEL electronic's OptiCon TurboLine is the first system that can efficiently be utilised for Automated Optical Inspection for in-line THT manufacturing. The system allows the inspection of the component side with up to 85cm placement height. It can applied before and after the soldering process, in particular for the inspection of power assemblies, e.g. for checking polarity and electrolytic capacitors.

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National Instruments Introduces Wireless Sensor Network Platform

National Instruments Introduces Wireless Sensor Network Platform

National Instruments has announced the NI wireless sensor network (WSN) platform, a complete remote monitoring solution that consists of NI LabVIEW graphical programming software and new reliable, low-power wireless measurement nodes. The adoption of wireless technology for remote monitoring applications is growing, yet engineers and scientists struggle to find an integrated solution that can provide the required measurement quality, power management and reliable hardware for long-term, remote deployments.

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Agilent Enhances One-Box Communication Tester with cdma2000 PESQ Audio Measurement

Agilent Enhances One-Box Communication Tester with cdma2000 PESQ Audio Measurement

Agilent Technologies has introduced cdma200 perceptual evaluation of speech quality (PESQ) measurement functionality for its 8960 wireless communications test set. This capability helps wireless engineers enhance the end-user experience by providing an objective measurement of audio quality in digitally vocoded voice.

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National Instruments and Tektronix Develop Industry’s Fastest PXI Digitizer

National Instruments has announced the joint development of a high-speed digitizer with Tektronix, a leading provider of test, measurement and monitoring instrumentation. The PXI Express digitizer sets a new milestone for PXI modular instrumentation performance, with greater than 3 GHz bandwidth, sample rates beyond 10 GS/s, data throughput of more than 600 MB/s and multi-module synchronization capabilities. Because of this collaborative development effort, engineers and scientists will experience a new level of measurement performance and test productivity in demanding high-speed applications such as those found in physics and experimental research, aerospace and defense, communications, semiconductor and consumer electronics industries.

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National Instruments Introduces PCI Express-Based Multifunction I/O for LabVIEW FPGA

National Instruments Introduces PCI Express-Based Multifunction I/O for LabVIEW FPGA

National Instruments has announced four new R Series multifunction RIO boards for PCI Express that give engineers and scientists the benefits of field-programmable gate array (FPGA) technology in a widely adopted form factor. The boards deliver exceptional performance and value by combining a Xilinx Virtex-5 FPGA, eight analog inputs, eight analog outputs and 96 digital I/O lines on a single board. Using the NI LabVIEW FPGA Module, engineers and scientists can program the onboard FPGA to create custom measurement hardware for custom data acquisition, high-speed control, digital communications protocols, sensor simulation, hardware-in-the-loop and signal processing applications.

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National Instruments and TSSI Collaborate to Support WGL and STIL Semiconductor Vector Formats

National Instruments has announced its collaboration with Test System Strategies, Inc. (TSSI), inventor of the Waveform Generation Language (WGL), on a new software tool that is compatible with NI LabVIEW graphical system design software. This software tool makes it possible for semiconductor test engineers to import WGL and IEEE 1450 Standard Test Interface Language (STIL) simulation vectors into NI PXI digital test systems, a task which previously required custom software development. Evaluation versions of the new TSSI TD-Scan for National Instruments software will be available by request from National Instruments while the full version can be purchased from TSSI.

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Curve-tracer software for semiconductor testing

Curve-tracer software for semiconductor testing

A new version of Yokogawa's curve-tracer software for semiconductor testing has been introduced for the company's GS610 source measure unit. Designed to carry out voltage/current analysis on two-lead or three-lead components including discrete semiconductors, integrated circuits and optoelectronic components, the new PC-based software works in conjunction with the USB-connected GS610 to enable source and sink operations at up to 100 V at 0.5 A or 12 V at 3.2 A. A single GS610 is required for two-lead components and two units are needed for three-lead components.

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Frost & Sullivan Recognizes Spirent's Ethernet Testing Market Leadership

Spirent Communications plc has been recognized as the market leader for Ethernet testing by Frost & Sullivan according to the World Gigabit Ethernet Test Equipment Market report. Spirent sold more Ethernet test ports than any other vendor through its comprehensive solution portfolio that spans testing from the lab to the live network and into the subscriber's home.

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Great Demand for Hitex Expertise: Insider's Guides

Great Demand for Hitex Expertise: Insider's Guides

Some years ago Hitex published the first Insider's Guide as an Engineer's Introduction to the C166 Family. It was the beginning of a success story: Thousands of engineers all around the world could benefit from the useful information given in printed form or pdf format.

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Configuration Replaces Multiple Instrument Alternatives to Reduce Cost and time of Test, and Lower Setup Costs

Configuration Replaces Multiple Instrument Alternatives to Reduce Cost and time of Test, and Lower Setup Costs

Anritsu Company introduces the MU150110A multi-rate/multi-channel unit for its MP1590B Network Performance Tester. The plug-in unit creates a single-instrument 10G transport test solution with the MP1590B mainframe and allows the tester to accurately evaluate the performance of SDH/SONET, OTN, and PDH/DSn equipment from 1.5M to 11.1G, as well as 10GbE interfaces during development and manufacturing.

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Dedicated Bluetooth Audio Test Set Introduced by Anritsu Company

Dedicated Bluetooth Audio Test Set Introduced by Anritsu Company

Anritsu Company introduces the MT8855A, the world's first integrated test set capable of measuring the new generation of products using the Bluetooth Advanced Audio Distribution Profile (A2DP), headset profile, and hands-free profile. Providing frequency coverage of 20 Hz to 20 kHz, the MT8855A offers lower cost-of-test, significantly reduced development time, and greater confidence in the quality of products shipped compared to alternative multi-instrument test systems consisting of Bluetooth controllers, generators and analyzers.

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Agilent Technologies Introduces High-Speed PCIe Digitizer with Real-Time Data Processing for OEM Applications

Agilent Technologies Introduces High-Speed PCIe Digitizer with Real-Time Data Processing for OEM Applications

Agilent Technologies Inc. today introduced its new PCI Express(r) (PCIe) high-speed data acquisition card with on-board field programmable gate array (FPGA) for real-time data processing. This new platform provides higher sampling rates, faster measurement throughput and even more flexibility to OEMs and many test and measurement engineers, while maintaining precision and cost effectiveness.

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Agilent Technologies' Test Solutions Support March 2009 LTE Standard

Agilent Technologies Inc. today announced its compliance with the March 2009 release of the 3GPP Long Term Evolution (LTE) standard. Agilent's compliance enables broader test capability for LTE TDD, LTE FDD and MIMO.

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Underwriters Laboratories Expands Global Photovoltaic Footprint To China

Underwriters Laboratories announced today the expansion of its global photovoltaic testing services to Suzhou, China, where it will open a Photovoltaic Technology Center of Excellence. The new facility, set to open on February 26, 2009, will be the largest photovoltaic testing laboratory in Greater China and have the capability to test to both UL and International Electrotechnical Commission (IEC) Standards. This announcement marks yet another step in UL's ongoing commitment to the development of safe renewable energy equipment.

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Spirent Communications Redefines Test Lab Automation

Spirent Communications plc, a leader in network, services and device testing, today announced the introduction of a broad set of tools designed to automate the testing process and save engineers and their organizations time and money. Spirent NoCode™ delivers the industry's first and only complete set of integrated end-to-end automation solutions covering the entire breadth of test automation requirements through a portfolio of offerings that fit a wide variety of needs and enable users to introduce higher quality products and services more quickly and at a significantly lower cost.

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Trend Communications announces the availability of a new version of the Multipro Copper with a 6 MHz frequency range

Trend Communications announces the availability of a new version of the Multipro Copper with a 6 MHz frequency range

The Multipro Copper 6MHz is Trend Communications answer to the need for a highly affordable fully featured ADSL2+ Copper test solution. While most ADSL2+ test solutions will allow testing up to 2.2MHz, the Multipro Copper 6MHz supports testing beyond this up to 6MHz. An ADSL2+ system will attempt to operate over a spectrum 2.2MHz wide, most testers will only test across this frequency range, however there are can be powerful sources of noise at higher frequencies which can have an impact on the performance of the ADSL2+ installation.

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Agilent Technologies Introduces One-Box-Tester for 1xEV-DO eHRPD Protocol Stack

Agilent has announced support for 1xEV-DO enhanced high-rate packet data (eHRPD) in Agilent 8960 wireless communication test sets running the Agilent E6706C lab application software. This one-box solution, a first in the industry, will help engineers test and verify the interaction of new eHRPD designs with existing 1xEV-DO and future LTE designs.

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Agilent Technologies Claims Industry-First TD-LTE Receiver Measurements Drive Test System

Agilent Technologies has announced TD- LTE Receiver Measurements as a software upgrade to its proven Agilent E6474A Drive Test Network Optimization Platform. Network equipment manufacturers and wireless service providers can use the software on Agilent W1314A receivers to quickly verify base-station RF coverage, plot accurate coverage maps and validate planning in the early development of LTE networks. This new option builds on the existing FDD-LTE measurements in the Agilent solution to provide both FDD-LTE and TD-LTE measurements on a single measurement platform.

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GOPEL Combines JTAG/Boundary Scan and Optical Inspection

GOPEL Combines JTAG/Boundary Scan and Optical Inspection

GOPEL electronic is offering a cost-effective hybrid JTAG/Boundary Scan and optical test system. Simple optical inspection tasks of LEDs, displays or OCR are executed by the TOM (Teachable Optical Measurement) system whilst Boundary Scan controls the board. That means users are provided with a one-stop shop of electric and optical testing, both developed and produced by GOEPEL electronic.

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Vero Technologies - Terminal pins can save money during manufacture and test

Vero Technologies - Terminal pins can save money during manufacture and test

The range of terminal pins available from Vero Technologies provide an easily useable fitting on a PTH PCB for the attachment of oscilloscope probes, multimeter leads and test equipment, saving time and money during the manufacture and test process.

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TD-LTE hand-off milestone for Aeroflex’s TM500 test mobile in mobility field trials

TD-LTE hand-off milestone for Aeroflex’s TM500 test mobile in mobility field trials

Aeroflex has announced a significant new milestone for its TM500 TD-LTE test mobile, successfully achieving hand-off between multiple TD-LTE basestations during mobility field trials with a number of network infrastructure equipment vendors.

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Aeroflex - Modular test platform expands 2G and 3G wireless testing capabilities

Aeroflex - Modular test platform expands 2G and 3G wireless testing capabilities

Aeroflex has announced the addition of new communications standards to its PXI 3000 Series modular test platform, now enabling communications test engineers to address a variety of 2G and 3G wireless data standards with a single, flexible, software-defined system. With the addition of the new Bluetooth measurement suite along with the new WLAN and CDMA2000/1xEVDO plug-ins for the PXI Studio software application as well as significant upgrades to the WiMAX, UMTS and GSM/EDGE measurement suites, the PXI 3000 Series is one of the most versatile and far-reaching communications test applications available.

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Agilent Technologies Launches HYCOR Ultra-Sensitive EIA System for Allergy Testing

Agilent has announced the availability of the HYCOR Ultra-Sensitive EIA System for allergen-specific IgE. The HYCOR Ultra-Sensitive EIA System is FDA-cleared for quantitative determination of specific IgE. Using a unique assay design, the system provides quantitative specific IgE detection with testing capacity sized for moderate to higher-volume labs. Based on proven technology, the system combines quantitative accuracy, precision and sensitivity with fully automated robotics to deliver a new level of performance and productivity, and has been designed to offer laboratories an overall cost-per-test advantage over alternative methods.

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Aeroflex - Multi-handset capability for the TM500 TD-LTE test mobile

Aeroflex - Multi-handset capability for the TM500 TD-LTE test mobile

Aeroflex has announced the TM500 TD-LTE Multi-UE, adding a multiple handset (multi-UE) capability to its market-leading test mobile range supporting TD-LTE infrastructure development. The TM500 TD-LTE Multi-UE enables TD-LTE infrastructure equipment vendors to test the performance of their TD-LTE basestations (e-NodeBs) under loaded conditions, accelerating the pace of infrastructure equipment development programmes. At the same time, Aeroflex has announced that it has already won a series of sales contracts for the TM500 TD-LTE Multi-UE.

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Yokogawa - LXI compliant Ethernet interface for oscilloscopes

Yokogawa - LXI compliant Ethernet interface for oscilloscopes

LXI compliant Ethernet options are now available for the Yokogawa DL9000 Series of digital and mixed-signal oscilloscopes and the SB5000 vehicle serial bus analyser. The new options, designated /C9 and /C12, meet the Class C requirements of the LXI Standard.

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TDI Dynaload's high-speed loads from TTi

TDI Dynaload's high-speed loads from TTi

In response to changing industry demands, the Dynaload division of TDI Power has developed a new line of electronic loads. The Dynaload XBL Series features 800, 2000, 4000, and 6000 W models with a wide range of voltage inputs and sophisticated computer programming via GPIB, Ethernet, or RS232. These units also feature an integrated web page for local system operation and control.

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CIL extends flying probe test capability

CIL extends flying probe test capability

CIL, the Andover-based electronics design manufacturing company, has increased its flying probe test capability by installing a new Takaya APT9401CE. The installation is part of the company's continuous investment programme and is required to increase capacity for new business activities.

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Amplicon launches Test Systems Division

Amplicon's new Test Systems Division has been developed to provide system integrators and end-users with the widest range of test system hardware at a price that only a manufacturer and tier 1 distributor can offer. PXI, Compact PCI (cPCI), LXI and PC-based systems along with an extensive product integration service provides customers with a finished hardware platform allowing them to concentrate on their specific area of expertise – typically, the addition of a bespoke test software application.

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Keithley Microsite Offers Access to Informative Photovoltaic Measurements Seminar, Online Solar Cell Demo

Keithley Instruments has created an application-specific microsite for those responsible for characterizing solar/photovoltaic devices. "Simplify Your Solar Cell Testing with Keithley's Precision Measurement Solutions" describes Keithley's high accuracy solutions for solar cell I-V and C-V characterization, which allow high speed testing without the hassles of integrating separate instruments or writing complicated programs. It also describes key solar cell parameters and measurement techniques. To visit this microsite, go to www.keithley.com/solar_cell.

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Agilent Technologies Introduces NanoSuite 5.0 Software for More Powerful Nanomechanical Testing

Agilent Technologies Inc. today announced the availability of a new, more powerful version of its popular NanoSuite software package. Designed for use with the company's line of nanoindentation and tensile-testing instruments, Agilent NanoSuite 5.0 software offers advanced features such as enhanced imaging capabilities, survey scanning and a new test method development environment. All NanoSuite 5.0 functions have been optimized to help researchers run tests and manage data with unprecedented speed and ease.

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Tektronix and National Instruments to Unveil Joint Product Initiative at NIWeek

Tektronix and National Instruments today announced that the two companies have extended their more than 20-year relationship by unveiling plans to co-innovate on new products that will improve productivity and lower costs for engineers and scientists working in design verification, manufacturing test, scientific research, and embedded test. The two companies will unveil specific details at NIWeek 2009 scheduled for Aug. 4–6 in Austin, Texas.

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Verigy - SmartRA Redundancy Analysis Option for its V6000 WS Memory Test System

Verigy, the semiconductor test company, today introduced SmartRA (Scalable Memory Redundancy Technology), a memory redundancy analysis (RA) option for its V6000 WS test system. SmartRA provides a scalable, flexible, cost-effective solution that allows manufacturers to meet the expanding fail storage and performance requirements of redundancy analysis for DRAM.

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LEM - 2nd generation Wi-LEM wireless  sub-metering components

LEM - 2nd generation Wi-LEM wireless sub-metering components

LEM has extended its Wi-LEM (Wireless Local Energy Meter) family to allow the remote measurement and monitoring of electricity, water and other metered utilities as well as temperature and humidity. It allows industrial and commercial enterprises to break down energy and water usage and identify areas of efficiency improvement. All the new Wi-LEM components feature a ten-fold increase of RF power from 1mW to 10mW, increasing the distance between nodes compared to the previous LEM generation of components.

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Yokogawa - Power meters certified for testing standby power to new IEC 62301 standard

Yokogawa - Power meters certified for testing standby power to new IEC 62301 standard

The Yokogawa WT3000-2A and WT210 digital power meters are now certified to carry out the standby power tests specified in the new IEC 62301 standard, which defines the standby mode as the lowest consumption of an appliance not performing its main function, when connected to the mains.

