Test and Measurement

• Comms Testers Improved
• Portable Digital Sound Level Meters
• Low-cost Temperature and Humidity Devices
• Temp Loggers log data to CompactFlash cards
• Remote Monitoring & Diagnostics of Serial Devices
• Measured Approach To Manufacturing Test at Nepcon
• Analyser adds Modbus over serial line protocol
• Aeroflex delivers CDG Stage II C.S0044 interoperability and CDG Stage I C.S0043 signalling conformance test cases
• Wireless protocol analyser supports WiMedia UWB and Wireless USB standards
• Pulse and Pattern Generators are easy to use
• Portable radio test set public safety vehicle radio systems
• Portable Signal Generator is Ideal out in the Field
• Digital panel tachometer targets speed control in materials handling
• Ultra-Fast Real-time Oscilloscope
• USB Multifunction Data Acquisition Devices
• Universal device programmers come with 3yr warranty
• New PCI Express® Analyzer Extensibility Accelerates Cutting Edge Application Development
• NI ELVIS Now Offers USB Plug-and-Play Connectivity
• NI products meet RoHS directive
• Low cost, high performance spectrum analyzers span 3Hz to 26.5GHz
• True 3D Coplanarity Inspection Increases Production Yield
• SCOPE SETS A NEW STANDARD – IMPRESSIVE PERFORMANCE WITHOUT THE PRICE TAG
• Eight-channel digitiser is lowest price-per-channel high-speed data acquisition product in its class
• Aeroflex adds Dual Vacuum Control capability to 5220 Power Manufacturing Defects Analyser
• National Instruments Releases ECU Measurement and Calibration Toolkit 2.0
• Aeroflex announces new style shortform catalogue
• NI LabVIEW 20th Anniversary Edition Targets Communications Test
• National Instruments Extends Oscilloscope Offering to 2 GS/s Real-Time, 20 GS/s Equivalent-Time Sampling
• Battery-life testing capability for TETRA radios from Aeroflex
• NI's latest RF Analyser Introduces Data Streaming for RF and Communications Applications
• Tektronix Oscilloscopes Improved
• 6 GHz Active Differential Probe Provides Excellent Signal Fidelity and Connectivity
• Software update for Aeroflex's 2975 radio test set
• Keithley's Metrology Services gets ISO 17025 Accreditation
• 3-phase power quality analysers offer high accuracy
• Lab Quality, Handheld RF Power Meter
• Analogue inductive sensors now available in C8 format
• Handheld analysers pinpoints power-quality problems quickly and safely
• Low cost LCR bridge has binning capability
• Function generators with output to 3 MHz and built-in frequency counter
• Fast and Flexible Vector Signal Analyzer
• Keithley and Mesatronic Agree to Develop Advanced RF Probe Cards
• Aeroflex launches single system solution for testing 3GPP compliant networks
• Keithley Introduces PXI Products for Hybrid Test Systems in Production Applications
• LeCroy Adds Entry Level Oscilloscope with WaveScan Function to WaveSurfer Xs Series
• Aeroflex adds WiMAX, 1xEvDO and HSUPA measurement suites to PXI 3000 plaform
• Aeroflex IQCreator signal generation software now supports WiMAX
• Keithley Introduces PXI Products for Hybrid Test Systems in Production Applications
• NI Introduces PCI Express High-Speed Digital Instruments up to 200 MB/s
• Aeroflex enhances its UMTS basestation test system
• Measurement software for Semiconductor Characterization System
• Willtek adds TD-SCDMA to 3G cellular handset testers based on picoChip software-defined radio
• Latest Tektronix test set finds and solves WiMAX design problems
• Low Profile GPIB Controller Interface Plug-in Board from Keithley Instruments
• Interactive software for inspecting, analysing and reporting test data
• NI Releases Low-Cost 6½-Digit Multimeters for PCI and PCI Express
• MAZeT displays test construction for exact adjustment of colours in LEDs
• Low-cost WiFi test system
• Fully integrated test solution for A-GPS mobile handsets