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Peak Group - Switch probe for voltage-free applications

Peak Group - Switch probe for voltage-free applications

The P201/GVF from Peak Test Services is a normally open switch probe with built-in isolation for use in voltage-free ICT (in-circuit test) applications where the circuit under test needs to be isolated from voltages applied by the measurement circuitry.

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National Instruments Delivers Advanced Data Management Capabilities With New Version of DIAdem

National Instruments Delivers Advanced Data Management Capabilities With New Version of DIAdem

National Instruments has announced NI DIAdem 11.1, a new version of the interactive software for managing, analysing, visualising and reporting test data that includes new features and filtering capabilities for advanced development and automated analysis. DIAdem is designed to help engineers make informed decisions and meet the demands of today's testing environments, which require quick access to large volumes of scattered data, consistent reporting and data visualisation.

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Agilent and Mu Dynamics Integrate Solutions to Accelerate Deployment of Scalable, Secure, Reliable Networks

Agilent and Mu Dynamics Integrate Solutions to Accelerate Deployment of Scalable, Secure, Reliable Networks

Agilent Technologies and Mu Dynamics today announced a collaboration to tightly integrate Agilent's industry-leading N2X multiservices test solution with Mu's award-winning Test Suite family. The integration, already in use at leading network operators and their vendor suppliers, accelerates the design and automation of tests to evaluate the impact of unexpected device/systems scenarios on network performance and reliability. The testing emulates real-world scale and traffic in out-of-service lab environments, eliminating the need for operationally costly large test beds of network equipment. The companies coauthored a testing methodology that will enable shared customers to extend the integration to a wide variety of test scenarios.

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Agilent Technologies - Rugged FieldFox RF Interference Analyzer

Agilent Technologies - Rugged FieldFox RF Interference Analyzer

Agilent Technologies has introduced an interference analyzer option for its popular FieldFox RF Analyzer, the world's most integrated RF handheld for wireless installation and maintenance (I&M). The company also introduced new, industry-first spectrum analyzer features.

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Verigy - Zero-Footprint Tester for Cost-Sensitive ICs and Microcontrollers

Verigy - Zero-Footprint Tester for Cost-Sensitive ICs and Microcontrollers

Verigy has introduced the V101, a low-cost, zero-footprint, 100 MHz tester-on-board system for wafer sort and final test of today's most cost-sensitive ICs and microcontrollers. The V101 addresses the extreme low cost requirements of these devices and intense time-to-market pressures.

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The TF930 3 GHz universal frequency counter incorporates a USB interface for remote control and readback

The TF930 3 GHz universal frequency counter incorporates a USB interface for remote control and readback

The new counter has a frequency range from 0.001 Hz to over 3000 MHz with high sensitivity across the range. The high-quality TCXO timebase is stable to within ±1 part in 106 over the full temperature range, and provides a low aging rate. Its short warm-up time allows accurate measurements to be made even under portable battery-powered conditions.

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Agilent Introduces Full Suite of Oscilloscope Probe Positioners

Agilent Introduces Full Suite of Oscilloscope Probe Positioners

Agilent Technologies has introduced four new oscilloscope probe positioners. The N278xA Series probe positioners provide quick and stable probe positioning for making measurements on PC boards and other devices that require hands-free probing.

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Matrix Card Expands Keithley’s Series 3700 System Switch/Multimeter Family

Matrix Card Expands Keithley’s Series 3700 System Switch/Multimeter Family

Keithley Instruments has announced an expansion of its Series 3700 System Switch/Multimeter and plug-in card family with the addition of a new plug-in switching card, the Model 3731 6´16 High Speed, Reed Relay, Matrix Card. Its voltage and current characteristics (200V, 1A switched or 2A carry signal capacity) make it ideal for use in multi-channel I-V testing in conjunction with Keithley's Series 2600A System SourceMeter instruments.

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Agilent's Audio Analyzer Quantifies Performance of Audio Components

Agilent has introduced a single-unit solution - the U8903A audio analyzer -- that helps users quantify characteristics that affect sound quality in audio devices. The Agilent U8903A is also the next-generation replacement for the widely used legacy 8903B audio analyzer.

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Test mobile with DC-HSDPA support is a first says Aeroflex

Test mobile with DC-HSDPA support is a first says Aeroflex

Aeroflex claims another world first for its market-leading TM500 test mobile with the launch of support for the new 3GPP W-CDMA Release 8 Dual Cell HSDPA (DC-HSDPA) feature. Building on the Aeroflex TM500's existing Release 7 HSPA+ solution, the launch of DC-HSDPA support provides network infrastructure equipment manufacturers with the early access to the test capabilities they need to speed its development and deployment.

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Livingston's new rental agreement with Agilent

Livingston's new rental agreement with Agilent

Livingston has announced a rental agreement with Agilent, which came into effect this spring. The agreement is seen as an opportunity to increase Livingston's footprint globally, and further their continued expansion into the RF, microwave, aerospace and defence markets in Europe, the Middle East and Africa.

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Aeroflex and w2bi agree to develop new LTE handset certification platform

Aeroflex and w2bi have announced that they have entered into an agreement under which they will pool their test expertise and technology for the joint development of a network certification platform for LTE mobile devices.

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Stanford Research function generator with 10% discount and FREE GPIB interface

Lambda Photometrics is currently offering the Stanford Research Systems DS345 30MHz function generator with a 10% discount and FREE GPIB interface. The versatile DS345 30 MHz function generator can generate sine, square, ramp, triangle and arbitrary waveforms with 1 microHz resolution.

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GOEPEL to run free Boundary Scan Training Days in UK

GOEPEL electronics is offering a free JTAG/Boundary Scan Training Day at the premises of interested parties located in UK and Ireland. The respective seminar is addressing system architects, R&D engineers as well as test production engineers to find out how versatile and effective JTAG/Boundary Scan is for the test, programming and emulation of boards and whole systems.

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Keithley Adds Free Graphing Toolkit to Series 3700 System Switch/Multimeter Firmware

Keithley Adds Free Graphing Toolkit to Series 3700 System Switch/Multimeter Firmware

Keithley Instruments has announced the addition of a Web-browser-based, multi-channel graphing toolkit capability to its Series 3700 System Switch/Multimeter family. This new data visualization capability, which is included at no charge in the firmware for all new Series 3700 mainframes, offers users a quick and easy way to observe measurement data vs. time as channel measurements are made with the optional built-in digital multimeter, without the need for programming or any data file manipulation.

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Keithley at this weeks Femtocells World Summit 2009 in London

During the Femtocells World Summit 2009 in London, June 23 - 25, 2009, representatives from Keithley Instruments will be on hand to demonstrate the Keithley-ACE Solution manufacturing test solution for femtocells based on the picoChip PC202 Integrated Baseband Processor and the PC205 High Performance Integrated PHY Processor.

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Boundary Scan Software Platform features Automatic Program Generator for functional Emulation Test of Bus Components

GOEPEL electronic has announced the introduction of a fully automatic program generator specifically for the dynamic test of on-board system bus structures in the context of the Boundary Scan software platform SYSTEM CASCON. The newly developed tools are based on the innovative VarioTAP technology for functional emulation tests and enable a complete automation of the test vector generation, as well as for the error diagnostics for the first time ever.

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Agilent Technologies' InfiniiSim Waveform Transformation Software Lets Engineers View Waveforms Anywhere in High-Speed Digital Systems

Agilent Technologies' InfiniiSim Waveform Transformation Software Lets Engineers View Waveforms Anywhere in High-Speed Digital Systems

Agilent Technologies Inc. today announced waveform transformation software for its Infiniium 9000 and 90000 Series oscilloscopes. The software lets engineers view waveforms at any point in a high-speed serial data system, including PCI Express(r), USB 3.0, SATA and DisplayPort systems. It provides de-embedding, virtual probing and simulation tools for real-time analysis that help engineers characterize their systems more thoroughly and improve measurement margins.

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High-speed 16-bit digitiser card has 125MHz bandwidth

High-speed 16-bit digitiser card has 125MHz bandwidth

The new Razor family of high-speed, high-performance digitiser cards has been released by GaGe Applied. The new multi-channel 16-bit digitisers feature up to four channels, 100 or 200 MS/s maximum sampling per channel, up to 2 GS of on-board memory, and 65 or 125 MHz bandwidth.

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Aeroflex expands PXI platform with new high-power signal generators for RF component test

Aeroflex expands PXI platform with new high-power signal generators for RF component test

Aeroflex has announced it has expanded its flexible PXI modular test platform with the addition of two new 3020 Series high-power and compact RF signal generators. The 3020 Series are compact, high-precision PXI modular RF signal generators with integrated dual-channel arbitrary waveform generators ideally suited for R&D manufacturing and design verification of RF components and systems. The addition of the 3021C and 3026C extend the output power range of the 3020 Series to +17dBm for frequencies up to 3GHz and 6GHz respectively.

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New Upconverter Supports Transceiver Test, Simplifies Test System Design

New Upconverter Supports Transceiver Test, Simplifies Test System Design

Keithley Instruments has introduced the Model 2891-IQ Upconverter, which provides comprehensive support for transceiver testing by processing analog I and Q baseband signals for testing a transceiver's transmitter, as well as processing analog I and Q output signals for testing a transceiver's receiver.

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Universal Boundary Scan tester for production integrates test electronics directly in the fixture

Universal Boundary Scan tester for production integrates test electronics directly in the fixture

GOEPEL electronic recently introduced the development of JULIET (JTAG UnLimItEd Tester), a family of completely integrated stand-alone production testers. The modular systems combine all test electronics, as well as the basic mechanics in a compact desktop system. Furthermore, they are equipped with a specific interface to an exchangeable adaptor giving fast changes to accommodate different Units Under Test (UUT).

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Murata's long lead thermistor gains automotive qualifications

Murata's long lead thermistor gains automotive qualifications

Murata's Thermo-String long lead thermistor range for monitoring the temperature of areas that are hard to reach with surface-mount thermistors is now fully qualified for automotive use. Hot spots may not always be on the PCB or motherboard, so Thermo-String's long leads of up to 150mm allow the head of the thermistor to be situated as close to the problem area as possible, even in narrow or small locations.

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Gigahertz Photon Detection Module From PerkinElmer

Gigahertz Photon Detection Module From PerkinElmer

PerkinElmer has announced the introduction of its new Gigahertz Photon Detection Module (GPDM) for analytical and clinical diagnostic applications under low light level conditions. The new module, the latest addition to PerkinElmer's Channel Photomultiplier family, offers the world's highest dynamic counting range between 1 cps and 1 Gcps in a single operating mode, coupled with extremely low noise performance. As a result of the new Gigahertz module's high dynamic range and high signal to noise (S/N), OEMs can perform fluorescence and luminescence measurements with a single detection system.

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LEM introduces triple current measurement in single housing

LEM introduces triple current measurement in single housing

LEM has introduced the HTT series of PCB-mounting current transducers to provide the facility to measure three currents with a single PCB-mounted unit. The new transducers, with maximum measurement currents ranging from 25 to 150 ARMS, allow three-phase currents to be monitored independently by a unit occupying a mounting area of only 16.8 cm2 and with a height of only 29 mm.

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Verigy Receives Frost & Sullivan 2009 Product Innovation of the Year Award for Flash and DRAM Test Platform

Verigy Receives Frost & Sullivan 2009 Product Innovation of the Year Award for Flash and DRAM Test Platform

Verigy, a semiconductor test company, has announced it has been awarded the 2009 Product Innovation of the Year Award from Frost & Sullivan for its V6000 tester platform. Introduced in late 2008, the V6000 enables testing of both flash and DRAM memory on the same platform, at breakthrough cost-of-test. The V6000 is versatile and scalable across the entire semiconductor memory test process, including engineering, wafer sort and final test.

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Keithley Webinar Explores Fundamentals of Semiconductor C-V Testing

Keithley Instruments will broadcast a free, web-based seminar titled "Semiconductor Capacitance-Voltage (C-V) Fundamentals," which will be presented by Electronic Design magazine. Lee Stauffer, Senior Staff Technologist for Keithley's Semiconductor Measurements Group will present the webinar and take questions from the audience at the end. The webinar will be broadcast on Tuesday, June 2, at 2:00 p.m. ET (11:00 a.m. PT).

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Agilent Offers MATLAB Software with its Sampling Scopes

Agilent Technologies has announced the availability of MATLAB data analysis software with the purchase of Agilent 86100C DCA-J oscilloscopes. Combining Agilent oscilloscopes and MATLAB data analysis software enables engineers to confidently analyze, visualize and filter signals. Users are able to obtain high-quality instrumentation and data-analysis software from a single source, simplifying work processes and saving engineers' time.

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Agilent Technologies to Demonstrate Industry-First USB 3.0 Tests with NEC's USB 3.0 Host Controller at Developers Conference

Agilent Technologies to Demonstrate Industry-First USB 3.0 Tests with NEC's USB 3.0 Host Controller at Developers Conference

Agilent today will demonstrate its SuperSpeed USB test solution portfolio here at the Developers Conference. This is the industry's first high-performance SuperSpeed USB test fixture coupled with NEC Electronics' USB 3.0 host controller. Agilent will also demonstrate its complete USB 3.0 portfolio, which consists of fully automated transmitter and receiver tests that are key to efficient compliance tests and systematic product characterization of SuperSpeed USB.

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Agilent Technologies' EMPro 2009 Improves Integration with Advanced Design System

Agilent Technologies' EMPro 2009 Improves Integration with Advanced Design System

Agilent has introduced EMPro 2009, the full 3-D electromagnetic design and simulation software that represents the next step in integration with Advanced Design System, the industry's leading RF and microwave design and simulation platform.

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Yokogawa launches website for test & measurement products

Yokogawa launches website for test & measurement products

Yokogawa has launched a dedicated web site for its ranges of test & measurement products. The new site gives full details of the company's ranges of oscilloscopes, data-acquisition systems, digital power meters, signal sources, and optical and wireless communications test equipment.

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Agilent Technologies, Net-O2 Technologies Announce World's First MEF 21 Conformance Test Suite

Agilent Technologies, Net-O2 Technologies Announce World's First MEF 21 Conformance Test Suite

Agilent Technologies and Net-O2 Technologies has announced what it says is the world's first MEF 21 conformance test suite. This test suite is the result of integrating Net-O2's ATTEST MEF 21 Link OAM protocol conformance test suites (CTSs) into Agilent's N2X multiservices test solution

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Free Keithley Web-Based Technical Seminar Explores Electrical Measurements of Photovoltaic/Solar Cell Devices

Keithley Instruments will broadcast a free, web-based seminar titled "Photovoltaic Measurements: Testing the Electrical Properties of Today's Solar Cells." It will be broadcast on Wednesday, May 27. This one-hour seminar will provide an overview of the electrical measurements used in photovoltaic device development from basic research to early production testing. To register for this event, visit www.keithley.com/events/semconfs/webseminars.

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Power meter complies with latest obligatory EN standards on harmonics testing

Power meter complies with latest obligatory EN standards on harmonics testing

The Yokogawa WT3000 digital power analyser equipped with IEC harmonics testing software complies with the latest EN standard on harmonics testing: EN61000-3-2:2006. IEC Standard 61000-4-7 Ed. 2, which is now obligatory as the test method for harmonics testing, specifies that the test instrument must be able to accept current input signals with a crest factor (peak current divided by RMS current) of at least 4 for inputs up to 5 A RMS, 3.5 for inputs up to 10 A RMS and 2.5 for higher RMS currents.

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18-GHz Differential TDR Probe Kit from Agilent

18-GHz Differential TDR Probe Kit from Agilent

Agilent has introduced a probe kit for making differential time-domain reflectometry (TDR) and time-domain transition (TDT) measurements. TDR/TDT analyses are commonly performed by signal-integrity engineers during the design and validation of high-speed serial links and components. TDR/TDT measurements are also invaluable for maintaining consistent quality in printed circuit board and passive-component manufacturing.

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Agilent Technologies' HDMI Test Solution Chosen by Simplay Labs

Agilent Technologies' HDMI Test Solution Chosen by Simplay Labs

Agilent Technologies has announced that Simplay Labs in Shanghai, China, has selected Agilent's HDMI test solution for source, sink and cable certification at its new test center. This purchase continues the long-term relationship between Simplay Labs and Agilent to further develop devices for HDMI standards.