• Clare launches bespoke custom electrical test design service
• Parametric Parallel Test Handbook from Keithley
• Low-Cost Serial Communications Tool from Microchip
• Tek's latest Oscilloscope offers 20 GHz real-time bandwidth and 50 GS/s simultaneous sampling rate
• Powerful Vibration Test System
• W-CDMA ACE 3G protocol analysis test system
• Keithley Introduces Measurement How-To Library on CD
• Electronic load offers increased power for testing fuel cells
• LabVIEW drivers for M2i card series from Spectrum
• Multi-Protocol, 6 Gb/s SAS/SATA Analyzer and Tester is a first claims Finisar
• Measurements simplified with NI's LabVIEW SignalExpress
• Audio analyser offers higher-bandwidth convertors
• Real-Time Data Capture Exposes Toughest Real-Time Bugs in DSP-based Systems
• Aeroflex enhances TETRA test capabilities of the 3900 Digital Radio Test Set
• NI's PCI Oscilloscopes Extend Speed and Channel Density while Lowering Test Cost
• Enhanced Pulse and Pulse I-V Capabilities for Advanced Semiconductor Device Testing
• Data Acquisition, Measurement, and Control Handbook from Keithley
• Laptop-based mobile Instrumentation
• 8 Gb/s Fibre Channel test solution
• Electrical safety testers from Clare
• 16-channel 16-bit A/D Transient Recorder PCI cards from less than €190/channel
• Coaxial mismatch termination sets for test and calibration
• NI Improves Instrument Control With LabVIEW SignalExpress
• NI Introduces Sound and Vibration Data Logger Software
• New catalogue from Crompton Instruments
• Integrated Test Systems for Faster and Easier Semiconductor Testing
• Handbook on Nanotechnology Measurement
• Windows Vista drivers for Oscilloscope, AWG and fast Digital I/O cards
• Rohde & Schwarz extends TTi distribution agreement
• Oscilloscope, AWG and fast Digital I/O cards stream to hard disks at 200 MBytes/s
• Spectrum analyzers offer digital demodulation for wireless network analysis
• Microwave power meter uses SMART sensor technology for multiple measurements
• Strategic Test Enables up to 270 Oscilloscope PCI cards to be synchronized across multiple PC’s
• Dual Time Base Mode for PCI Waveform Digitizers from Strategic Test
• Enhanced RF EMC Test Software Features Latest Test Requirements
• Linux drivers for PC Instrument Boards from Strategic Test
• NI TestStand 4.0 Accelerates Test System Development
• Software Tests Families of Power Supplies With One Test
• PXI Express High-Speed Instruments and 18-Slot PXI Express Chassis are firsts says NI
• PCI Express Waveform Digitizers are industry first says Strategic Test
• Driver for UltraFast Digitizer and Waveform Generator PCI boards
• Field portable spectrum analyser suits RFID site surveys
• Torque measurement
• Vector Signal Generator accommodates more and larger waveforms
• Flexible Rotor Telemetry for Torque Measurements
• Power Semiconductor Stress-Screening Reliability Tester
• Digital Radio Test Set for TETRA and P25
• Catalogue describes precision measurement instruments
• Multifunction bench multimeters feature 6.5-digit precision
• Low noise synthesiser is quiet performer for Microwave market
• 6½-Digit USB DMM from Keithley
• Tektronix Tests 20 Gb/s Throughput Infiniband Cable from Intel
• Fully integrated test system provides error/noise performance characterisation
• CLARE COMBIs PASS THE TEST AT DOMNICK HUNTER
• PCI Express Waveform Generators
• Low-Cost 6½-Digit Multimeter for PXI from NI
• Aeroflex launches entry-level version of its highly successful 6113 Digital Radio Test Set
• New catalogue covers spring test probes
• Keithley Instruments adds RF Waveform Technology with acquisition of Lyocom
• New low cost Module enables full Test of DIMM168 Interfaces per JTAG/Boundary Scan
• NI LabVIEW 8.5 Improves Test Throughput with Multicore and FPGA Technologies