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Aeroflex Avionics Test Set receives AIMS certification

Aeroflex Avionics Test Set receives AIMS certification

Aeroflex has announced that its IFF-45TS Avionics Test Set has received official certification from the U.S. Department of Defense International AIMS Program Office. The IFF-45TS test set is now AIMS certified to perform testing and validation on identification, friend or foe (IFF) Mode 4 and 5 transponders and interrogators. In addition, the IFF-45TS will perform testing on DME/TACAN interrogators.

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Geolocation Software from Agilent Maps Emitter Location Using RF Sensor Networks

Geolocation Software from Agilent Maps Emitter Location Using RF Sensor Networks

Agilent has introduced an integrated real-time radio frequency emitter geolocation technique using a network of Agilent N6841A RF Sensors. The Agilent N6854A Geolocation server software estimates position of a non-cooperative intermittent or short-duration RF signal using measurements from the sensor network and calculations with time-difference-of-arrival (TDOA) techniques.

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WirelessHD Compliance Test System designed for makers of WirelessHD Modules and Chipsets

Agilent has introduced what it says is the industry's first solution for the WirelessHD compliance test -- the CTS-1000 automated WirelessHD test system -- designed specifically for manufacturers of WirelessHD modules and chipsets for consumer and computing products.

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Mixed-Signal Interconnect Solution for Semiconductor Device Probers and Characterization Equipment now Available from Keithley

Mixed-Signal Interconnect Solution for Semiconductor Device Probers and Characterization Equipment now Available from Keithley

Keithley Instruments has introduced what it says is the test industry's only cabling solutions capable of handling I-V, C-V, and pulsed I-V signals with a single set of cables (patent pending). The new cabling kits are based on a patent-pending design that speeds and simplifies the process of making DC Current‑Voltage (I‑V), Capacitance‑Voltage (C‑V), and pulsed I‑V testing connections from any modern semiconductor parameter analyzer to a Cascade Microtech or SUSS MicroTec prober. The cables are designed for compatibility with Keithley's Model 4200‑SCS Semiconductor Characterization System, as well as with other test instruments used for characterization.

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Keithley Upgrades Model 4200-SCS For Solar Cell Testing, Expanded C-V Frequency Range, and Nine-Slot Chassis Support

Keithley Upgrades Model 4200-SCS For Solar Cell Testing, Expanded C-V Frequency Range, and Nine-Slot Chassis Support

Keithley Instruments has introduced a variety of hardware, firmware, and software enhancements to its Model 4200-SCS Semiconductor Characterization System. The Keithley Test Environment Interactive (KTEI) V7.2 upgrade includes nine new solar cell test libraries, an expanded frequency range for the system's Capacitance-Voltage (C-V) measurement capability, and support for the company's new nine-slot Model 4200-SCS instrument chassis.

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Aeroflex adds new test capabilities to IFR 6015 Avionics Test Set

Aeroflex adds new test capabilities to IFR 6015 Avionics Test Set

Aeroflex has announced it has added IFF test modes 1, 2 and TACAN as standard features to the IFR 6015 Ramp Test Set, the company's next generation of avionics test equipment. Compact, lightweight and weatherproof, the IFR 6015 is a battery-powered portable unit designed to test the operation of aviation transponder modes 1, 2, 3A/C/S including European Elementary and Enhanced Surveillance (ELS and EHS), TCAS I, II and Military E-TCAS, TIS and now DME/TACAN.

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National Instruments Simplifies Instrument Control with LabVIEW and Industry’s Largest Source of Drivers

National Instruments simplifies instrument control by offering the NI Instrument Driver Network (IDNet), said to be the industry's largest source of instrument drivers, and easy-to-use software optimised for instrument control including NI LabVIEW, LabWindows/CVI and Measurement Studio for Microsoft Visual Studio.

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Agilent to Demonstrate WiMAX Test Solutions at 2009 Asia WIMAX Forum Congress

Agilent Technologies will demonstrate its full range portfolio of WiMAX test solutions April 28-29 at the Suntec Convention Centre, Booth 62. Agilent's test solutions address the WiMAX test requirements in design verification, pre-conformance, conformance, network deployment and service assurance. These test solutions enable engineers and managers in R&D, manufacturing and service networks to create and advance WiMAX-based communications.

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System measures electrical contacts for micro interruptions

System measures electrical contacts for micro interruptions

Quality Electronics Design S.A. has announced an advanced system for the measurement of the micro interruptions of electrical contacts. The measurement system offers the functionality required by the USCAR, Flexray, GMV3192, IEC 60512-1,2 and DIN norms for the quality control of the electrical contacts in the automotive and industrial connectors. The system identifies micro interruptions with a standard resolution of 25 nSec and a trigger level that can be freely defined.

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National Instruments Measurement Devices Power Cardiff Electronics Lab

National Instruments Measurement Devices Power Cardiff Electronics Lab

National Instruments UK & Ireland has continued to develop its relationship with Cardiff University, with the School of Engineering refitting its Electronics laboratory with a range of NI measurement and instrument control platforms.

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Threaded switch probe copes with lateral forces

Threaded switch probe copes with lateral forces

The new P888/G from Peak Test Services is a normally open threaded switch probe incorporating an integrated ball as the contact element at the top of the plunger.

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Agilent Introduces In-Circuit Tester with Digital Capabilities, Low-Cost Fixturing

Agilent Introduces In-Circuit Tester with Digital Capabilities, Low-Cost Fixturing

Agilent Technologies has announced it has launched the Medalist i1000D in-circuit test system with digital test capabilities. The i1000D bridges a growing solution gap between high-functionality in-circuit testers and low-end manufacturing defects analyzers.

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Tektronix Collaborates With Ravensbourne College To Help Engineers of Tomorrow

Tektronix has announced today that they have donated a WVR6100 waveform rasterizer to Ravensbourne College of Design and Communication. The WVR6100 unit, which was presented in person by Tektronix, features analog and SD monitoring capabilities as well as digital audio monitoring functionality.

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Tektronix Addresses Test & Measurement Challenges with DesignInsight Mobile Expo

Tektronix has announced the start of its DesignInsight Mobile Expo tour across the US and Canada. The tour is a unique program that brings state-of-the-art Tektronix equipment to engineers at their workplace, allowing hands-on learning and evaluation opportunities that would previously have only been possible with costly travel and time away from the office. Beginning with visits to customer sites in the San Francisco Bay Area on April 20th, the DesignInsight Mobile Expo tour will also make a stop at Cisco Systems' annual 'Toolapalooza' event, and then will travel throughout the US and Canada to customer sites, ending in the US Midwest in August.

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Multi-Function Digital Metering System Offers New Enclosure Options

Multi-Function Digital Metering System Offers New Enclosure Options

Under its Crompton Instruments brand, Tyco Electronics has recently released a new Tegra multi-function digital metering system (DMS) in a small DIN 72 and 4-module DIN-rail case for all low and medium voltage switchgear and distribution systems. Benefiting from its compact design and new enclosure options, the Tegra DMS displays up to 57 electrical parameters and complements the Integra series of digital metering systems. To suit user requirements, Tegra DMS includes single-phase, three-phase three-wire and three-phase four-wire capabilities under low voltage with unbalanced loads.

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Tektronix Introduces Highest Performing, Most Versatile 40GbE and 100GbE Test Solution

Tektronix, Inc announced new optical sampling oscilloscope modules for the Tektronix DSA8200 Digital Serial Analyzer Series that promise to lower the cost of high-performance optical transmitter development and standards compliance. The 80C10B and 80C10B with Option F1 (80C10B F1) provide the industry's most complete testing solution for compliance verification of next generation transmitter standards from 40 Gb/s to 100 Gb/s and beyond. The company also announced the 80C25GBE module for 100 Gb/s Ethernet (100GbE) manufacturing and compliance verification.

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Octasic Introduces Advanced Evaluation and Development Platforms that Accelerate OEM Development of Media Gateways

Octasic Inc. today announced the availability of comprehensive evaluation and development platforms in support of Vocallo MGW customers. These platforms provide the most versatile DSP evaluation and development environments for voice and video over IP applications available today.

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Standalone Speedstack impedance coupon  generator from Polar Instruments

Standalone Speedstack impedance coupon generator from Polar Instruments

Polar Instruments has announced the standalone Speedstack impedance coupon generator which produces Gerber files to create impedance test coupons from manual or scripted data, or by pasting data from Polar Instruments' Speedstack PCB stackup design tools.

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Aeroflex expands baseband test capabilities with acquisition of VI Technology

Aeroflex has announced it is expanding its communications test capabilities with the strategic acquisition of VI Technology, Inc., a leading provider of integrated baseband test solutions, specialising in audio, video and multi-media test.

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Agilent Technologies Introduces A-GPS Design Verification Test Systems

Agilent Technologies Introduces A-GPS Design Verification Test Systems

Agilent has introduced GS-9000 Assisted GPS (A-GPS) Design Verification Test systems designed around the 8960 wireless communications test set's new A-GPS assistance data messaging test capabilities. The capabilities support A-GPS validation, Total Isotropic Sensitivity testing and A-GPS pre-conformance testing for mobile devices. With this introduction, Agilent's 8960 test set offers the industry's best price/performance one-box tester for use in A-GPS base station emulation applications across the entire R&D lifecycle.

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Agilent's Compact Receiver Offers Significantly Improved Spectral Awareness and Easy Deployment

Agilent's Compact Receiver Offers Significantly Improved Spectral Awareness and Easy Deployment

Agilent has introduced an extremely cost-effective digital receiver for radio frequency signal monitoring. The Agilent N6841A RF Sensor is a software-defined, network-based receiver housed in a compact, weatherproof enclosure with a wide operating temperature range suitable for outdoor deployments. Multiple receivers may be combined to form RF sensor networks to improve detection, monitoring and geolocation of emitters in commercial, radio regulatory, security and defense applications.

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Keithley's 22 European City Seminar Tour

Keithley's 22 European City Seminar Tour

Keithley Instruments is launching a European City Seminar Tour starting on April 23, 2009. The tour will visit 22 European cities in Belgium, France, Germany, Italy, The Netherlands, Sweden, Switzerland, and the UK throughout April and May. Attendance is free of charge but registration is required. To see detailed local seminar information and to register, visit www.keithley.info/cityseminars09

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Agilent is First to Extend Real-Time Wireless Network Protocol Analysis to Support Femtocells

Agilent has introduced its Signaling Analyzer Real Time (SART) for Femto. This first-to-market technology extends the test industry's most complete, end-to-end wireless analysis and troubleshooting solution to femtocells, which access wireless networks via consumer broadband connections. The platform supports both standards-based and proprietary femtocell implementations.

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Agilent's Drive Test for VoIP Enables Wireless Carriers to Ensure Quality of Lucrative Voice Services

Agilent has introduced the test industry's latest drive test solution for Voice over Internet Protocol (VoIP) that allows network equipment manufacturers and wireless service providers to integrate voice-quality measurements with drive test RF data used in the optimization of wireless networks. Agilent has added the VoIP test sequence as an attractively priced software upgrade to its proven drive test platform, which supports RF measurements for all established wireless technologies. Current Agilent drive test customers can purchase the VoIP solution while protecting their earlier investment in the drive test platform.

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Reliable spring probe pins said to reduce component wear

Reliable spring probe pins said to reduce component wear

The latest in the range of high-end test contactors, PCBs and burn-in sockets offered by Yamaichi Electronics is now individual spring contact pins, so-called spring probe pins. Besides semiconductor and sensor testing, they can also be used in other areas, such as medical/space, application testing, failure analysis, programming, and burn-in.

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Aeroflex TM500 Test Mobile leads market with UE CAT4 LTE support

Aeroflex TM500 Test Mobile leads market with UE CAT4 LTE support

Aeroflex claims a world first with the addition of UE CAT3 and UE CAT4 support to its market-leading TM500 LTE test mobile. LTE CAT 3 and CAT 4 data channels provide data rates of up to 150Mbps on the downlink and 50Mbps on the uplink, supporting the delivery of the bandwidth-hungry applications increasingly being demanded by users. The UE CAT 3 and UE CAT 4 support on the TM500 LTE now enables infrastructure vendors to fully verify and validate the performance of their eNBs.

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Agilent Launches Four Low-Power High-Speed Digitizers

Agilent Launches Four Low-Power High-Speed Digitizers

Agilent Technologies has introduced four versions of its low-power U1071A line of Acqiris two-channel, high-speed 8-bit PCI digitizers. The new digitizers give users highly precise and cost-effective measurement data, designed specifically for small to mid-sized test and measurement applications.

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Synthetic Test Environment optimised for Satellite Payload Test

Synthetic Test Environment optimised for Satellite Payload Test

Aeroflex has announced commercial availability of its Synthetic Multifunction Adaptable Reconfigurable Test Environment (SMART^E) 5200 Series, a new, synthetic Satellite Payload Test Environment that includes hardware, software, test practices and support required by customers for a complete test solution.

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Photonic Application Software for Next-Generation-Network Component Test from Agilent

Photonic Application Software for Next-Generation-Network Component Test from Agilent

Agilent has introduced a photonic application software suite that supports high accuracy and high-speed measurements in R&D and manufacturing of optical components and modules for the next generation network.

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Agilent Introduces Waveform Analysis Solutions for Next-Generation Storage, Telecommunications Components and Systems

Agilent Introduces Waveform Analysis Solutions for Next-Generation Storage, Telecommunications Components and Systems

Agilent Technologies has introduced three measurement solutions for testing next-generation storage and telecommunications components and systems. The new solutions are the first of their kind in the industry and are based on the 86100C digital communications analyzer (DCA). They allow engineers to easily visualize and accurately quantify the quality of their latest component and system designs.

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New models expand applications for OTDR family

New models expand applications for OTDR family

Six models have been added to the Yokogawa AQ7275 Series of optical time-domain reflectometers, extending its range of applications to cover virtually all metro, access and core networks as well as fibre to the home and passive optical networks.

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White Paper Describes Semiconductor Characterization and Parametric Test Challenges

Keithley Instruments has published a white paper on how semiconductor characterization and parametric test solutions are evolving to keep pace with rapid changes in the semiconductor industry. The white paper, which can be downloaded at www.keithley.com/navigate, describes the emerging technology and business dynamics affecting the industry, including the growing need for vendor support.

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Time switches maximise energy saving through astrological programming

Time switches maximise energy saving through astrological programming

Finder has launched a pair of digital weekly time switches providing a programming capability enabling switching according to local sunrise and sunset times, that are automatically calculated from user input of current date, time and either local longitude and latitude or nearest major city.

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Keithley Upgrades SCS For Solar Cell Testing, Expanded C-V Frequency Range, and Nine-Slot Chassis Support

Keithley Upgrades SCS For Solar Cell Testing, Expanded C-V Frequency Range, and Nine-Slot Chassis Support

Keithley Instruments has introduced a variety of hardware, firmware, and software enhancements to its award-winning Model 4200-SCS Semiconductor Characterization System. The Keithley Test Environment Interactive (KTEI) V7.2 upgrade includes nine new solar cell test libraries, an expanded frequency range for the system's Capacitance-Voltage (C-V) measurement capability, and support for the company's new nine-slot Model 4200-SCS instrument chassis.

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Mixed-Signal Interconnect Solution for Semiconductor Device Probers and Characterization Equipment from Keithley

Mixed-Signal Interconnect Solution for Semiconductor Device Probers and Characterization Equipment from Keithley

Keithley Instruments has introduced what it says is the test industry's only cabling solutions capable of handling I-V, C-V, and pulsed I-V signals with a single set of cables (patent pending). The new cabling kits are based on a patent-pending design that speeds and simplifies the process of making DC Current‑Voltage (I‑V), Capacitance‑Voltage (C‑V), and pulsed I‑V testing connections from any modern semiconductor parameter analyzer to a Cascade Microtech or SUSS MicroTec prober. The cables are designed for compatibility with Keithley's Model 4200‑SCS Semiconductor Characterization System, as well as with other test instruments used for characterization.

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Agilent to Collaborate with ASTER for Seamless Test Coverage Analysis Across Test Platforms

Agilent has announced a strategic partnership with ASTER Technologies to enable integration of ASTER's TestWay Coverage Analyst with Agilent's printed circuit board assembly test platforms, enabling seamless test coverage analysis across test platforms.

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Agilent's Portfolio Now Includes Industry-First Automated USB SuperSpeed Pattern Generator Calibration

Agilent has announced it has expanded its Universal Serial Bus (USB) test portfolio with the industry's first automated calibration of a USB 3.0 pattern generator required for receiver test. This enhancement will significantly reduce test system setup time and is a major step toward fully automated receiver tests.