• USB connectivity and native Windows Vista support added to Audio Analysers
• Aeroflex to launch key products at European Microwave Week 2007
• Intepro Claims 85% Energy Saving in Power Supply Testing Costs
• Turnkey solution for avionics electrical test compliance
• New AOI equipment helps throughput and quality to rise together
• ESD Simulator self calibrates at every start-up
• System Switch Platform Offers High Throughput Signal Switching, LXI Class B, and Optional High-Performance Integrated DMM
• Keithley Adds Low Current Capability to semiconductor parametric analysis and testing system
• PXI Specification is 10 years old today!! Says PXI Systems Alliance
• Spectrum analyser from TTi extends to 2.7 GHz
• Single-box radar test solution from Aeroflex
• Tektronix Software Performs Serial Data Link Analysis
• Strategic Test extends PCI Express Series with first 8 channel 25MS/s 12-bit Oscilloscope / Digitizer card
• Aeroflex and Sequans in partnership for WiMAX test
• 4-channel 100 MS/s 8-bit A/D oscilloscope card for PCI Express
• PCI Express Arbitrary Waveform Generator up to 125 MS/s
• Industry Leading MIMO RF Test Solution from Keithley
• RF test platform for seamless migration from research and development to production test
• Aeroflex introduces a synthetic test environment
• PXI Express System Timing Controller is a first says National Instruments
• PC Oscilloscopes from Pico offer 16-bit resolution
• National Instruments and Anritsu Collaborate on NI LabVIEW, LabWindows/CVI Instrument Drivers for Anritsu Instrumentation
• Switch probe for rear assembly
• 8G Fibre Channel Load Tester for Storage Area Networks from Finisar
• Measurement Accuracy and Reliability improved with NI LabVIEW SignalExpress 2.5
• Resistance Decade Boxes from Cropico feature high accuracy
• Entry-level energy meter from Carlo Gavazzi is MID-certified
• Hawco releases Relative Humidity Sensors and Transmitters from Rense Michell
• PCI Express card family with 4-channel 50 MS/s 8-bit digitizer / oscilloscope
• Aeroflex adds A5/3 encryption support to its 6113 basestation tester
• 10m Chamber is the UK’S largest CISPR 16 Semi Anechoic Chamber says 3C
• Wideband power sensor for radar and digital communications testing to 18 GHz
• Multifunction protocol tester is USB 3.0 ready
• Aeroflex enhances conformance test systems for A-GPS location services
• Vehicle serial bus analyser performs waveform measurement and protocol analysis
• RF measurement facility reduces system development time for customers
• TEM cells said to be ideal for calibrating field strength meters
• Keithley Software Offers New Parallel Test and Parametric Die Sort Features for Higher Throughput
• Software package provides test and simulation for CAN/FMS systems
• Aeroflex adds Wideband AMR support to its 6113 basestation protocol test system
• T&M Industry turns to Software-Defined Instrumentation and Use of Multicore-Enabled Test Systems says NI
• Digital Metering System has Ethernet communication module
• Guide provides overview to Low Resistance Measurement
• 2008 Test and Measurement Product Guide from Keithley
• Software provides unprecedented simulation and analysis of complex communications environments
• A-GPS RF performance testing with Spirent’s UMTS Location Test System
• Tektronix Builds Serial ATA Compliance Test Solution Using NI TestStand
• Comsys and Agilent Technologies optimizing chipset test to speed Mobile WiMAX handset production
• NI Extends Portable Measurement Performance with USB Digitisers and a Digital Multimeter
• Keithley Partners with Stratosphere Solutions to Enable Advanced Process Characterization at Sub-65nm
• Super fast counter timer streams ahead
• NI Introduces the First Power Source Measure Unit for PXI and Highest-Density PXI Switches
• High speed audio testing against limits