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Aeroflex and Icom in joint relationship for automated tests and alignment of Icom radios

Aeroflex has announced an agreement with Icom Inc. to provide automated test and alignment capabilities for Icom radios on the Aeroflex 3920 Digital Radio Test Set. Initial test capabilities will be focused on the IC-F9010/F9510 APCO Project 25 Conventional and Trunked Radios and the IC-F4029SDR Series dPMR Portable Digital Radios. The test programs will be expanded to include Icom's IDAS Series NXDN compatible radios and D-STAR digital amateur radios.

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Keithley Webcast Seminar will explore how to Avoid Parallel Test Implementation Pitfalls

Keithley Instruments will broadcast a webcast seminar titled "Practical Tips and Tricks for Avoiding Common Pitfalls when Implementing Parallel Test" on Thursday, March 26, 2009. This one-hour seminar will offer guidance on migrating from sequential test to parallel test and explore ways to maximize resource utilization, balance system controller duties efficiently, and manage control of test timing and sequencing.

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Aeroflex announces expansion of XTS-5000 Auto-Test II Option to include other Motorola models

Aeroflex has announced the expansion of the XTS-5000 Auto-Test II Automated Test and Alignment Option for the 3920 Digital Radio Test Set. This option provides automated test and alignment of Motorola XTS and XTL Series Radios. The latest version includes support for additional Motorola portables such as the XTS-1500, XTS-2500, XTS-4000, SSE-5000 and MT-1500. It also includes support for the XTL-1500, XTL-2500 and XTL-5000 mobiles.

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Aeroflex announces support for NXDN radios

Aeroflex has announced support for new NXDN radios being developed for the land mobile radio market. As a member of the NXDN Forum, Aeroflex is leading the way with new test features that aid in the research and development of this exciting new radio technology.

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Portable Measurement System with two free slots

Portable Measurement System with two free slots

With the SPPortA2, Spectrum has enhanced its range of system solutions around the main product area of measurement cards. Customers, seeking for a complete system solution, now have an additional choice besides an individual PC solution and a Docking solution for Laptops.

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Software extends capabilities of Aeroflex 3500 Series hand-held Radio Test Set

Software extends capabilities of Aeroflex 3500 Series hand-held Radio Test Set

Aeroflex has announced the latest software features for the 3500 Series hand-held Radio Test Set. Software version 3.5.1 includes new features to extend the test capabilities of the 3500 Series, such as a new Tracking Generator Option which allows users to test and align duplexers quickly in the field. The updated software also provides support for the P25 Testing Option.

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Aeroflex 3920 Digital Radio Test Set now includes EIA/TIA-603 Compliance Test for FM land mobile radios

Aeroflex has announced it has enhanced its Auto-Test II test function for the Aeroflex 3920 Digital Radio Test Set. The Auto-Test II application now performs test functions as prescribed by the EIA/TIA-603 standard for testing any FM Land Mobile Radio. This option allows development groups, manufacturers and field service operations to verify that FM Land Mobile Radios perform to specifications.

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IR Introduces Testing Services for Commercial Products Used In Military, Space and Heavy Industrial Applications

International Rectifier has announced that its HiRel Business Unit has launched Testing Services to customers seeking critical electrical, reliability and qualification testing. IR's new suite of testing services addresses the growing need for electrical and environmental testing of hermetic and non-hermetic (plastic) components required by customers in a range of high reliability market segments.

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Outram Research Improves Quality of Power Measurements with IEEE1459

Outram Research Improves Quality of Power Measurements with IEEE1459

Outram Research has enhanced the functionality of its market leading Ranger PM7000 Power Quality Analyser, the industry's only Cat IV 600V Phase A-powered analyser, with the addition of support for capture of IEEE 1459 and IEEE 100 parameters. The new functionality allows users to more effectively measure useful power, fundamental reactive power and distortion power to help resolve a wide range of power quality problems.

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Agilent Technologies Introduces DDR3 Test Suite and claims Industry's Fastest Full Channel Logic Analysis Tool

Agilent Technologies has introduced the industry's first and most comprehensive DDR3 protocol debug and validation test suite for digital designers developing computer and embedded memory applications. The test platform offers the industry's fastest full channel 2.0GT/s 16962A logic analysis module, a complete probing portfolio for DDR3 BGA and DIMM, and the first DDR3 compliance and performance software environment.

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Non-contact torque measurement from Sensor Technology

Non-contact torque measurement from Sensor Technology

Soon to be announced is TorqSense RWT330/340 series, designed for use in applications where space is limited. Like other units in the TorqSense family, the RWT330/340 provides non-contact measurement of torque, speed, power and position of rotating shafts, such as machine drives, drive shafts for pumps, fans, mixers etc, and in the critical axes of test rigs.

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Keithley Discontinues its S600 Series Parametric Test Product Line

Keithley Instruments has announced that it is discontinuing its S600 Series parametric test product line. The Company will continue to accept orders for S600 Series testers until February 2010 and will continue to provide technical support, calibration, and repair services for five years through February 2014.

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Yokogawa completes package for automotive bus testing

Yokogawa completes package for automotive bus testing

With the launch of the new DLM2000 mixed-signal oscilloscope, Yokogawa Europe is now able to offer a complete package of test & measurement solutions for analysing the serial bus systems that are increasingly being used in the automotive sector.

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Protocol and network analyzers meet the 802.15.4/ZigBee development and implementation challenges

The ZigBee short range wireless protocol is achieving maturity. With more than 12M chips shipped during 2008, the protocol is gaining momentum in Smart Energy, health care, home automation and many other applications.

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Worldwide unrivalled Angled-View in GOEPEL electronic’s AOI Systems

Worldwide unrivalled Angled-View in GOEPEL electronic’s AOI Systems

GOEPEL electronic is now providing a module for angled-view inspection in its Automated Optical Inspection (AOI) systems. The new module generates a hitherto unrivalled field of view with excellent image quality at a 45° angle. With this the orthogonal camera's entire inspection area is covered. Making the inspection of solder joints and components concealed by other components much more accurate. Images can be captured from any angle position in 1° steps.

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Keithley Web-Based Seminar Covers Hall Effect Measurements

Keithley Instruments will broadcast a free, web-based seminar titled "Hall Effect Measurements Fundamentals" on Thursday, February 19, 2009. This one-hour seminar will introduce the topic of Hall Effect measurements as they relate to semiconductor materials and device characterization. To register for this event, visit www.keithley.com/events/semconfs/webseminars.

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Production line tester for medical electronics from Clare

Production line tester for medical electronics from Clare

Electronic medical equipment manufacturers can take advantage of a new test unit from Clare Instruments which improves the electrical safety and compliance testing of equipment in accordance with the 60601 set of standards.

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Link expands in-house test capability with new Agilent network analyser

Link expands in-house test capability with new Agilent network analyser

The Engineering Division of RF and microwave specialist Link Microtek has enhanced its in-house test facilities with the addition of a new Agilent PNA-L network analyser. Covering the frequency range 10MHz to 40GHz, the analyser is ideal for measuring a variety of microwave performance parameters, including VSWR, insertion loss, return loss and power.

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Pico Technology Adds More To Picoscope Oscilloscope Software

Pico Technology Adds More To Picoscope Oscilloscope Software

PicoScope, the PC Oscilloscope software from Pico Technology, is said to be one of the best-known oscilloscope packages on the market. Its carefully designed ergonomics and clear, uncluttered layout have set a benchmark for PC Oscilloscope displays.

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Keithley Releases its 2009 Test And Measurement Product Guide

Keithley Releases its 2009 Test And Measurement Product Guide

Keithley Instruments, Inc has announced the release of its 2009 Test and Measurement Product Guide. The 144-page guide offers details and technical specifications on Keithley's general-purpose and sensitive sourcing and measurement products, DC switching, RF switching and measurement, data acquisition solutions, semiconductor test systems, and optoelectronics test.

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Intepro to Demo Battery Test System For Flight Line Support at Aerospace Testing 09

Intepro to Demo Battery Test System For Flight Line Support at Aerospace Testing 09

Appearing for a second time at Aerospace 09, the premier aerospace design, test and manufacturing show, Intepro Systems will be demonstrating its new IBT700 aircraft battery test system on stand – B144.

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National Instruments Expands Sound and Vibration Product Offerings for Machine Diagnostic Applications

National Instruments Expands Sound and Vibration Product Offerings for Machine Diagnostic Applications

National Instruments has announced the release of NI analysis and signal processing tools for noise, vibration and harshness (NVH); machine condition monitoring; and audio test applications. The NI Sound and Vibration Measurement Suite Version 7.0 extends analysis functionality with NI LabVIEW virtual instruments (VIs) for performing psychoacoustic measurements, making it possible for engineers to quickly set up tests to quantify sound quality.

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Energy meter allows direct 3-phase connection to 65A

Energy meter allows direct 3-phase connection to 65A

The latest MID-compliant energy meter from Carlo Gavazzi is said to be the smallest device in the industry to offer direct three-phase connection up to 65A. Just four DIN modules wide, the EM23 DIN is also simple to use and easy to install, providing comprehensive and accurate measurements for energy cost sharing, cost allocation and utility metering applications.

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Tektronix Expands TriMode Probe Series

Tektronix Expands TriMode Probe Series

Tektronix has announced new offerings of its active differential probes that complement the full portfolio of new DPO/DSA70000B Series real-time oscilloscopes also announced today. The expanded P7500 probing family now offers performance probes for 4, 6 and 8 GHz in addition to the previously available industry setting benchmark ultra-performance probes at 13, 16 and 20 GHz – all providing superior signal fidelity with fast rise time, low circuit loading and unique patented TriModeTM measurement switching.

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Production line electrical testing boost with new Clare PowerSmart

Significant improvements in production line electrical safety testing are provided with the new PowerSmart automation and leakage test module by Clare Instruments. The module provides full leakage testing to EN 60990 and displays run test voltage and current during the functional tests. The power for the functional test can be either the internal supply or from the external connected electrical safety tester.

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Lowest Cost Handheld XRF Analyzer Released by Skyray XRF

Lowest Cost Handheld XRF Analyzer Released by Skyray XRF

Skyray XRF (USA) has released the newest version of their Handheld XRF Analyzer to the North American market. The Pocket-III builds upon the strengths of previous versions with the addition of various features and application capabilities.

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National Instruments' Top Trends in Test and Measurement for 2009

As the global economic climate places additional constraints on budgets, test engineers are challenged to identify ways to test devices more efficiently than ever before. National Instruments has identified three trends – software-defined instrumentation, parallel processing technologies and new methods for wireless and semiconductor test – that will significantly improve the efficiency of test and measurement systems in 2009.

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Aeroflex secures first sales in China for TM500 TD-LTE test mobile

Aeroflex secures first sales in China for TM500 TD-LTE test mobile

Aeroflex has announced that it has secured a series of sales for the recently launched TD-LTE version of its market-leading TM500 test mobile from various leading suppliers of cellular mobile infrastructure equipment in China. These orders for the new TM500 TD-LTE further strengthen Aeroflex's position as the leading provider of test mobiles for LTE, HSPA and WCDMA.

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Curve tracer for parametric testing of high-speed devices

Curve tracer for parametric testing of high-speed devices

A high-speed, high-accuracy real-time V/I curve tracer that is ideally suited to carrying out DC parametric testing on semiconductor and optoelectronic devices has been introduced by Yokogawa Europe. The new compact, lightweight unit consists of the Yokogawa GS820 multichannel source measure unit and the 765670 curve tracer software, which runs on a PC connected to the GS820 via a USB link.

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TESEQ's Multifunction ESD Generator

TESEQ's Multifunction ESD Generator

TESEQ has announced the introduction of its new NSG 3040 ESD test generator. The NSG 3040 is small, smart and has a high-contrast 7in touch-screen colour display and rotary control wheel to simplify programming with simple and intuitive operation. With its open modular architecture, the NSG 3040 is the ideal immunity test system for smaller engineering laboratories. The NSG 3040 offers outstanding capabilities to demanding EMC test companies and allow simple integration into production test processes.

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National Instruments Measurement Studio 8.6 Offers Complete Support for Visual Studio 2008

National Instruments Measurement Studio 8.6 Offers Complete Support for Visual Studio 2008

National Instruments has announced Measurement Studio 8.6, which increases test and measurement functionality for Visual Studio 2008, the latest Microsoft development environment. Measurement Studio 8.6 features the industry's first complete set of .NET and C++ class libraries, tools and data acquisition and instrument control driver support for Microsoft Visual Studio 2008, Microsoft Foundation Class Library (MFC) 9.0 and the .NET Framework 3.5. Engineers using .NET can also use Measurement Studio 8.6 to support applications with select modular instruments by building benchmark applications in Visual Studio 2008.

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Keithley’s Component Test Solution Combines Ease of Use with Curve Tracer Capabilities

Keithley Instruments has announced its ACS Basic Edition, characterization and curve tracer software for component test applications. The latest addition to Keithley's powerful Automated Characterization Suite (ACS) family, ACS Basic Edition integrates with the industry's broadest range of source-measure units, Keithley's SourceMeter Instrument family. ACS Basic Edition, pared with Keithley's proven line of SourceMeter instruments, replaces obsolete curve tracers with a solution that performs both basic curve tracing as well as parametric test while providing a remarkable cost breakthrough.

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Keithley to Develop RF WiMAX Production Test Solution for Fujitsu

Keithley Instruments has announced that it is developing a WiMAX device production test solution for two 802.16e WiMAX devices from Fujitsu Microelectronics Limited. This WiMAX RF SISO/MIMO manufacturing test configuration features Keithley's award-winning RF test solutions, the Model 2820 RF Vector Signal Analyzer and Model 2920 RF Vector Signal Generator. The configuration will enable Fujitsu Microelectronics to perform a set of Tx and Rx test sequences quickly and efficiently. The system's easy expandability also will offer Fujitsu the unique ability to test its WiMAX devices in both SISO and MIMO mode.

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Tips from Tektronix for Probing Memory

Tips from Tektronix for Probing Memory

Tektronix has announced several new probe tips with signal bandwidths to 8 GHz including high temperature applications for the P7500 Series TriMode Differential Probe. The new tips are designed specifically for probing DDR2 and DDR3 memory DIMMs and are also useful for general purpose probing applications. The new accessories use socket cable technology for quick and easy attachment. The new TriMode tips provide improved usability and lower cost per solder point than existing market alternatives. With TriMode, a single probe setup attached to an oscilloscope can make differential, single-ended, and common mode measurements accurately and definitively.

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National Instruments Addresses Challenge of Memory Management in C Programming with latest LabWindows version

National Instruments Addresses Challenge of Memory Management in C Programming with latest LabWindows version

National Instruments has announced LabWindows/CVI 9.0, the latest version of the proven ANSI C development environment for building reliable test and measurement solutions. It includes an improved compiler and debugger, which speed test development and throughput, and introduces new features for real-time systems to deliver application reliability.

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Tektronix Key To Wireless USB Testing At Testronic Laboratories

Tektronix has announced that its UWB WiMedia compliance test solution has been selected by Testronic Laboratories, a leading test and certification center, to provide Wireless USB interoperability testing.

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Tektronix Provides Choice for Serial Data Link Analysis

Tektronix has announced new Serial Data Link Analysis (SDLA) Software for the DSA70000 real-time oscilloscope series to fully test high-speed serial data designs such as SATA 6 Gb/s, SuperSpeed USB, 6 Gb/s SAS and PCI-Express 3.0, from the transmitter through the receiver. The new SDLA software builds on the Tektronix history of providing link analysis and S-parameter tools for precise silicon designs with the DSA8200 sampling oscilloscopes. With SDLA software, engineers can now utilize a real-time oscilloscope to develop compliant high-speed serial designs on systems that operate as high as 8 Gb/sec.

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electronica 2008 - Telonic Instruments - Test and Measurement

Products on show will include the new PAT series of 4 and 8kW DC Programmable Power Supplies, KFM2050 Fuel Cell Impedance Analyzer, PFX2000 Battery Test System, KHA1000/3000 Harmonic/Flicker Analyzer, PLZ series of DC Electronic Loads, TOS Series of Electrical Safety Testers, PCR-M Series Frequency Converters/AC Power Supplies and the new PWR range of laboratory DC Power Supplies.

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High Performance Logic Analyzer Module from Tektronix

High Performance Logic Analyzer Module from Tektronix

Tektronix has announced the new 136-channel TLA7BC4 Logic Analyzer module for the Tektronix TLA7012 portable and TLA7016 benchtop series. The new module complements recently introduced TLA7BBx modules. With 20 ps (50 GS/s) timing resolution and up 128 Mb record length, the new TLA7BC4 module is ideal for a range of state-of-the art embedded applications including DDR3-1600 and MIPI as well as leading edge computer applications such as Intel's QuickPath Interconnect Technology.