• RF spectrum analyzer option for the 3500 hand-held radio test set
• Test system from Aeroflex provides complete visibility into the lowest layers of the radio modem
• Aeroflex now supports W-CDMA A-GPS conformance testing
• Spectrum analyser offers free software upgrade
• Analogue PID controller allows easy user configuration
• LeCroy Extends Automotive Testing with Physical Layer Test Tool
• National Instruments Expands C Series Family for High-Performance Data Logging
• European calibration service for high-frequency AC power measurements
• Self-Contained true-RMS Ammeters provide compact and easy-to-use solution for measurement of non-sinusoidal AC currents
• National Instruments LabVIEW Targets Industry-Leading ARM Microcontrollers
• Aeroflex announces industry’s first reconfigurable avionics test platform - Avionics Test Bench and Avionics Test Studio
• Compact Tacho & Frequency Meter
• National Instruments UK & Ireland Among Industry Leaders at Test & Measurement Design Day
• Arbitrary/function generator offers 40 V peak-to-peak amplitude
• CETECOM introduces a FACTSware based A-GPS test solution
• Universal Cable Test Kit for Wi-Fi and Broadband Applications
• Low-Cost PXI Embedded Controllers for Test, Measurement and Control Applications from NI
• NI LabVIEW SignalExpress Tektronix Edition 2.5 Adds Support for New DPO3000 Oscilloscopes
• Aeroflex announces early availability of its test suite for the C.S0044-A specification
• SysNucleus releases new version of USBTrace with Wireless USB support
• Sensor Modules for direct measurement of current, voltage and temperature
• High-frequency differential probe for vehicle serial buses
• Keithley Releases New Edition of Switching Handbook
• Semiconductor Device Test Applications CD from Keithley Semiconductor
• Optical transport analyser for 40 Gbit/s SONET/SDH and 43/44 Gbit/s OTN transmission testing
• NI Measurement Studio 8.5 Accelerates Remote Monitoring and Control
• NI Accelerates Parallel Test Performance with Multicore Support
• Compact FieldPoint Controllers from NI
• Flying Probe System for low-cost, flexible fixtureless test from Aeroflex
• Radio Telemetry for Strain Gauge Devices from Celsum
• Digital Thermometer Hits Target for Fresh Cement and Concrete Temperature
• Keithley and Azimuth Systems Collaborate to Create LTE, WiMAX RF Testing Solutions
• New Programmable Electrical Safety Testers
• National Instruments Introduces New LabVIEW Toolkit for GPS Receiver Testing
• Keithley Adds WiMAX Testing Capability to its RF Test Instrument Family
• Aeroflex adds new 3GHz Modular Digital RF Signal Generator to PXI 3000 Series comprehensive RF test platform
• DC electronic load from TTi
• Leakage current tester from Kikusui
• Arbitrary waveform software from TTi can be imported
• NI Expands Test Data Management and Visualisation
• Miniature Spectrometer Modules from Hamamatsu Photonics
• Upgrade for Model 4200-SCS Semiconductor Characterization System Expands C‑V, I-V, and Pulsed I-V Characterization
• China’s MTNet test lab standardises on Aeroflex equipment for CDMA 1xEV-DO Rev A and A-GPS test
• Compact ESD Simulator from Teseq
• Benchtop power analyser from Yokogawa
• Keithley's Guide to Wireless and RF Testing
• National Instruments 1 GHz Bandwidth PXI Digitiser
• Kikusui's modular DC Electronic Loads.
• Hand-held Aeroflex Radio Test Set
• Aeroflex announces advanced test capabilities for its 3900 Series Digital Radio Test Set
• ACCES I/O Releases Fast USB Digital Waveform Generator Modules
• Tektronix Accelerates Arbitrary Waveform Generators
• Tektronix oscilloscopes help IZT to overcome signal integrity challenges
• Low-Cost XRF Analyzer for RoHS Testing from Skyray XRF
• Keithley Expands MIMO RF Measurement Capabilities with 8x8 MIMO Test System
• NI Announces PXI Embedded Controller and New PXI System Accessories