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National Instruments Adds Instrument-Class I/O to LabVIEW FPGA Hardware

National Instruments Adds Instrument-Class I/O to LabVIEW FPGA Hardware

National Instruments has introduced a new family of open, FPGA-based hardware for the PXI platform. The NI FlexRIO product family is the industry's first commercial off-the-shelf (COTS) solution to provide engineers with the flexibility of NI LabVIEW FPGA technology combined with high-speed, instrument-class I/O. With NI FlexRIO, engineers can add custom signal processing algorithms to their PXI-based field-programmable gate array (FPGA) hardware. Then, with interchangeable adapter modules, they can directly interface the FPGA to instrument-class I/O or create their own custom front-end hardware to meet their specific application requirements. With these capabilities, engineers can employ techniques such as in-line processing, hardware-in-the-loop (HIL) simulation and protocol-aware test required during the design and testing of many complex electronic devices.

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SysNucleus releases new version of USBTrace with USB Audio class support

SysNucleus has released a new version of USBTrace, the software based USB protocol analyzer. The latest version of USBTrace supports device class decoding for USB devices which belong to the Audio device class.

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Isotropic H-field probe from Link Microtek

Isotropic H-field probe from Link Microtek

Now available from RF radiation safety specialist Link Microtek is a new isotropic H-field probe for the Narda SRM-3000 selective radiation meter – an innovative instrument that is capable of measuring emissions from each individual source within a multiple-frequency RF environment.

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Space-saving current and voltage measurement devices for hybrid and electric vehicles

Lithium-ion battery charging and discharging periods pose a great challenge for current and voltage measurement. At electronica, Isabellenhütte Heusler is presenting a sensor module (IMC) tailored to these needs. It can be completely configured according to customer requirements.

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Keithley Creates RF Communications Toolkit Software to Provide Both Signal Generation and Analysis

Keithley Creates RF Communications Toolkit Software to Provide Both Signal Generation and Analysis

Keithley Instruments has expanded its powerful SignalMeister software platform to now include RF signal analysis along with RF signal generation. First introduced in 2007, SignalMeister software is now the only software package on the market that integrates signal generation and analysis into one package for unmatched speed and simplicity. Furthermore, SignalMeister now has the capability of generating and analyzing both single-input single-output (SISO) and multiple-input multiple-output (MIMO) signals in the same environment.

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National Instruments Expands High-Speed Digitiser Product Line

National Instruments Expands High-Speed Digitiser Product Line

National Instruments has announced the expansion of its digitiser product line with the introduction of three new digitisers/PC-based oscilloscopes. The 500 MHz NI PXI-5153 and NI PCI-5153 and the 1 GHz NI PCI-5154 modules round out the NI 515x series of digitisers, following the introduction of the NI PXI-5154 in July. With the NI 515x series, engineers can take advantage of a complete line of high-speed digitisers – with 300 MHz, 500 MHz and 1 GHz bandwidths – for demanding automated test and streaming applications where high-bandwidth measurements are required.

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Aeroflex launches TM500 TD-LTE test mobile

Aeroflex launches TM500 TD-LTE test mobile

Aeroflex has launched the TM500 TD-LTE test mobile designed to support Time Division Duplex for 3G LTE (TD-LTE). Complementing Aeroflex's highly successful TM500 LTE-FDD for 3G LTE Frequency Division Duplex, which has been successfully deployed worldwide since 2007, the TM500 TD-LTE test mobile is designed to enable infrastructure equipment vendors match the demanding timescales for TD-LTE trials in China.

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Tektronix SignalVu Analyzes RF Signals Up to 20 GHz Bandwidth

Tektronix SignalVu Analyzes RF Signals Up to 20 GHz Bandwidth

Tektronix has announced SignalVu vector signal analysis software for DPO7000 and DPO/DSA70000 digital oscilloscope series, enabling engineers to easily characterize and validate wideband and microwave spectral events.

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Hermon Labs TI Introduces IP Testing Equipment

Hermon Laboratories has announced its new test equipment TCA 4100 low cost PC Based solutions is initially offering for VoIP and SIP (H.323). Both solutions are available as optional add-ons plus VQT (PESQ), and acoustic testing with HATS. SIP solution is also available as a standalone software application.

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Ubiquisys Employs Keithley RF Test Systems

Keithley Instruments has announced that its award-winning RF test solutions, including the Series 2800 RF Vector Signal Analyzers and Series 2900 RF Vector Generators, are established in production with Ubiquisys, Ltd., a leading developer of 3G femtocells. Ubiquisys has been using Keithley's RF test solutions as it ramps its femtocell production at Sony UK Tech.

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New PXI Module enables Combination JTAG/Boundary Scan and dynamic Functional Test

New PXI Module enables Combination JTAG/Boundary Scan and dynamic Functional Test

GOEPEL electronic, world class vendor of JTAG/Boundary Scan solutions compliant with IEEE Std. 1149.x, launched a new series of JTAG Digital I/O PXI modules named PXI 5396-x.

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New Boundary Scan fixture allows structural testing of PCI Express Plug-In Cards via IEEE1149.6

GOEPEL electronic, leading manufacturer of JTAG / Boundary Scan solutions compliant with IEEE1149.x, announced the launch of a new interface test fixture, CION Fixture™ /PCIe-x16, a further addition to the popular CION Fixture™ family. The new low cost fixture provides a predefined PCI Express x16 Slot, in which the card to be tested is inserted and thereby connected to a TAP (Test Access Port). Due to the integrated test channels IEEE 1149.1 and IEEE1149.6 virtually all PCI Express High Speed and Low Speed signal pins can be structurally tested if there are compatible interfaces.

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New digital mobile radio testing capabilities enable Aeroflex 3900 Series to meet DMR test standards

New digital mobile radio testing capabilities enable Aeroflex 3900 Series to meet DMR test standards

Aeroflex has announced the release of a new option that enables the Aeroflex 3900 Series Digital Radio Test Set to test and align a wide range of digital mobile radio devices. DMR, a new digital radio format replacing analog private mobile radio, offers advanced communications features specified by the European Telecommunications Standards Institute technical standard 102-361. DMR technology is currently under development or being released by a number of OEM radio manufacturers and includes Motorola's new MOTOTRBO™ technology.

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TTi adds value to RF power measurement

TTi adds value to RF power measurement

Now available from TTi is the TTi Satori range of high-performance USB based RF power measurement sensors. Their introduction follows the acquisition of the range from their original developers, Satori Technology. The initial product range will consist of the ST Series of 12.4 GHz, 18.5 GHz and 26.5 GHz USB power sensors. These devices are complete miniature power meters, each containing a CPU that controls the sensor, processes the measurement results and operates the interface.

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Keithley Introduces 50MHz Arbitrary Waveform/Function Generator

Keithley Introduces 50MHz Arbitrary Waveform/Function Generator

Keithley Instruments, Inc has introduced the Model 3390 50MHz Arbitrary Waveform/Function Generator, featuring the highest waveform resolution and best price-to-performance value in its class. The Model 3390 is a flexible, easy-to-use programmable signal generator with advanced function, pulse, and arbitrary waveform capabilities. Superior signal integrity, faster rise and fall times, lower noise, and greater waveform memory combine to provide high quality output signals. High resolution waveforms are supported by four times the waveform memory of any competitive waveform generator on the market. Keithley is offering the Model 3390 for a special introductory price.

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Tektronix Announces Test Tools for SuperSpeed USB

Tektronix has announced a comprehensive test set for the USB 3.0 specification. The high-speed serial data offering will enable customers to rapidly test their SuperSpeed USB designs.

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Aeroflex launches multi-handset test mobile

Aeroflex launches multi-handset test mobile

Aeroflex has launched an LTE version of its industry-standard TM500 multi-handset (multi-UE) test mobile designed to enable infrastructure equipment vendors accelerate the pace of their LTE development projects. At the same time Aeroflex has announced that it has won a contract to supply a major European infrastructure equipment vendor with the TM500 LTE Multi-UE test mobile.

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Philips Test Center Adopts Tektronix for HDMI

Tektronix has announced that the new Philips High-Definition Multimedia Interface (HDMI) Authorized Testing Center (ATC) in Bangalore, India has adopted the Tektronix HDMI V1.3b1 Compliance Test Solution (CTS). The adoption of Tektronix HDMI compliance test solution by Philips, one of the key founders of HDMI, reinforces Tektronix leadership for high-speed serial data and HDMI test solutions.

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National Instruments Introduces Advanced Connectivity for Multisim and LabVIEW

National Instruments Introduces Advanced Connectivity for Multisim and LabVIEW

National Instruments has announced further integration of the NI Multisim and LabVIEWplatforms. By integrating the recently released Multisim 10.1 and LabVIEW, engineers can better identify and analyse design behaviour and detect errors at the earliest stages of design. Additionally, with the beta version of the NI LabVIEW Multisim Connectivity Toolkit, engineers can now enhance circuit design.

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LeCroy Introduces USB 3.0 Protocol Analyzer Exerciser System

LeCroy Introduces USB 3.0 Protocol Analyzer Exerciser System

LeCroy Corporation has announced its Voyager verification system, said to be the world's first protocol analyzer for USB 3.0, also known as SuperSpeed USB. Using custom front-end circuitry developed in conjunction with LeCroy's 5 Gbps PCI-Express platform, the Voyager analyzer provides simultaneous protocol capture of both USB 2.0 and USB 3.0 signaling. Available with an integrated exerciser option, this sixth generation verification platform is LeCroy's complete solution for testing USB devices, systems and software.

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Tektronix Provides First Published Test Procedure for SATA Revision 3.0 Physical Layer Tests

Tektronix has announced availability of the first published test procedures for physical layer testing of the Serial ATA Revision 3.0 standard. Tektronix provides a comprehensive high-speed serial data test suite for the SATA physical layer design and debug.

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PulseCore Semiconductor Taps Tektronix USB Serial Test Suite

Tektronix has announced that PulseCore Semiconductor has successfully used a full suite of Tektronix test instrumentation to test and validate its recently announced USB 2.0 integrated circuit. The new PulseCore IC is the first in the industry to use spread spectrum clocking (SSC) to reduce electromagnetic interference while achieving USB 2.0 industry compliance.

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Keithley Launches New Instrument Platform

Keithley Launches New Instrument Platform

Keithley Instruments has announced its Series 2600A System SourceMeter Instrument family. They provide unmatched ease-of-use, measurement performance, and flexibility in order to speed time-to-market for its users, lower cost of test, and simplify the process of making high performance measurements.

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National Instruments Extends Environmental Monitoring Capabilities in LabVIEW

National Instruments has announced the release of a new instrument driver that gives users of the NI LabVIEW graphical system design platform the ability to interface with environmental monitoring sensors that communicate via SDI-12, a serial-based communication protocol optimised for battery-powered intelligent sensors. With NI LabVIEW SDI-12 Application Programming Interface (API)software, researchers, engineers and scientists can easily acquire measurements such as turbidity, dissolved oxygen, tank level, soil pH, conductivity and other critical environmental sensor measurements.

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Compact MID-compliant energy meter from Carlo Gavazzi

Compact MID-compliant energy meter from Carlo Gavazzi

Carlo Gavazzi's MID-certified and compliant family of energy meters has been enhanced by adding Dupline Fieldbus capability to the smallest and most powerful MID instrument that enables three-phase direct connection up to 65A and external CT connection up to 10A. This makes the EM24 the only such device on the market fully compatible with a complete and flexible Fieldbus system.

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BAE Systems, National Instruments and Phase Matrix Introduce 26.5 GHz PXI Synthetic Instrument

BAE Systems, National Instruments and Phase Matrix Introduce 26.5 GHz PXI Synthetic Instrument

BAE Systems, National Instruments and Phase Matrix Inc. have announced the availability of a next-generation, 26.5 GHz synthetic instrument based on the PXI platform for military and commercial RF and microwave applications. Synthetic instrumentation is a subset of virtual instrumentation that combines modular hardware with a software platform to create user-defined test and measurement systems. The new synthetic instrument developed by the companies is based on five new 3U PXI Express-compatible RF/microwave downconverter modules that can operate over a frequency range of 100 kHz to 26.5 GHz. The instrument also uses National Instruments PXI Express chassis, controllers and intermediate frequency (IF) digitiser modules as well as NI LabVIEW graphical development software for host and FPGA-based signal processing.

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TI driving forward new IEEE 1149.7 standard

As chips add new functionality and system designs evolve away from boards and toward multi-chip system-on-chip (SoC) architectures, developers of handheld and consumer electronics are faced with stricter pin and package constraints. Texas Instruments, a key member of the IEEE working group, announced that it is driving the ratification of the IEEE 1149.7 standard, a new two-pin test and debug interface standard that supports half the number of pins of the IEEE 1149.1 technology, allowing developers to easily test and debug products with complex digital circuitry, multiple CPUs and applications software in products such as mobile and handheld communication devices. In addition to leading the development and adoption of the new IEEE 1149.7 standard, TI is also working with Freescale Semiconductor, Lauterbach Datentechnik GmbH, IPExtreme, ASSET InterTech, Inc., Corelis and GlobeTech Solutions to refine and identify implementation challenges, ensuring a streamlined and robust solution is r

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NI Announces PXI Embedded Controller and New PXI System Accessories

NI Announces PXI Embedded Controller and New PXI System Accessories

National Instruments has announced the NI PXI-8108, what it says is the industry's fastest PXI embedded controller, and two new PXI system accessories, a 32 GB solid-state hard drive and the NI PXI-8250 system monitoring module. These new products provide increased system performance and reliability to help engineers and scientists achieve faster process execution, lower test times and longer system life.

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Keithley Expands MIMO RF Measurement Capabilities with 8x8 MIMO Test System

Keithley Expands MIMO RF Measurement Capabilities with 8x8 MIMO Test System

Keithley Instruments is extending its lead in RF MIMO (multiple-input, multiple-output) test with what it says is the industry's first measurement-grade 8x8 MIMO system. The system is used for primary research of next-generation RF MIMO devices and technologies.

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Low-Cost XRF Analyzer for RoHS Testing from Skyray XRF

Skyray XRF has re-designed a low-cost and compact desktop XRF model with the capability to detect lead, cadmium and other hazardous substances in finished goods. The organizations instrument line already includes a larger desktop model and a handheld portable XRF system for hazardous substance detection.

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Tektronix oscilloscopes help IZT to overcome signal integrity challenges

Tektronix has announced that the Innovationszentrum für Telekommunikationstechnik GmbH (IZT), a German manufacturer of advanced digital signal processing (DSP) technologies, has selected its DSA70000 and DPO7000 high-performance Digital Phosphor Oscilloscopes (DPOs) and P7313 Z-Active probes for testing advanced telecommunications systems that employ high-speed serial buses.

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Tektronix Accelerates Arbitrary Waveform Generators

Tektronix Accelerates Arbitrary Waveform Generators

Tektronix has announced the new AWG7000B and AWG5000B Series of Arbitrary Waveform Generators (AWG). The AWG B series provides a 20% performance boost over many of the prior AWG instruments and continues to be the world's fastest and most capable family of AWG's, designed to meet the test needs for high-speed serial data buses and wideband RF applications. With 9.6 GHz effective RF output, 10 bit resolution, and sample rates up to 24 GS/s, the AWG7000B is the only AWG that can produce high-speed serial waveforms with real life imperfections including noise, jitter, pre/de-emphasis and multi-level signaling up to 8 Gb/s. Also announced today is the radar signal creation option - RDR - for the RFXpress Software suite, offering the ultimate flexibility in creating Pulsed radar waveforms on the AWG7000B and AWG5000B.

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ACCES I/O Releases Fast USB Digital Waveform Generator Modules

ACCES I/O Releases Fast USB Digital Waveform Generator Modules

ACCES I/O Products has announced the release of its fastest USB/104 digital I/O unit to date – Model USB-DIO-16H. The unit features 16 high-speed buffered digital inputs or digital outputs at continuous, sustained streaming speeds up to 16 MB/s for fast, unlimited waveform length. The module is capable of 80 MB/s bursts with handshaking signals for synchronizing communications plus an additional 18 bits of general purpose digital I/O. The USB-DIO-16H is a port-powered high-speed USB 2.0 device and offers hot swapping functionality for quick connect/disconnect whenever you need additional I/O on your USB port.

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Aeroflex announces advanced test capabilities for its 3900 Series Digital Radio Test Set

Aeroflex has announced the release of version 1.7.4 software for the Aeroflex 3900 Series Digital Radio Test Set that includes support for Motorola's Astro SmartNet/SmartZone systems. Included in this release is support for re-banded channels in the 800MHz band. This new software is available for all Aeroflex 3900 Series products currently in the field, including the 3901, the 3902 and the new 3920 Series.

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Hand-held Aeroflex Radio Test Set

Aeroflex has announced the release of new software for its 3500 1GHz hand-held Radio Test Set to support Survey Technologies' Field Test 6 Software. Now, users of the Aeroflex 3500 Series can improve and automate the acquisition, analysis and display of signal strength across a given terrain, as well as inside buildings. Field Test 6 has expanded the drive-test measurement concept to include indoor measurement and analysis for applications where GPS is not available. The hand-held capability of the Aeroflex 3500, along with the Field Test 6 software, now allows users to map out their building or geographical areas and find any sections that contain a weak signal. Armed with this information users can improve critical communications within those areas.

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Kikusui's modular DC Electronic Loads.

Kikusui's modular DC Electronic Loads.

Kikusui's PLZ-U Series modular multifunction DC Electronic Load Series feature faster rise/fall times with variable slew rates for transient testing on high speed DC/DC convertors, DC power supplies, Batteries and Fuel Cells for both bench and system application.

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National Instruments 1 GHz Bandwidth PXI Digitiser

National Instruments 1 GHz Bandwidth PXI Digitiser

National Instruments has announced a significant bandwidth increase in its digitiser offering with the introduction of the NI PXI-5154 digitiser/PC-based oscilloscope, expanding the family of more than 20 high-speed, high-resolution and high-channel-count products. The dual-channel, 1 GHz PXI-5154 digitiser offers up to a 2 GS/s real-time sample rate (20 GS/s equivalent-time sample rate for repetitive signals), making it ideal for acquisition and characterisation of fast, nanosecond-edge speeds.

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Keithley's Guide to Wireless and RF Testing

Keithley's Guide to Wireless and RF Testing

Keithley Instruments has announced the availability of Advanced Measurement Techniques for OFDM- and MIMO-based Radio Systems: Demystifying WLAN and WiMAX Testing, a new guide to wireless and RF testing. This CD contains useful and informative RF testing resources, including application notes, articles, white papers, and product demonstrations, to help engineers reduce their cost of test by simplifying and solving the most challenging RF measurement applications.

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Benchtop power analyser from Yokogawa

Benchtop power analyser from Yokogawa

The Yokogawa WT500 is a compact benchtop power analyser which can carry out DC or single- and three-phase AC measurements at voltages of up to 1000 V and currents up to 40 A. With a basic voltage, current and power accuracy of ±0.2% and a frequency range of DC and 0.5 Hz to 100 kHz, the new instrument features a 5.7-inch colour LCD display for showing numerical, waveform and harmonic data. Extensive harmonic measurement capabilities are also available as an option.

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Compact ESD Simulator from Teseq

Compact ESD Simulator from Teseq

TESEQ has announced the introduction of its latest hand held ESD simulator. The new NSG 434 is a compact and cost effective solution for air discharge testing up to 8KV and contact testing up to 6KV. Offering a saving of up to 30% over higher performance models the NSG 434 will provide testing to meet around 95% of all commonly required standards.

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China’s MTNet test lab standardises on Aeroflex equipment for CDMA 1xEV-DO Rev A and A-GPS test

MTNet, the CCF accredited conformance test lab established within the Ministry of Information Industries of the People's Republic of China, has standardised on the Aeroflex 6402 AIME CDMA test platform for 1xEV-DO Rev A and A-GPS testing. MTNet selected Aeroflex following a recent public tender to upgrade its CDMA test capability to include 1xEV-DO Rev A protocol testing and A-GPS protocol and minimum performance testing.

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Upgrade for Model 4200-SCS Semiconductor Characterization System Expands C‑V, I-V, and Pulsed I-V Characterization

Upgrade for Model 4200-SCS Semiconductor Characterization System Expands C‑V, I-V, and Pulsed I-V Characterization

Keithley Instruments has introduced Keithley Test Environment Interactive (KTEI) V7.1 for the company's award-winning Model 4200-SCS Semiconductor Characterization System. This software upgrade includes support for testing higher power semiconductor devices. With support for low-level device characterization through higher power devices, the Model 4200-SCS is the most complete semiconductor characterization analyzer on the market, making tough measurements easy and lowering the cost of test by protecting capital equipment investment.

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Miniature Spectrometer Modules from Hamamatsu Photonics

Miniature Spectrometer Modules from Hamamatsu Photonics

Hamamatsu Photonics has introduced a 1 inch cube miniature spectrometer module, the RC series. These new miniature spectrometer modules are ideal for use in small, hand held sensor products and instruments. Applications include visible spectroscopy, industrial process control, environmental monitoring, colour measurement, blood analysis, water pollution monitoring, food inspection and many more analytical and biotechnology applications.

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NI Expands Test Data Management and Visualisation

NI Expands Test Data Management and Visualisation

National Instruments has announced the release of DIAdem 11.0, the latest version of the interactive software for managing, analysing and reporting test data. DIAdem 11.0 adds sensor data mapping for 3D CAD models to simplify the visualisation of high-channel-count systems. It also streamlines large-group test management with automatic conversion and scaling of engineering unit sets. Additionally, NI DataFinder Server Edition 2.0, a software solution that works with DIAdem to extend test data management to large groups or departments, introduces support for user security management and integration with an electronic archiving system.

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Arbitrary waveform software from TTi can be imported

Arbitrary waveform software from TTi can be imported

The latest version of Waveform Manager Plus, the arbitrary waveform creation and editing program from TTi, supports importing of waveforms created by other instruments such as oscilloscopes. The import function supports any waveform that can be described by a set of Y-axis data points, regardless of their format - which can be fixed point, floating point or exponent format, positive or negative, with any amplitude and resolution.

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Leakage current tester from Kikusui

Leakage current tester from Kikusui

Kikusui has added a Leakage Current Tester - the TOS3200 - to its range of Electrical Safety Testers. The TOS3200 measures touch and protective conductor current on general electrical equipment in conformance to IEC 60990 and other international standards.

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DC electronic load from TTi

DC electronic load from TTi

TTi has updated the LD300 low-cost electronic load to improve its performance at high currents. A low-voltage dropout facility is provided to protect sources such as batteries from damaging levels of discharge when the source voltage falls below the user-selectable voltage dropout threshold.

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Aeroflex adds new 3GHz Modular Digital RF Signal Generator to PXI 3000 Series comprehensive RF test platform

Aeroflex adds new 3GHz Modular Digital RF Signal Generator to PXI 3000 Series comprehensive RF test platform

Aeroflex has announced the 3020C PXI Modular Digital RF Signal Generator, a new 3GHz variant to the growing PXI signal generator line. Aeroflex's comprehensive modular RF test platform, the PXI 3000 Series, has the bandwidth and versatility to seamlessly cover the entire RF test process – from R&D through to manufacturing – in any wireless market from cellular to military/aerospace to RFIC.

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Keithley Adds WiMAX Testing Capability to its RF Test Instrument Family

Keithley Adds WiMAX Testing Capability to its RF Test Instrument Family

Keithley Instruments, Inc. today announced a set of signal creation and analysis tools that extend its RF test capabilities to include WiMAX signal testing. Keithley's new solution is built on a next-generation hardware platform that makes it simple and inexpensive to add support for new signal standards, such as 802.16e mobile WiMAX Wave 2 testing with up to 4x4 MIMO channels, without requiring expensive hardware upgrades or different instrumentation. In addition, the new instruments support testing to lower frequency bands down to 400MHz, an increasingly important capability for new WiMAX solutions being developed.

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National Instruments Introduces New LabVIEW Toolkit for GPS Receiver Testing

National Instruments Introduces New LabVIEW Toolkit for GPS Receiver Testing

National Instruments has announced the NI GPS Toolkit for LabVIEW, an extension of the graphical system design environment that expands the NI RF PXI platform to include multi-satellite GPS signal simulation. Using NI LabVIEW software to create waveforms that simulate up to 12 satellites (C/A codes in the L1 band), engineers can test receiver characteristics such as sensitivity, time to first fix (TTFF) and position accuracy with the NI PXIe-5672 RF vector signal generator.

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New Programmable Electrical Safety Testers

New Programmable Electrical Safety Testers

Telonic Instruments has announced the introduction of Kikusui's latest TOS9200 Series of Withstanding Voltage / Insulation Testers the most sophisticated in their range of electrical safety test equipment intended for production test applications.

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Keithley and Azimuth Systems Collaborate to Create LTE, WiMAX RF Testing Solutions

Keithley Instruments has announced a joint effort with Azimuth Systems, a leading provider of wireless broadband test equipment and channel emulators for WiMAX, 4G, and Wi-Fi (Acton, MA). Keithley is working with Azimuth Systems to deliver critical end-to-end MIMO RF test solutions to mobile handset manufacturers, infrastructure vendors, and service providers for next-generation LTE and WiMAX testing. Keithley and Azimuth will jointly discuss the solution at the WiMAX Forum Global Congress in Amsterdam, The Netherlands at 1:15 PM on June 17, 2008.

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Digital Thermometer Hits Target for Fresh Cement and Concrete Temperature

Digital Thermometer Hits Target for Fresh Cement and Concrete Temperature

The CT2040 Digital Thermometer and probe meets the requirements of ASTM C1064 for measuring the temperature of fresh hydraulic-cement concrete. It is also useful for many other application.

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Radio Telemetry for Strain Gauge Devices from Celsum

Radio Telemetry for Strain Gauge Devices from Celsum

The T24-SA is a high performance strain gauge to radio telemetry converter module, offering precision measurement with high performance two-way telemetry. Usable around the globe on licence-free 2.4 GHz frequency, the T24 range avoids local radio interference to ensure data integrity and security. For use in any measuring applications, from torque to weight, vibration to flow, the T24 offers users a complete solution to your measurement requirements.

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Flying Probe System for low-cost, flexible fixtureless test from Aeroflex

Flying Probe System for low-cost, flexible fixtureless test from Aeroflex

Aeroflex has introduced the 4520 stand-alone Flying Probe System, a quick, easy and flexible solution to meet a variety of Printed Circuit Board (PCB) testing needs. Designed to perform high-speed, high-accuracy fixtureless test in a stand-alone platform, the Aeroflex 4520 offers users all the benefits of the popular 4550 in-line Flying Probe System, at a lower entry cost.

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Compact FieldPoint Controllers from NI

Compact FieldPoint Controllers from NI

National Instruments (NI) has announced the release of three new Compact FieldPoint controllers that deliver increased performance, higher processor speed and significantly improved Ethernet throughput. The NI cFP-2220, cFP-2210 and cFP-2200 controllers include a 400 MHz PowerPC processor and Wind River VxWorks real-time operating system (RTOS) for greater processing power and faster data analysis.

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NI Accelerates Parallel Test Performance with Multicore Support

NI Accelerates Parallel Test Performance with Multicore Support

National Instruments has announced NI TestStand 4.1, the latest version of the company's test management software, which now helps engineers develop faster test systems with multicore processor support. As manufacturers shift to multicore processors to provide performance gains, NI TestStand 4.1 running on these new processors can deliver more powerful systems with increased test throughput. With the new NI Switch Executive 3.0, developers can more quickly develop parallel test systems in NI TestStand by graphically specifying switch signal routes.

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NI Measurement Studio 8.5 Accelerates Remote Monitoring and Control

NI Measurement Studio 8.5 Accelerates Remote Monitoring and Control

National Instruments has announced Measurement Studio 8.5 to add test and measurement functionality to the latest Microsoft development environment with a complete set of .NET class libraries, tools and NI data acquisition driver support for Microsoft Visual Studio 2008. Measurement Studio 8.5 includes ASP.NET AJAX-compatible user interface controls and advanced network variable communication functions for creating highly responsive remote monitoring Web applications.

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Optical transport analyser for 40 Gbit/s SONET/SDH and 43/44 Gbit/s OTN transmission testing

Optical transport analyser for 40 Gbit/s SONET/SDH and 43/44 Gbit/s OTN transmission testing

The new Yokogawa NX4000 is a transport analyser for the testing of 40 Gbit/s SONET/SDH and 43/44 Gbit/s OTN optical communication systems. With optical line rates now being deployed at 40 Gbit/s and faster, many manufacturers are starting to ramp up their own 40G+ designs for Next Generation Networks (NGNs), and growth in this segment of optical communications is quickly rising.

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Semiconductor Device Test Applications CD from Keithley Semiconductor

Semiconductor Device Test Applications CD from Keithley Semiconductor

Keithley Instruments has announced the availability of its Semiconductor Device Test Applications Guide. In addition to the Applications Guide, this CD also includes a large variety of semiconductor test application information such as applications notes, white papers, and presentations that enables users to reduce their cost of test while simplifying the most challenging applications.

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Keithley Releases New Edition of Switching Handbook

Keithley Releases New Edition of Switching Handbook

Keithley Instruments has released the sixth edition of its Switching Handbook: A Guide to Signal Switching in Automated Test Systems. At more than 180 pages, this newest handbook covers the fundamentals of the switching function in test and measurement applications, providing useful, tutorial information on how to optimize switching test systems.

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High-frequency differential probe for vehicle serial buses

High-frequency differential probe for vehicle serial buses

The new Yokogawa PBDH1000 is a high-frequency differential probe designed to meet the challenges involved in the development and testing of in-vehicle buses such as CAN and FlexRay. The new probe, which is intended for use with the Yokogawa DL9000 Series of oscilloscopes or the SB5000 range of serial bus analysers, has a frequency bandwidth of DC to 1 GHz (-3dB or more), an attenuation ratio of 50:1 and a DC accuracy within ±2%.

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Sensor Modules for direct measurement of current, voltage and temperature

Sensor Modules for direct measurement of current, voltage and temperature

Isabellenhütte's IMC and IMS sensor modules have been developed for all areas of use in which large currents, voltages and temperatures have to be measured with high precision.

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SysNucleus releases new version of USBTrace with Wireless USB support

SysNucleus USBTrace is a software-based USB protocol analyzing tool. The tool helps USB firmware, device driver developers and test engineers to sniff the USB bus during the device development stage. USB requests passing through various layers of the USB device stack are captured and displayed in easily readable format.

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Aeroflex announces early availability of its test suite for the C.S0044-A specification

Aeroflex has further enhanced its comprehensive support for CDG Stage II interoperability and CDG Stage I signalling conformance testing with the early availability of a test suite for the C.S0044-A specification.

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NI LabVIEW SignalExpress Tektronix Edition 2.5 Adds Support for New DPO3000 Oscilloscopes

NI LabVIEW SignalExpress Tektronix Edition 2.5 Adds Support for New DPO3000 Oscilloscopes

National Instruments has announced support for new Tektronix value line oscilloscopes in the latest version of LabVIEW SignalExpress Tektronix Edition, an interactive PC-based measurement software for quickly acquiring, analysing and presenting data without programming.

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Low-Cost PXI Embedded Controllers for Test, Measurement and Control Applications from NI

Low-Cost PXI Embedded Controllers for Test, Measurement and Control Applications from NI

National Instruments has announced two new low-cost embedded controllers – the PXI-8104 and PXI-8183 – that deliver exceptional performance for value-based test, measurement and control applications. With these new controllers, engineers and scientists can apply PXI in a variety of new applications across many industries including consumer electronics, automotive, semiconductor, telecommunications and aerospace and defense.

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Universal Cable Test Kit for Wi-Fi and Broadband Applications

Universal Cable Test Kit for Wi-Fi and Broadband Applications

Wireless, Wi-Fi and Broadband infrastructure installation requires cables for RF and data throughput. Testing these cable assemblies in the field can be difficult with the variety of unique connectors available today as well as the popular reverse polarity styles. The RFA-4028-WIFI kit by RF Connectors, a division of RF Industries, simplifies the task.

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CETECOM introduces a FACTSware based A-GPS test solution

CETECOM introduces a FACTSware based A-GPS test solution

CETECOM has developed and introduced a new member of the FACTSware test platform family (TP86). The RF performance test cases which are required by GCF and PTCRB for A-GPS (Assisted Global Positioning System) have been implemented so that this new A-GPS test solution enables testing according to the 3GPP Test Specifications TS 34.171 (A-GPS Minimum Performance) and TS 51.010-1.

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Arbitrary/function generator offers 40 V peak-to-peak amplitude

Arbitrary/function generator offers 40 V peak-to-peak amplitude

The AFG3011 arbitrary/function generator is the latest addition to the Tektronix AFG3000 Series of signal sources for design, test, and manufacturing engineers. While the vast majority of arbitrary/function generators provide a maximum of 10 V p-p amplitude into 50-ohm loads, a number of applications – particularly in automotive and power electronics design - require higher amplitudes.

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National Instruments UK & Ireland Among Industry Leaders at Test & Measurement Design Day

National Instruments will join fellow industry leaders including Agilent, Anritsu, Tektronix, QualiSystems and Yokogawa, at the New Electronics Test & Measurement Design Day. Taking place at Reading's Madejski Stadium on Thursday 15th May 2008, the one day conference and exhibition will focus on next generation test solutions, covering three technology based streams: wireless test, embedded test and software related issues.

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Compact Tacho & Frequency Meter

Compact Tacho & Frequency Meter

The new PICA100-F tacho meter and frequency meter is now available from sensing & instrumentation specialists Vydas International Marketing. The PICA100F is a compact 1/32 DIN size and is designed for measuring frequencies, velocities in r.p.m. or lineal and is totally programmable. Manufactured by Ditel the instrument is one of the KOSMOS series of digital panel meters.

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Aeroflex announces industry’s first reconfigurable avionics test platform - Avionics Test Bench and Avionics Test Studio

Aeroflex announces industry’s first reconfigurable avionics test platform - Avionics Test Bench and Avionics Test Studio

Aeroflex has announced the introduction of Avionics Test Bench and Avionics Test Studio, the first reconfigurable PXI-based test platform for avionics navigation and communications. Unlike stand-alone bench instruments, Aeroflex's new avionics test system addresses test compatibility by leveraging PXI's common platform and flexibility.

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National Instruments LabVIEW Targets Industry-Leading ARM Microcontrollers

National Instruments LabVIEW Targets Industry-Leading ARM Microcontrollers

National Instruments and ARM has announced the NI LabVIEW Embedded Module for ARM Microcontrollers, an extension of the LabVIEW graphical system design platform that directly targets the ARM 7™, ARM 9™ and Cortex™-M3 microcontroller families. The module is the first product in an ongoing collaboration between the companies that combines the ease of use of LabVIEW with the performance of ARM microcontrollers.

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Self-Contained true-RMS Ammeters provide compact and easy-to-use solution for measurement of non-sinusoidal AC currents

Self-Contained true-RMS Ammeters provide compact and easy-to-use solution for measurement of non-sinusoidal AC currents

Murata Power Solution's new Datel ACA-20RM series are the world's first true-RMS responding digital AC ammeters with built-in current transformers (CTs). They are able to provide direct measurement of the true-RMS values of complex, non-sinusoidal AC currents of between 2A and 50A. Ideal for use in the latest computer and telecoms equipment, the compact, self-powered, single-board modules feature a large, easy-to-read LED display and provide an ideal replacement for older, less reliable, analog panel meters.

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European calibration service for high-frequency AC power measurements

European calibration service for high-frequency AC power measurements

A new calibration service for high-frequency AC power measurements is now being offered by Yokogawa Europe through its Calibration Centre in Amersfoort, The Netherlands. Based on the development of Yokogawa's WT3000 precision power analyser the Yokogawa Europe calibration service offers power calibration at DC and AC from 0.1 Hz to 100 kHz. This calibration is traceable to international standards by the accredited NMi (Nederlands Meetinstituut) in Delft and the JEMIC Institute in Japan.

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National Instruments Expands C Series Family for High-Performance Data Logging

National Instruments Expands C Series Family for High-Performance Data Logging

National Instruments has announced four C Series modules for data-logging applications including vibration/acoustical data logging and in-vehicle, structural, temperature and pressure testing. The NI USB-9219, USB-9229 and USB-9239 provide USB, bus-powered connectivity to the C Series while the NI 9234 AC/DC-coupled dynamic signal acquisition module offers selectable IEPE signal conditioning for engineers measuring high-accuracy audio frequency.

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LeCroy Extends Automotive Testing with Physical Layer Test Tool

LeCroy Extends Automotive Testing with Physical Layer Test Tool

LeCroy Corporation has introduced a FlexRay physical layer test package that provides eye diagram mask testing and physical layer measurement parameters. These new capabilities combine with LeCroy's existing FlexRay protocol trigger and decode tools, to make the WaveRunner Xi oscilloscope the most comprehensive oscilloscope-based solution for FlexRay testing available.

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Analogue PID controller allows easy user configuration

Analogue PID controller allows easy user configuration

The new SIM960 analogue PID controller is the latest addition to the SRS SIM (Small Instrumentation Modules) family. SIM is a robust, flexible platform in which up to eight high-performance instruments share the same compact mainframe and computer interface. Unlike other modular systems, both front-panel and computer operation is possible. SIM provides the functionality that users need while avoiding the cost of unnecessary features. Users can configure their own systems from a broad and growing selection of modules.

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Spectrum analyser offers free software upgrade

Spectrum analyser offers free software upgrade

TTi (Thurlby Thandar Instruments) has extended the feature set of its successful PSA1301T handheld RF spectrum analyser by upgrading the PSAnalyzer software application. Owners of earlier PSA1301T instruments with version 1 software can download version 2 of PSAnalyzer free of charge from the TTi website.

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Aeroflex now supports W-CDMA A-GPS conformance testing

Aeroflex now supports W-CDMA A-GPS conformance testing

Delivering complete support for W-CDMA A-GPS conformance testing, Aeroflex has announced that the Aeroflex 6401 AIME A-GPS is the only test platform available that supports the industry-standard TTCN A-GPS protocol test cases as well as the Minimum Performance tests and the OMA (Open Mobile Alliance) SUPL V1.0 (Secure User Plane Location) conformance tests, as mandated by the Global Certification Forum (GCF) and PTCRB handset certification bodies.

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Test system from Aeroflex provides complete visibility into the lowest layers of the radio modem

Test system from Aeroflex provides complete visibility into the lowest layers of the radio modem

Aeroflex has introduced the TM500 LTE test mobile designed to address the challenges of 3GPP LTE (3G Long Term Evolution) network infrastructure development test and roll-out. The TM500 LTE's extensive Layer 1, Layer 2 and higher layer test features make it an indispensable testing peer that provides complete visibility into even the lowest layers of the radio modem by generating the detailed diagnostic data needed for engineers to verify the required functionality and optimise network operation and performance.

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RF spectrum analyzer option for the 3500 hand-held radio test set

Aeroflex has announced the release of a new RF spectrum analyzer option for the 3500 hand-held 1GHz radio test set. The new spectrum analyzer option now allows users to see the signal they are receiving instead of just the frequency. In addition, the 3500 will have P25 parametric test capabilities by summer 2008, making it even more versatile.

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High speed audio testing against limits

High speed audio testing against limits

The AP High Speed Tester (HST) application is now available for use with the Audio Precision AP2700 Series audio analyser. The new application was originally developed to test playback only devices on the production line. The objective was a fast, accurate and easy-to-operate test station with a limited graphical user interface that displayed just test results and had the ability to save results to a log file.

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NI Introduces the First Power Source Measure Unit for PXI and Highest-Density PXI Switches

NI Introduces the First Power Source Measure Unit for PXI and Highest-Density PXI Switches

National Instruments has announced its first PXI source measure unit (SMU) and the industry's highest-density PXI switches. These products further enhance the PXI platform for use in precision DC applications, such as semiconductor parametric tests and electronic device and component validation. Engineers can use these modules together to precisely characterise voltage and current parameters on high pin-count devices, with the advantages of smaller size and lower cost compared to traditional approaches.

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Super fast counter timer streams ahead

Super fast counter timer streams ahead

Just announced by Aspen Electronics, is the availability of the Pendulum Instruments CNT-91, the world's most powerful timer/counter/analyser available on the market today.

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Keithley Partners with Stratosphere Solutions to Enable Advanced Process Characterization at Sub-65nm

Keithley Partners with Stratosphere Solutions to Enable Advanced Process Characterization at Sub-65nm

Keithley Instruments has announced a partnership with Stratosphere Solutions, a provider of innovative parametric yield improvement solutions for integrated circuit manufacturers. Keithley's partnership with Stratosphere Solutions will address advanced process development and monitoring using an Array TEG (test element group) technology.

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NI Extends Portable Measurement Performance with USB Digitisers and a Digital Multimeter

NI Extends Portable Measurement Performance with USB Digitisers and a Digital Multimeter

National Instruments has announced the release of the NI USB-5132/5133 digitisers and the NI USB-4065 6½-digit digital multimeter (DMM). These small, lightweight instruments feature bus-powered and plug-and-play operation, which makes them ideal for portable, benchtop and OEM applications. They are also shipped with NI LabVIEW SignalExpress LE, an interactive measurement workbench for quickly acquiring, analysing and presenting data, with no programming required.

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Comsys and Agilent Technologies optimizing chipset test to speed Mobile WiMAX handset production

Comsys Communications and Signal Processing and Agilent Technologies have announced a collaboration under which the Agilent N8300A Wireless Networking test set will be used to help roll out Mobile WiMAX compliant chip sets. The two companies will work together on the speed-optimization of RF power-calibration and production-test systems for Mobile WiMAX modules. With Agilent's support of Comsys chipsets, modules based on Comsys ICs can be calibrated and tested with the greatest speed and efficiency.

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Tektronix Builds Serial ATA Compliance Test Solution Using NI TestStand

Tektronix Builds Serial ATA Compliance Test Solution Using NI TestStand

National Instruments has announced that Tektronix built its newly released TekExpress SATA (Serial ATA) automated compliance test solution on NI TestStand test management software. NI TestStand gave Tektronix an open, flexible development platform that facilitated the implementation of the TekExpress compliance test automation framework for Serial ATA and other complex serial data standards. With the ability to execute test modules in any programming language, a feature of NI TestStand, the TekExpress development team built a framework that can use the best programming language for each test module and seamlessly integrate multiple programming languages. The NI TestStand high-speed execution engine helped the TekExpress SATA solution reduce compliance test time by approximately 70 percent.

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A-GPS RF performance testing with Spirent’s UMTS Location Test System

A-GPS RF performance testing with Spirent’s UMTS Location Test System

CETECOM has added RF performance tests for A-GPS (Assisted Global Positioning System) to its portfolio and has therefore expanded its testing equipment by selecting Spirent Communications' UMTS Location Test System (ULTS).

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Software provides unprecedented simulation and analysis of complex communications environments

Signal Safari v7.0, the latest evolution in a line of Aeroflex Signal Safari software, enables advanced analysis of complex communications signal environments. Signal Safari software is designed for use with Aeroflex broadband measurement instruments, including broadband signal and environment generators, analyzers, channel simulators and analysis workstations. This new version of Signal Safari software provides complete multi-dimensional testing operations and advanced analysis and data generation capabilities for complex wireless communication research and development, microwave testing, signal analysis and satellite communication link test.

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2008 Test and Measurement Product Guide from Keithley

2008 Test and Measurement Product Guide from Keithley

Keithley Instruments has announced its 2008 Test and Measurement Product Guide. This handy product guide offers details and specifications on Keithley's general-purpose and sensitive sourcing and measurement products, DC switching, RF switching and measurement, data acquisition solutions, semiconductor test systems, and optoelectronics test hardware. Tutorials simplify choosing solutions for specific applications.

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Guide provides overview to Low Resistance Measurement

Guide provides overview to Low Resistance Measurement

Cropico has published a new illustrative guide providing an overview of low resistance measurement techniques, common causes of errors and advice on how to avoid them. The free colour 34-page 'Guide to Low Resistance Measurement' features tables of wire and cable characteristics, temperature coefficients and formulae to enable the user to select the appropriate measuring instrument and measurement technique.

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Digital Metering System has Ethernet communication module

Digital Metering System has Ethernet communication module

The range of low profile multi-function Crompton Instruments Integra 1630 digital metering systems (DMS) from Tyco Electronics' Energy Division has been expanded featuring a new model with Ethernet communication module supporting connection to SCADA systems using the BACnet/IP protocol (ANSI/ASHRAE 135 - 1995 Annex J).

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T&M Industry turns to Software-Defined Instrumentation and Use of Multicore-Enabled Test Systems says NI

Test engineers in industries ranging from aerospace and defence to consumer electronics are facing the challenge of testing increasingly complicated designs with shrinking timelines and budgets. To address these issues, engineers and scientists are incorporating new test and measurement technologies that are capable of meeting complex design requirements without raising costs. National Instruments has identified five trends it anticipates will significantly influence the test and measurement industry over the next three years.

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Aeroflex adds Wideband AMR support to its 6113 basestation protocol test system

Aeroflex adds Wideband AMR support to its 6113 basestation protocol test system

Aeroflex has announced the addition of Wideband AMR (Wideband Adaptive Multi-Rate) support to its highly successful 6113 AIME basestation protocol test system. The new test capability relates to the 3GPP TS45.003 test specification. The new Wideband AMR codecs (TCH/WFS12.65, TCH/WFS8.85, TCH/WFS6.60) build on existing narrow band AMR technology and their introduction will significantly improve the quality of voice services due to the wider speech bandwidth used.

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Software package provides test and simulation for CAN/FMS systems

Software package provides test and simulation for CAN/FMS systems

The PCAN-FMS Toolkit from Computer Solutions is a new software package designed to carry out test and simulation functions on the CAN Bus Fleet Management System (FMS) protocols used by truck and bus manufacturers. The FMS protocols (FMS and Bus-FMS ISO 11992-1) are used by a number of leading bus and truck manufacturers to provide interoperability of systems installed on commercial vehicles and buses. They include a standard set of addresses and layouts for CAN messages used in these industries.

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Keithley Software Offers New Parallel Test and Parametric Die Sort Features for Higher Throughput

Keithley Instruments has announced the availability of ACS (Automated Characterization Suite) V3.2 software for semiconductor test and characterization at the device, wafer, and cassette level. Version 3.2 further enhances the powerful automation capabilities of ACS integrated test systems by adding more powerful multi-site parallel test capabilities, results binning for die sort applications, new wafer level plotting capabilities, and support for Keithley's new Models 2635 and 2636 System SourceMeter instruments with 1fA current measurement resolution. These new capabilities supply the most cost effective combination available for high levels of test flexibility and throughput – including unattended operation in both lab and production settings.

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TEM cells said to be ideal for calibrating field strength meters

TEM cells said to be ideal for calibrating field strength meters

The Engineering Division of Link Microtek has expanded its line-up of TEM cells with a range of models specifically designed for the testing or calibration of field strength meters, monitors or probes. Suitable for incorporating within an ATE system, the TEM cells feature an equipment support tray positioned at the correct height for measurement, a side access screened door to enable equipment to be placed inside the unit, and top and side ports to allow access for cables.

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RF measurement facility reduces system development time for customers

RF measurement facility reduces system development time for customers

Murata Europe has announced the opening of its SAW filter and resonator measurement facility in Milan, Italy. The measurement facility has a team of RF engineers to support designers at all stages of their RF projects in the 300, 400 and 800MHz ISM bands. The facility provides application notes, reference designs and testing services for customers' own prototypes.

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Vehicle serial bus analyser performs waveform measurement and protocol analysis

Vehicle serial bus analyser performs waveform measurement and protocol analysis

The Yokogawa SB5000 is a new oscilloscope-based serial bus analyser focused on in-vehicle serial bus protocols including FlexRay, CAN and LIN as well as providing UART, I2C and SPI trigger and analysis capabilities. The new instrument allows users to perform protocol analysis and physical layer waveform measurements simultaneously, offering the capability to debug and troubleshoot bus problems due to noise, signal quality, timing and data errors. Users can efficiently evaluate the performance and verify the operation of ECUs (engine control units) and onboard semiconductor devices, as well as measuring test parameters and their conformity.

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Aeroflex enhances conformance test systems for A-GPS location services

Aeroflex has announced that it is enhancing its 6103 and 6401 A-GPS conformance test systems for location-based services with support for the Open Mobile Alliance Secure User Plane (OMA SUPL) 1.0. The Aeroflex 6103 and 6401 provide A-GPS conformance test within GSM/E-GPRS and UMTS environments respectively. The relevant test cases have completed development and are being progressively submitted for approval at both the Global Certification Forum (GCF) and the PCS Type Certification Review Board (PTCRB), the globally recognised certification organisations whose aim is to ensure mobile equipment interoperability.

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Multifunction protocol tester is USB 3.0 ready

Multifunction protocol tester is USB 3.0 ready

The new Ellisys USB Explorer 260 (EX260), now available in the UK from Computer Solutions, is a multifunction test generator and protocol analyser for the automated compliance testing of USB systems, including the ability to handle the forthcoming USB 3.0 'super-speed' transfers at 5 Gbit/s. The EX260 can analyse any USB 1.1 or USB 2.0 connection, including OTG and IC-USB systems, emulate USB hosts and devices, inject pre-defined error patterns for stress and error-recovery testing, and automatically verify compliance to the USB specification.

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Wideband power sensor for radar and digital communications testing to 18 GHz

Wideband power sensor for radar and digital communications testing to 18 GHz

The new Rohde & Schwarz NRP-Z81 wideband power sensor is available from TTi. The NRP-Z81 operates from 50 MHz to 18 GHz and offers all the functionality of a conventional peak power meter and more within the small housing of a power sensor. It can be operated using the R&S NRP power meter base unit, or any Windows PC using the R&S NRP-Z3 or Z4 USB adaptors.

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10m Chamber is the UK’S largest CISPR 16 Semi Anechoic Chamber says 3C

10m Chamber is the UK’S largest CISPR 16 Semi Anechoic Chamber says 3C

The picture shows that even the largest Earthmoving equipment has no problem fitting into 3C Test's 10m Chamber. 3C reckon it's the UK'S largest CISPR 16 Semi Anechoic Chamber custom built and designed for Commercial use.

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Aeroflex adds A5/3 encryption support to its 6113 basestation tester

Aeroflex adds A5/3 encryption support to its 6113 basestation tester

Aeroflex has announced that it has added a new option to its highly successful 6113 basestation tester for the test of GSM basestations with an A5/3 encryption capability. The Aeroflex 6113's support for the latest A5/3 GSM encryption algorithm provides a field portable and easy-to-use basestation test solution that can be used for installation and commissioning, routine maintenance and fault finding as well as final unit production testing. Support for the A5/3 encryption algorithm complements the Aeroflex 6113's support for the existing A5/1 and A5/2 algorithms.

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PCI Express card family with 4-channel 50 MS/s 8-bit digitizer / oscilloscope

Strategic Test Corp has announced two new 8-bit digitizer / oscilloscope PCI Express cards. The UF2e-2020 has two 50 MS/s channels, while the UF2e-2021 has four 50 MS/s. Each channel has its own 8-bit ADC for simultaneous sampling, seven programmable input voltage ranges from ±50 mV to ± 5 V, offset adjustment to 400% and both 50 Ohm and 1 MOhm input impedances. Unique features of the UF2e-2020 and UF2e-2021 include the option for dual-timebase sampling, synchronous digital inputs, asynchronous digital I/O and the ability to synchronize up to 542 channels.

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Hawco releases Relative Humidity Sensors and Transmitters from Rense Michell

Hawco releases Relative Humidity Sensors and Transmitters from Rense Michell

Available from Hawco, new Relative Humidity (RH) Sensors and Transmitters from the Rense Michell range includes transmitters, hand-held devices, calibrators and more. The excellent technical specifications and after sales back-up enable both OEM designs and complete customised humidity solutions to be realized.

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Entry-level energy meter from Carlo Gavazzi is MID-certified

Entry-level energy meter from Carlo Gavazzi is MID-certified

Carlo Gavazzi's latest MID-certified energy meter offers a solution for single-phase applications where sub-metering is required. Fully certified in compliance with the MID (Measuring Instruments Directive) Annex MI-003, the EM10-DIN fulfils all the directive's accuracy, reliability and safety requirements, and has anti-tamper features enabling billing, cost allocation and sharing measurements to conform to EU and national regulations.

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Resistance Decade Boxes from Cropico feature high accuracy

Resistance Decade Boxes from Cropico feature high accuracy

Precision measurement specialist Cropico, part of the Seaward Group, has introduced a versatile range of resistance decade boxes. The company's range includes a series of 5, 6 and 8 decade boxes which have been designed to provide highly accurate and variable standard values of resistance and current for calibration, comparison and test applications in the electronics design laboratory or maintenance workshop.

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Measurement Accuracy and Reliability improved with NI LabVIEW SignalExpress 2.5

Measurement Accuracy and Reliability improved with NI LabVIEW SignalExpress 2.5

National Instruments has announced the release of LabVIEW SignalExpress 2.5, the interactive measurement software that simplifies the acquisition, analysis and presentation of data from hundreds of data acquisition devices and instruments. Built on NI LabVIEW graphical programming, LabVIEW SignalExpress delivers an easy-to-use, drag-and-drop environment for configuring data-logging and instrument control applications. The latest version of LabVIEW SignalExpress introduces several performance improvements including a Project Analyser to help engineers and scientists identify and address common measurement mistakes. LabVIEW SignalExpress 2.5 is also available in fully localised French, German and Japanese versions.

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8G Fibre Channel Load Tester for Storage Area Networks from Finisar

Finisar Corporation has announced the availability of its new XgigÒ 8G Fibre Channel Load Tester. The Xgig platform is used by developers and SAN architects worldwide to test, analyze, and validate the performance of the entire spectrum of Fibre Channel SAN equipment, ranging from chips to large scale systems. With this new load tester Finisar now provides full line-rate load testing for the new generation of 8 Gb/s Fibre Channel products. This load testing is accomplished using Finisar's industry-leading Xgig Test and Development Platform, supplemented by the industry's most comprehensive suite of SAN testing and protocol analysis capabilities.

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Switch probe for rear assembly

Switch probe for rear assembly

Peak Test Services has introduced a new version of the P201/G switch probe that has been specially designed for rear assembly in applications such as multi-level modules and fixtures. The rear assembly allows efficient, simple and quick replacement, with the probe being screwed into the receptacle from below without having to dismantle the fixture or module.

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National Instruments and Anritsu Collaborate on NI LabVIEW, LabWindows/CVI Instrument Drivers for Anritsu Instrumentation

National Instruments and Anritsu Collaborate on NI LabVIEW, LabWindows/CVI Instrument Drivers for Anritsu Instrumentation

National Instruments and Anritsu Company have announced a joint effort to develop LabVIEW Plug and Play and LabWindows/CVI instrument drivers for Anritsu test instruments. The companies are working together to make it easy for engineers and scientists to combine the popular LabVIEW graphical development platform and the proven LabWindows/CVI ANSI C integrated development environment with Anritsu RF and wireless communications test instruments.

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PC Oscilloscopes from Pico offer 16-bit resolution

The PicoScope 3224 and 3424 high-precision PC Oscilloscopes are now able to offer 16-bit resolution when used with the latest PicoScope 6 software release. They now also offer fast USB streaming when used with the new software. The fast streaming mode operates automatically whenever the user selects timebases of 200 ms or slower. In fast streaming mode, the sample rate can now be as high as 256 kilosamples per second depending on the PC in use, allowing high-speed gap-free recording of data.

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PXI Express System Timing Controller is a first says National Instruments

PXI Express System Timing Controller is a first says National Instruments

National Instruments has announced the latest additions to NI timing tools including the industry's first PXI Express timing and synchronisation controller and a PXI module that synchronises PXI systems over GPS, Inter-Range Instrumentation Group (IRIG) and IEEE 1588. With these new products, engineers can achieve improved synchronisation and timecode capabilities in PXI systems, which is important for synchronising multiple systems, precisely timestamping events and improving measurement accuracy in automated test and data acquisition applications. These new timing features are integral to the development and control of large distributed systems such as particle accelerators and high-energy physics systems.

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Aeroflex introduces a synthetic test environment

Aeroflex introduces a synthetic test environment

At European Microwave Week 2007 Aeroflex announced the commercial availability in Europe of its new Synthetic Multifunction Adaptable Reconfigurable Test Environment (SMART^Eä). SMART^E introduces a truly synthetic test environment that includes hardware, software, test practices and support required by customers for a complete test solution.

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RF test platform for seamless migration from research and development to production test

RF test platform for seamless migration from research and development to production test

Aeroflex has introduced its new modular RF test platform for wireless applications up to 6GHz. The scaleable platform has the flexibility to easily perform at any stage of wireless development from research to manufacturing, and can integrate seamlessly into any wireless market including cellular, wireless data, RFIC test and military/aerospace.

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Industry Leading MIMO RF Test Solution from Keithley

Industry Leading MIMO RF Test Solution from Keithley

Keithley Instruments, Inc. has released the industry's leading 4X4 MIMO (multiple-input, multiple-output) RF test system for R&D and production testing of next generation RF communications equipment and devices.

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PCI Express Arbitrary Waveform Generator up to 125 MS/s

PCI Express Arbitrary Waveform Generator up to 125 MS/s

Spectrum is one of the first manufacturers world-wide to release a full product series of Arbitrary Waveform Generators (AWG) for the PCI Express bus. The new product series is 100% software compatible to the PCI cards of the M2i series of the manufacturer and also uses the same analog modules. The AWG family contains 10 different models with 1 to 4 synchronous channels and sampling rates up to 125 MS/s. Each card can run as freely programmable signal and test pattern generator or it can be used via an internal synchronization option together with one of the digitiser cards of Spectrum.

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4-channel 100 MS/s 8-bit A/D oscilloscope card for PCI Express

Strategic Test Corp has announced the UF2e-2031 oscilloscope PCI Express card. The UF2e-2031 has four 100 MS/s 8-bit ADC's that are also able to operate in an interpolated mode to acquire two channels at 200 MS/s for increased versatility. Drivers for Microsoft Windows Vista, XP64, XP and Linux (RedHat, Fedora, SuSe, Sarge) are supplied with the card, as well as the SBench 5.3 oscilloscope program.

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Aeroflex and Sequans in partnership for WiMAX test

Aeroflex, and Sequans Communications, a leading developer of WiMAX semiconductor solutions, have entered into a test technology partnership for WiMAX. Within the context of the technology partnership, the two companies will collaborate closely to further speed the ongoing development of their respective WiMAX test and WiMAX semiconductor solutions.

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Strategic Test extends PCI Express Series with first 8 channel 25MS/s 12-bit Oscilloscope / Digitizer card

Strategic Test has announced the availability of the UF2e-3132 oscilloscope / digitizer PCI Express card. The UF2e-3132 has eight 25 MegaSamples/s 12-bit ADC's for simultaneous sampling without time-skew errors and up to 2 GigaSamples onboard memory. Streaming to a host PC is supported to the maximum transfer rate of the PCI Express x1 bus.

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Tektronix Software Performs Serial Data Link Analysis

Tektronix Software Performs Serial Data Link Analysis

Tektronix has announced an end-to-end high speed serial data analysis software package with test capabilities extending from a transmitter to a receiver and including the connecting channel. The new 80SJNB Advanced software runs on the Tektronix DSA8200 Digital Serial Analyzer. 80SJNB Advanced combined with the DSA8200 platform's TDR/TDT and S-Parameter support through iConnect software provides engineers with the first complete Serial Data Link Analysis (SDLA) package to ensure a readable signal reaches the receiver.

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Single-box radar test solution from Aeroflex

Single-box radar test solution from Aeroflex

Aeroflex has announced that it has added an internal pulse modulator capability to its 6810 and 6820 Series microwave signal generators and scalar analyzers. The Aeroflex 6800 Series with internal pulse modulator is the only self-contained, single-box radar testing solution on the market. The instruments can perform advanced radar testing, calibration, maintenance and repair in either coaxial or waveguide media.

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Spectrum analyser from TTi extends to 2.7 GHz

Spectrum analyser from TTi extends to 2.7 GHz

TTi (Thurlby Thandar Instruments) has extended its PSA-T Series of low-cost highly portable RF spectrum analysers with the launch of the PSA2701T. The new model has a frequency range of 1 MHz to 2700 MHz and a selling price of £995 (plus VAT). As well as being lower in cost, it is considerably smaller, lighter, and lower power than other RF spectrum analyser currently available. Despite this, it offers a high-resolution (480 x 320 pixel) backlit colour TFT display.

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PXI Specification is 10 years old today!! Says PXI Systems Alliance

PXI Specification is 10 years old today!! Says PXI Systems Alliance

The PXI Systems Alliance (www.pxisa.org) today announced the 10th anniversary of the PXI (PCI eXtensions for Instrumentation) specification, the PC-based modular I/O platform for test, measurement and control systems. The PXI standard was introduced in 1997 as a modular instrumentation platform for measurement and automation applications that require high performance and a rugged industrial form factor. With PXI, engineers and scientists can select chassis, controllers and modules from multiple vendors and integrate them into a single PXI system. Today there are more than 1,500 PXI products available from over 70 companies, including Agilent Technologies, Geotest, Keithley, National Instruments and Pickering.

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Keithley Adds Low Current Capability to semiconductor parametric analysis and testing system

Keithley Adds Low Current Capability to semiconductor parametric analysis and testing system

Keithley Instruments has announced two new additions to its Series 2600 SourceMeter Instruments to create what it says is the industry's most advanced and cost effective solution for semiconductor parametric analysis and testing. The Models 2635 and 2636 represent a new and unique way of doing parametric analysis at resolutions as fine as 1fa (10-15 amp), which is often required for many semiconductor, optoelectronic, and nanotechnology devices. Moreover, their instrument-based, multi-channel architecture results in a 50 percent lower cost than typical mainframe-based source-measure solutions. With their Test Script Processor (TSP) and TSP-Link intercommunications bus, these new instruments enable engineers to quickly create fast test systems that are ideal for research, characterization, wafer sort, reliability, production monitoring, and a multitude of other test applications.

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System Switch Platform Offers High Throughput Signal Switching, LXI Class B, and Optional High-Performance Integrated DMM

System Switch Platform Offers High Throughput Signal Switching, LXI Class B, and Optional High-Performance Integrated DMM

Keithley Instruments has announced the release of the Series 3700 System Switch/Multimeter and Plug-in Card Family, Keithley's next-generation platform of switching and integrated digital multimeter (DMM) test solutions. It offers high quality, instrument grade switching for a wide variety of applications, including the performance demands of high channel count applications, with its ability to control up to 576 multiplexer channels in an industry-leading six-slot, 2U form factor. A high-performance integrated DMM option provides fast, low-noise measurements with resolutions up to 7½-digits at a price lower than typical 6½-digit DMMs.

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ESD Simulator self calibrates at every start-up

ESD Simulator self calibrates at every start-up

TESEQ (formerly Schaffner Test Systems) has announced the introduction of the NSG 437 handheld ESD Simulator. The NSG 437 generates pulses from 200 V to 30 kV, in both air and contact discharge operation modes. Automatic self calibration of the NSG 437 is performed at every start up, taking the unit to maximum voltage in both polarities to ensure that all test levels are maintained within specification.

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New AOI equipment helps throughput and quality to rise together

New AOI equipment helps throughput and quality to rise together

Remploy Electronics has further enhanced its PCB testing capabilities with the installation of new automated optical inspection (AOI) equipment at its Bolton and Barking factories. The benchtop systems inspect solder joints and verify correct part assembly, enabling quality levels and throughput to be maximised.

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Turnkey solution for avionics electrical test compliance

Turnkey solution for avionics electrical test compliance

The Electrical Avionic Compliance System (EACS), a powerful avionics electrical test system from Xantrex Elgar, is now available in the UK from TTi (Thurlby Thandar Instruments): the UK agent for Xantrex Elgar AC and DC programmable power supplies.

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Intepro Claims 85% Energy Saving in Power Supply Testing Costs

Intepro Claims 85% Energy Saving in Power Supply Testing Costs

Intepro Systems announces the worldwide availability of its Loadsaver range of advanced, programmable electronic loads. Loadsaver offers all those involved with any aspect of power supply testing significant economic benefits by reducing energy waste by up to 85%. Conventional power supply burn-in and test systems convert the output power of the device under test into heat generated by resistive loads. This is an immediate waste of costly energy compounded in most facilities by the need to remove this heat by fans or air conditioning. In large manufacturing operations many hundreds of power supplies may be under test for 24 hours or more resulting in tens of kilowatts of wasted energy annually.

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Aeroflex to launch key products at European Microwave Week 2007

Aeroflex will launch two important new products at European Microwave Week 2007 in October, a new PXI test platform that operates up to 6GHz and an internal pulse modulation option for its 6800 Series for radar maintenance.